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    • 1. 发明专利
    • Method for evaluating semiconductor device
    • 评估半导体器件的方法
    • JP2011047782A
    • 2011-03-10
    • JP2009196182
    • 2009-08-27
    • Fuji Electric Systems Co LtdTokyo Electron Ltd富士電機システムズ株式会社東京エレクトロン株式会社
    • MIYAZONO MITSUYOSHIKOMATSU SHIGEKAZUSHINOZAKI DAIKATO MASAHIROYOSHIDA ATSUSHI
    • G01R31/26H01L21/66
    • H01L22/20G01R31/2831H01L22/14
    • PROBLEM TO BE SOLVED: To improve the yield rate and productivity of a semiconductor module.
      SOLUTION: A sheet having electrical conductivity is stuck to a main surface of a semiconductor substrate which includes a surface structure and a back plate and on which a plurality of semiconductor elements are arranged. In the state that the sheet is stuck to the main surface, the semiconductor substrate is divided into semiconductor chips on a first support base. The plurality of divided semiconductor chips are mounted on a second support base via the sheet, and dynamic characteristic tests for the mounted plurality of semiconductor chips are carried out continuously on the second support base. Thereby, cracking which develops and propagates from cracks generated in the dynamic characteristic tests for the vertical semiconductor elements is suppressed, and the yield rate and productivity of the semiconductor module are improved.
      COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:提高半导体模块的产率和生产率。 解决方案:具有导电性的片材粘附到包括表面结构和背板的半导体衬底的主表面上,并且其上布置有多个半导体元件。 在片材粘附到主表面的状态下,半导体衬底在第一支撑基底上分成半导体芯片。 多个划分的半导体芯片通过片材安装在第二支撑基座上,并且在第二支撑基座上连续地执行安装的多个半导体芯片的动态特性测试。 因此,抑制了在垂直半导体元件的动态特性试验中产生的裂纹发展和传播的裂纹,提高了半导体模块的成品率和生产率。 版权所有(C)2011,JPO&INPIT