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    • 2. 发明专利
    • 光半導体装置の製造方法
    • 制造光学半导体器件的方法
    • JP2015053457A
    • 2015-03-19
    • JP2013186752
    • 2013-09-09
    • 日本電信電話株式会社Nippon Telegr & Teleph Corp
    • ARAI MASAKAZUNAKAO AKIRAKAMITOKU MASAKI
    • H01S5/026G02F1/025H01S5/12
    • 【課題】小型で高速な光信号を送信する光モジュールの実現を可能とする半導体集積型の光半導体装置の製造方法を提供する。【解決手段】所定の圧力の下で有機金属気相成長法により、前記半導体基板に形成された互いに接した2つの領域を有するリッジ上に量子井戸構造を成長し、前記所定の圧力とことなる圧力の下で前記量子井戸構造を反応性ガスエッチングする。2つの領域のそれぞれには、量子井戸構造の異なる半導体素子を形成することができる。【選択図】図2
    • 要解决的问题:提供一种能够实现传递小型和高速光信号的光模块的半导体集成光半导体器件的制造方法。解决方案:一种制造方法,包括:在脊上生长量子阱结构 具有形成在半导体基板上的两个区域,并且在预定压力下用有机金属蒸气生长方法彼此接触; 并在不同于预定压力的压力下用反应气体蚀刻量子阱结构。 在两个区域的每一个中,可以形成具有不同量子阱结构的半导体元件。
    • 3. 发明专利
    • 長波長帯半導体レーザ
    • 长波长半导体激光器
    • JP2015053451A
    • 2015-03-19
    • JP2013186662
    • 2013-09-09
    • 日本電信電話株式会社Nippon Telegr & Teleph Corp
    • ARAI MASAKAZUYOSHIMURA RYOKONAKAO AKIRAKAMITOKU MASAKI
    • H01S5/343H01S5/12
    • 【課題】少ない注入電流でも効果的に波長掃幅広げることができ、低消費電力で高性能な長波長帯半導体レーザを提供すること。【解決手段】n型InP基板101上に、n型にドープしたInAlAsからなるn型InAlAsクラッド層102、圧縮歪のInAs量子井戸とInGaAs障壁層からなる3層多重量子井戸構造の活性層103が順に積層されている。活性層103上にはエッチングされて回折格子を構成するInGaAsP層が形成され、その上にp型にドープしたInPからなるp型InPクラッド層105、p型InGaAsコンタクト層106が順に積層されたリッジ構造が形成されている。そのリッジ構造の周囲にはポリイミド埋め込み層108が積層されている。この層構造のn型InP基板101側にはn型電極109が形成され、p型InGaAsコンタクト層106上にはp型電極110が形成されている。【選択図】図1
    • 要解决的问题:提供即使在低注入电流下也能够有效地加宽波长扫描频带,功耗低,性能高的长波长带状半导体激光器。解决方案:一种n型InAlAs覆层,包括: 包括具有压缩应变和InGaAs阻挡层的InAs量子阱的三层多量子阱结构的n型掺杂InAlAs和有源层103依次层叠在n型InP衬底101上。蚀刻以配置的InGaAsP层 在有源层103上形成衍射光栅,并且形成包括p型掺杂InP和p型InGaAs接触层106的p型InP包层105依次层叠在InGaAsP层上的脊结构。 聚酰亚胺埋层108围绕脊结构层叠。 在层叠结构的n型InP基板101的一侧形成n型电极109,在p型InGaAs接触层106上形成p型电极110。
    • 4. 发明专利
    • Semiconductor element
    • 半导体元件
    • JP2013179187A
    • 2013-09-09
    • JP2012042305
    • 2012-02-28
    • Nippon Telegr & Teleph Corp 日本電信電話株式会社
    • ARAI MASAKAZUKAMITOKU MASAKIIGA RYUZO
    • H01S5/343
    • PROBLEM TO BE SOLVED: To provide a semiconductor element that allows high performance of an optical semiconductor element under high temperatures.SOLUTION: A semiconductor device of the present invention includes: a buffer layer formed on a GaAs substrate; a lattice relaxation layer formed on the buffer layer and having an In composition ranging from 5 to 30%; a lower cladding layer formed on the lattice relaxation layer; a quantum well active layer formed on the lower cladding layer; a carrier stopper layer formed on the quantum well active layer and composed of InAlGaAs; and an upper cladding layer composed of InGaP. The lower cladding layer and the upper cladding layer have a refractive index lower than that of the quantum well active layer. The upper cladding layer is formed so that the carrier stopper layer is sandwiched by the quantum well active layer and the upper cladding layer.
    • 要解决的问题:提供一种在高温下允许光学半导体元件的高性能的半导体元件。解决方案:本发明的半导体器件包括:形成在GaAs衬底上的缓冲层; 形成在缓冲层上并具有5至30%范围内的In组成的晶格弛豫层; 形成在晶格弛豫层上的下包层; 形成在下包层上的量子阱有源层; 形成在量子阱有源层上并由InAlGaAs构成的载流子阻挡层; 以及由InGaP构成的上部包层。 下包层和上包层的折射率低于量子阱活性层的折射率。 上覆层形成为使载流子停止层夹在量子阱活性层和上覆层之间。
    • 5. 发明专利
    • Optical semiconductor device
    • 光学半导体器件
    • JP2010283104A
    • 2010-12-16
    • JP2009134746
    • 2009-06-04
    • Nippon Telegr & Teleph Corp 日本電信電話株式会社
    • FUJISAWA TAKESHIYAMANAKA TAKAYUKIKANO FUMIYOSHIFUJIWARA NAOKIKOBAYASHI WATARUARAI MASAKAZU
    • H01S5/026H01S5/343
    • PROBLEM TO BE SOLVED: To provide an optical semiconductor device capable of improving the performance of a semiconductor laser and an electric field-absorption type optical modulator by increasing the ΔE
      C of active layers of these parts and further capable of being used for high-speed modulator integrated light sources for telecommunication and data communication in a temperature range of 25 to 85°C by sharply improving the performance of a modulator using a suitable active layer parameter.
      SOLUTION: The optical semiconductor device is configured to form the semiconductor laser 10, the electric field-absorption type optical modulator 30 and a passive layer 20 on a substrate 1. In the optical semiconductor device, a semiconductor mixed crystal of the substrate 1 is defined as InP, a quantum well layer and a barrier layer of an active part 2 of the semiconductor laser are defined as In
      1-x-y Al
      x Ga
      y As, a diffraction grating forming layer is defined as In
      1-x Ga
      x As
      y P
      1-y , and a quantum well layer and a barrier layer of an active part 5 of the electric field absorption type optical modulator are defined as In
      1-x-y Al
      x Ga
      y As. Further, in the active part 5 of the electric field absorption type optical modulator, the number of quantum wells is 2 to 20, the strain of the quantum well layer is -0.6 to 1%, and a band gap wavelength of the barrier layer is 0.9 to 1.05 μm.
      COPYRIGHT: (C)2011,JPO&INPIT
    • 解决的问题:为了提供能够通过增加这些部分的有源层的ΔE C 来提高半导体激光器和电场吸收型光学调制器的性能的光学半导体器件 并且还能够通过使用合适的有源层参数急剧改善调制器的性能,在25至85℃的温度范围内用于通信和数据通信的高速调制器集成光源。 解决方案:光学半导体器件被配置为在衬底1上形成半导体激光器10,电场吸收型光学调制器30和无源层20.在光学半导体器件中,衬底的半导体混合晶体 1被定义为InP,半导体激光器的有源部分2的量子阱层和阻挡层被定义为:在<1> ,并且电场吸收型光学调制器的有源部分5的量子阱层和阻挡层被定义为In 1-xy x GA ý为。 此外,在电场吸收型光调制器的有源部分5中,量子阱的数量为2〜20,量子阱层的应变为-0.6〜1%,阻挡层的带隙波长为 0.9〜1.05μm。 版权所有(C)2011,JPO&INPIT
    • 6. 发明专利
    • Semiconductor photodetector
    • SEMICONDUCTOR PHOTODETEOROR
    • JP2008288293A
    • 2008-11-27
    • JP2007130076
    • 2007-05-16
    • Nippon Telegr & Teleph Corp 日本電信電話株式会社
    • MITSUHARA MANABUSATO TOMONARIFUKANO HIDEKIKONDO YASUHIROARAI MASAKAZU
    • H01L31/10
    • PROBLEM TO BE SOLVED: To provide a semiconductor photodetector of large quantum efficiency and less dark current, even concretely in the case of thin film thickness of an InGaAsN optical absorption layer. SOLUTION: The semiconductor photodetector uses the InGaAsN layer formed on an InP substrate 1 as the optical absorption layer 5 and projecting a signal light from the reverse side to the InP substrate 1. In the semiconductor photodetector, a semiconductor multilayer-film reflecting mirror 2 for reflecting the signal light is fitted between the InP substrate 1 and the InGaAsN optical absorption layer 5. In the semiconductor photodetector, a reflecting mirror (such as one reflecting a light on an interface between a p-InGaAs layer 7 and air) further reflecting the light reflected by a semiconductor multilayer film reflecting mirror 2 is fitted further on the reverse side of the InP substrate 1 to the InGaAsN optical absorption layer 5, and the signal light is resonated between the two reflecting mirrors. COPYRIGHT: (C)2009,JPO&INPIT
    • 要解决的问题:即使在InGaAsN光吸收层的薄膜厚度的情况下,甚至具体地提供具有大量子效率和较小暗电流的半导体光电探测器。 解决方案:半导体光电检测器使用形成在InP衬底1上的InGaAsN层作为光吸收层5,并将来自反面的信号光投射到InP衬底1.在半导体光电检测器中,半导体多层膜反射 在InP衬底1和InGaAsN光吸收层5之间安装用于反射信号光的反射镜2.在半导体光电检测器中,反射镜(诸如反射在p-InGaAs层7和空气之间的界面上的光) 进一步反射由半导体多层膜反射镜2反射的光又在InP基板1的背面进一步配合到InGaAsN光吸收层5,信号光在两个反射镜之间共振。 版权所有(C)2009,JPO&INPIT
    • 9. 发明专利
    • Optical semiconductor device
    • 光学半导体器件
    • JP2007066930A
    • 2007-03-15
    • JP2005247030
    • 2005-08-29
    • Nippon Telegr & Teleph Corp 日本電信電話株式会社
    • ARAI MASAKAZUKONDO YASUHIRO
    • H01S5/343
    • PROBLEM TO BE SOLVED: To improve crystallinity of a high distorted quantum well structure on an InGaAs substrate and to reduce its heat resistance.
      SOLUTION: A distorted quantum well structure α is formed on an InGaAs substrate 1. The quantum well layers 4, 6 and 8 of the distorted quantum well structure α are distorted at high compression so that an oscillation wavelength may be a communication band wavelength. To strain-compensate the compression strain, InGaAs/GaAs barrier layers 3, 5, 7 and 9 including a GaAs layer as a tensile strain are stacked and formed among the quantum well layers 4, 6 and 8. Thus, misfit transition or the generation of fault due to strain is reduced. In addition, a GaAs as a binary crystal can reduce heat resistance and suppress an increase in temperature.
      COPYRIGHT: (C)2007,JPO&INPIT
    • 要解决的问题:为了改善InGaAs衬底上的高失真量子阱结构的结晶度并降低其耐热性。 解决方案:在InGaAs衬底1上形成失真量子阱结构α。畸变量子阱结构α的量子阱层4,6和8在高压缩时失真,使得振荡波长可以是通信带 波长。 为了对压缩应变进行应变补偿,包括GaAs层作为拉伸应变的InGaAs / GaAs势垒层3,5,7和9层叠并形成在量子阱层4,6和8中。因此,错合转换或产生 由于应变而导致的故障减少。 此外,作为二元晶体的GaAs可以降低耐热性并抑制温度的升高。 版权所有(C)2007,JPO&INPIT
    • 10. 发明专利
    • Optical semiconductor device
    • 光学半导体器件
    • JP2013165288A
    • 2013-08-22
    • JP2013088046
    • 2013-04-19
    • Nippon Telegr & Teleph Corp 日本電信電話株式会社
    • FUJISAWA TAKESHIYAMANAKA TAKAYUKIKANO FUMIYOSHIFUJIWARA NAOKIKOBAYASHI WATARUARAI MASAKAZU
    • H01S5/026G02F1/017H01S5/343
    • PROBLEM TO BE SOLVED: To provide an optical semiconductor device which can improve performances of an active layer of a semiconductor laser part and an electroabsorption optical modulator part by increasing ΔE; and which can be used as a high-speed modulator integrated light source for telecommunication and data communication within a range of 25-85°C by improving performances of the modulator to a large extent by using appropriate active layer parameters.SOLUTION: In an optical semiconductor device in which a semiconductor laser part 10, an electroabsorption optical modulator part 30 and a passive layer 20 are formed on a substrate 1, a mixed crystal semiconductor of the substrate is InP; a quantum well layer and a barrier layer of an active part of the semiconductor laser part are InAlGaAs and a diffraction grating formation layer of the active part is InGaAsP; a quantum well layer and a barrier layer of an active part of an electroabsorption optical modulator part are InAlGaAs; the number of quantum wells is 2-20; a strain amount of the quantum well layer is larger than 0% and not more than 1% (plus represents a tensile strain); and a bandgap wavelength of the barrier layer is 0.9-1.05 μm.
    • 要解决的问题:提供一种光学半导体器件,其可以通过增加Dgr; E来提高半导体激光器部分的有源层和电吸收光学调制器部件的性能; 并且可以通过使用适当的有源层参数在很大程度上通过改进调制器的性能,将其用作25-85℃范围内的通信和数据通信的高速调制器集成光源。解决方案:在光学 在基板1上形成有半导体激光部10,电吸收光调制部30和无源层20的半导体装置,基板的混晶半导体为InP; 半导体激光器部分的有源部分的量子阱层和阻挡层是InAlGaAs,有源部分的衍射光栅形成层是InGaAsP; 电吸收光调制器部分的有源部分的量子阱层和阻挡层是InAlGaAs; 量子阱的数量为2-20; 量子阱层的应变量大于0%且不大于1%(加上表示拉伸应变); 并且阻挡层的带隙波长为0.9-1.05μm。