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    • 7. 发明专利
    • Semiconductor laser
    • 半导体激光器
    • JP2012018963A
    • 2012-01-26
    • JP2010153770
    • 2010-07-06
    • Sony Corpソニー株式会社
    • OBATA TOSHIYUKIKAWANISHI HIDEKAZU
    • H01S5/22H01S5/343
    • H01S5/2018B82Y20/00H01S5/2009H01S5/22H01S5/2205H01S5/2214H01S5/305H01S5/3063H01S5/34333H01S2304/04
    • PROBLEM TO BE SOLVED: To provide a semiconductor laser having an improved kink level of L-I characteristics and capable of stably obtaining high output in the horizontal transverse mode.SOLUTION: The semiconductor laser comprises on a substrate 11 an n-type cladding layer 12, an n-type guide layer 13, an i-type guide layer 14, an active layer 15, an i-type guide layer 16, an electron barrier layer 17, a p-type superlattice cladding layer 18, and a p-type contact layer 19. The impurity concentration of the layer (the n-type guide layer 13) closest to the active layer 15 in the n-type layers between the substrate 11 and the active layer 15 is higher than the impurity concentration (from 3×10cmor more to 1×10cmor less) of the n-type cladding layer 12 far from the active layer 15, that is, the n-type guide layer 13 is a high concentration region.
    • 要解决的问题:提供具有改善的L-I特性的扭结水平并且能够稳定地获得水平横向模式的高输出的半导体激光器。 解决方案:半导体激光器在衬底11上包括n型包覆层12,n型引导层13,i型引导层14,有源层15,i型引导层16, 电子势垒层17,p型超晶格覆盖层18和p型接触层19.最靠近n型的有源层15的层(n型引导层13)的杂质浓度 衬底11和有源层15之间的层高于杂质浓度(从3×10 3 更远离远离有源层15的n型覆层12的1×10 21 cm > 3 或更小) 也就是说,n型引导层13是高浓度区域。 版权所有(C)2012,JPO&INPIT