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1. 发明专利

JP2008185570A Probe unit and inspection device 审中-公开
标题翻译：探测单元和检查设备
公开(公告)号：JP2008185570A
公开(公告)日：2008-08-14
申请号：JP2007022034
申请日：2007-01-31
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： OSANAI YASUAKI , MIURA KAZUYOSHI , SAITO HIROKI , FUKUSHI TOSHIO
IPC分类号： G01R1/073 , G02F1/13 , G02F1/1345
摘要： PROBLEM TO BE SOLVED: To accurately keep the position of each needle part by suppressing deflection through reduction of the bending moment that relates to a probe base.
SOLUTION: The probe unit used to inspect a board to be inspected comprises a probe assembly 34, having a needle part electrically in contact with an electrode of a circuit of the board to be inspected; a support part 33 for supporting the probe assembly; and a probe base 32 for integrally supporting the support part. The support part is provided with a suspension block installed in a tip part of the probe base; a slide block, disposed in the tip part of the suspension block for supporting the probe assembly and that is slidably supported so as to absorb repulsive force, when the needle comes in contact with the electrode; and a load-receiving member, installed in a base end part of the probe base for supporting the slide block and that is extended to the slide block and receives repulsive force by abutting against the slide block.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：通过减少与探针基座相关的弯矩来抑制偏转，从而精确地保持每个针部的位置。
解决方案：用于检查要检查的电路板的探针单元包括探针组件34，其具有与待检查的电路板的电路电接触的针部分; 用于支撑探针组件的支撑部33; 以及用于一体地支撑支撑部的探针基座32。支撑部分设置有安装在探针基座的尖端部分中的悬挂块; 滑动块，设置在所述悬挂块的顶端部分中，用于支撑所述探针组件，并且当所述针与所述电极接触时，所述滑动块被可滑动地支撑以吸收排斥力; 以及承载构件，其安装在所述探针基座的基端部，用于支撑所述滑动块，并且延伸到所述滑块并通过抵靠所述滑块接收排斥力。版权所有（C）2008，JPO＆INPIT

2. 发明专利

JP2005274488A Probe assembly 有权
标题翻译：探测组件
公开(公告)号：JP2005274488A
公开(公告)日：2005-10-06
申请号：JP2004091047
申请日：2004-03-26
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： MIURA KAZUYOSHI , OSANAI YASUAKI , FUKUSHI TOSHIO
IPC分类号： G01R1/073 , G02F1/13
摘要： PROBLEM TO BE SOLVED: To facilitate assembling work and stabilize connection state of wiring between the back end needle tip of probe and a flat cable.
SOLUTION: The probe assembly includes a probe block arranging a plurality of probes having front end needle tips and back end needle tips with intervals in the first direction and in the state extending to the second direction perpendicular to the first direction, a flat cable having a plurality of wires, a connection block which is a connection block where one end of the flat cable is attached and connecting the flat cable to the probe block in the state that the wire contacts the back end needle tips, and a junction member combining the connection block to the back end needle tip side of the probe block.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：为了便于组装工作并稳定探头的后端针尖与扁平电缆之间的接线状态。解决方案：探针组件包括探针块，其布置具有前端针尖和后端针尖的多个探针，其具有在第一方向上的间隔并且在垂直于第一方向的第二方向延伸的状态，平坦的具有多根电线的电缆，连接块，其是连接扁平电缆的一端的连接块，并且在电线接触后端针尖的状态下将扁平电缆连接到探针块，以及接合部件将连接块组合到探针块的后端针尖侧。版权所有（C）2006，JPO＆NCIPI

3. 发明专利

JP2012037362A Probe unit and inspection device 有权
标题翻译：探测单元和检查设备
公开(公告)号：JP2012037362A
公开(公告)日：2012-02-23
申请号：JP2010177274
申请日：2010-08-06
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： NARAOKA SHUJI , KIMURA TAKESHI , FUKUSHI TOSHIO
IPC分类号： G01R1/073 , G01R1/067 , G01R31/00 , G02F1/13 , G02F1/1345
摘要： PROBLEM TO BE SOLVED: To maintain the contact accuracy high between each contactor of a film type probe and each electrode of an object to be inspected.SOLUTION: A probe unit is so constituted that: each contactor is provided at the tip of the film type probe; the film type probe is supported by a probe block in a state where the tip extends from the probe block with free flexibility; a pressure member has a pressure surface contacting with the tip of the film type probe and is swingably supported by the probe block in a state where the pressure surface faces the tip of the film type probe; and a gap is formed between the pressure surface of the pressure member and the tip of the film type probe.
摘要翻译：要解决的问题：为了保持膜型探针的每个接触器与待检查物体的每个电极之间的接触精度高。解决方案：探针单元的结构如下：每个接触器设置在膜型探针的尖端处; 薄膜型探针由探针块支撑，其中尖端从探针块以自由的灵活性延伸; 压力构件具有与膜型探针的尖端接触的压力表面，并且在压力表面面向薄膜型探针的尖端的状态下由探针块可摆动地支撑; 并且在压力构件的压力表面和膜型探针的尖端之间形成间隙。版权所有（C）2012，JPO＆INPIT

4. 发明专利

JP2012007987A Probe assembly 有权
标题翻译：探测组件
公开(公告)号：JP2012007987A
公开(公告)日：2012-01-12
申请号：JP2010143688
申请日：2010-06-24
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： FUKUSHI TOSHIO , AKAHIRA MEGUMI , KIYONO YOJI , NAKAYASHIKI YUTA
IPC分类号： G01R1/073 , G02F1/1345
摘要： PROBLEM TO BE SOLVED: To arrange probes at a narrow pitch without reducing a pitch of slits of a slit bar.SOLUTION: In a probe assembly, a first slit bar having a plurality of first slits opening downward with gaps in a lateral direction is arranged below a tip end of a supporting piece, a second slit bar having a plurality of second slits opening downward with gaps in a lateral direction is arranged on the first slit bar so that the second slits are arranged in a lateral direction and longitudinal direction with respect to the first slits, and at least part of front needle tip regions of the first and second probes are positioned at the first and second slits, respectively.
摘要翻译：要解决的问题：以窄间距布置探针而不减少狭缝条的狭缝的间距。解决方案：在探针组件中，具有沿横向方向间隙向下开放的多个第一狭缝的第一狭缝条布置在支撑件的末端的下方，具有多个第二狭缝开口的第二狭缝条在第一狭缝条上布置有沿横向方向的间隙向下延伸的第二狭缝，使得第二狭缝相对于第一狭缝在横向和纵向方向上布置，并且第一和第二探针的至少一部分前针尖区域分别位于第一和第二狭缝处。版权所有（C）2012，JPO＆INPIT

5. 发明专利

JP2007271572A Mobile type probe unit and inspection device 有权
标题翻译：移动类型探测单元和检测设备
公开(公告)号：JP2007271572A
公开(公告)日：2007-10-18
申请号：JP2006100578
申请日：2006-03-31
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： FUKUSHI TOSHIO , MIURA KAZUYOSHI , SAITO HIROKI
IPC分类号： G01R31/00 , G01R1/073 , G02F1/1345 , G09F9/00
摘要： PROBLEM TO BE SOLVED: To improve work efficiency of an adjustment work of a probe needle 13 as a contactor with respect to a liquid crystal panel 5 that has a different size.
SOLUTION: In this inspection device to be constituted, a test is performed by bringing the probe needle 13 of a probe block 12 into contact with the liquid crystal panel 5. This mobile type probe unit 21 for supporting the probe block 12 is equipped with a main base 22; a data signal side base 23 for supporting the probe block 12; a complex cross link 24 for supporting the data signal side base 23 at an arbitrary position; a gate signal side base 25 for supporting the probe block 12 by being slidably supported by the main base 22; a positioning fixing tool 27 for positioning and fixing the data signal side base 23 and the gate signal side base 25, respectively at each set positions; and a positioning fixing tool 29 for the probe block for simultaneously positioning and supporting all the plurality of probe blocks 12 on each set position.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提高作为接触器的探针13的调整作业相对于具有不同尺寸的液晶面板5的工作效率。＆lt; P＆gt;解决方案：在构成的检查装置中，通过使探针块12的探针13与液晶面板5接触来进行试验。用于支撑探针块12的移动式探针单元21是配有主底座22; 用于支撑探针块12的数据信号侧基座23; 用于在任意位置支撑数据信号侧基座23的复杂交叉连杆24; 门信号侧基座25，用于通过由主基座22可滑动地支撑来支撑探测块12; 定位固定工具27，用于分别在每个设定位置定位和固定数据信号侧基座23和门信号侧基座25; 以及用于探针块的定位固定工具29，用于同时定位和支撑每个设置位置上的所有多个探针块12。版权所有（C）2008，JPO＆INPIT

6. 发明专利

JP2007132681A Probe and its manufacturing method 有权
标题翻译：探索及其制造方法
公开(公告)号：JP2007132681A
公开(公告)日：2007-05-31
申请号：JP2005323128
申请日：2005-11-08
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： KUGA TOMOAKI , FUKUSHI TOSHIO
IPC分类号： G01R1/073
摘要： PROBLEM TO BE SOLVED: To provide a method of manufacturing a probe that is superior in durability more efficiently than before, without inviting degradation of electrical connections. SOLUTION: The metal member of a first metal material that is superior in mechanical strength and the metallic member of a second second metallic member low in resistance and hardly oxidizing are integrated, by adhering the mutually facing surfaces. The integrated metallic member by adhering is rolled down into a desired thickness, after that, the probe is formed form the rolled metal plate, such that at least the second metal part is positioned at the tip of the probe. COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：提供一种制造比以前更有效地耐久性优异的探针的方法，而不会引起电连接的劣化。解决方案：通过粘附相互面对的表面，将机械强度优异的第一金属材料的金属构件和低电阻和几乎不氧化的第二第二金属构件的金属构件结合在一起。通过粘合将一体化的金属构件卷起成所需的厚度，之后将探针从轧制金属板形成，使得至少第二金属部分位于探针的尖端。版权所有（C）2007，JPO＆INPIT

7. 发明专利

JP2005189026A Probe system 有权
标题翻译：探测系统
公开(公告)号：JP2005189026A
公开(公告)日：2005-07-14
申请号：JP2003428913
申请日：2003-12-25
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： FUKUSHI TOSHIO , NARAOKA SHUJI
IPC分类号： G01R1/073 , G01R31/00 , G01R31/28
摘要： PROBLEM TO BE SOLVED: To make a probe sheet easily removed from the first contact material even if adhered.
SOLUTION: The probe system comprises a probe holder, a probe sheet having a plurality of first wires extending to back and forth directions with intervals in the left and right directions and arranged at the lower side front of the probe holder, and an integrated circuit for driving which is a glass substrate arranged at the rear side of the probe sheet and the lower side of the probe holder. The system includes the glass substrate having a plurality of second wires and a plurality of third wires on the front side and the back side of the integrated circuit. The glass substrate is combined with the probe sheet in a state that the second wires are electrically connected with the first wires.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：即使粘附，也可以使探针片从第一接触材料容易地移除。解决方案：探针系统包括探针支架，探针片，其具有多个第一线，其沿左右方向间隔地前后方向延伸并且布置在探针保持器的下侧前侧，并且用于驱动的集成电路，其是布置在探针片的后侧和探针保持器的下侧的玻璃基板。该系统包括具有多个第二布线的玻璃基板和集成电路的正面和背面上的多个第三布线。在第二导线与第一导线电连接的状态下，玻璃基板与探针片组合。版权所有（C）2005，JPO＆NCIPI

8. 发明专利

JP2012215534A Probe apparatus 有权
标题翻译：探测器
公开(公告)号：JP2012215534A
公开(公告)日：2012-11-08
申请号：JP2011105945
申请日：2011-05-11
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： NARAOKA SHUJI , YASUDA TAKAO , OSANAI YASUAKI , YOKOYAMA MAKOTO , FUKUSHI TOSHIO , KIMURA TAKESHI
IPC分类号： G01R1/073
摘要： PROBLEM TO BE SOLVED: To surely connect a contact electrode of a probe apparatus to an electrode of an inspection object.SOLUTION: The probe apparatus includes a probe block extended in a front-back direction, a flexible wiring sheet support attached to the lower side of a front part of the probe block and a wiring sheet supported on the lower side of the wiring sheet support. The wiring sheet support includes an extension part extended in an oblique direction descending to the front. The wiring sheet includes an extended part supported on the lower side of the extension part. Further, the wiring sheet includes a sheet-like member, a plurality of wires formed on the sheet-like member and contact electrodes formed on the front parts of respective wires. Each contact electrode includes a front end face erected from the wire, an undersurface extended linearly or arcuately in the oblique direction and a corner part formed by the front end face and the undersurface.
摘要翻译：要解决的问题：将探针装置的接触电极可靠地连接到检查对象的电极。解决方案：探针装置包括沿前后方向延伸的探针块，安装在探针块的前部的下侧的柔性布线片支架和支撑在布线的下侧的布线片表单支持。布线板支撑件包括沿着向前下降的倾斜方向延伸的延伸部。布线板包括支撑在延伸部分的下侧的延伸部分。此外，布线板包括片状构件，形成在片状构件上的多根线和形成在各个线的前部的接触电极。每个接触电极包括从电线竖立的前端面，在倾斜方向上线性或弧形延伸的下表面和由前端面和下表面形成的拐角部分。版权所有（C）2013，JPO＆INPIT

9. 发明专利

JP2009150768A Probe unit and inspection device 审中-公开
标题翻译：探测单元和检查设备
公开(公告)号：JP2009150768A
公开(公告)日：2009-07-09
申请号：JP2007328771
申请日：2007-12-20
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： FUKUSHI TOSHIO , SAITO HIROKI , OSANAI YASUAKI
IPC分类号： G01R31/00 , G01R1/073 , G02F1/13
摘要： PROBLEM TO BE SOLVED: To save a space for wiring for simplified lighting inspection; to facilitate maintenance; and to reduce cost. SOLUTION: This probe unit is equipped with a connection cable part for connecting electrically a probe assembly to an external device, and the connection cable part is equipped with a short circuit part for connecting electrically each wire of an FPC cable to each probe side of the probe assembly. The short circuit part is equipped with short bumps provided individually on each wire on each probe side of the probe assembly, and a lengthy short bar to be in contact simultaneously with all short bumps arrayed in one row. Each short bump is arrayed in one lateral row respectively corresponding to red, green and yellow, and each row in red, green and yellow is disposed on each mutually shifted position. The three short bars are provided in correspondence to red, green and yellow, and each short bar is set to have a length to be in contact simultaneously with all short bumps. COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：节省布线空间，简化照明检查; 方便维修; 并降低成本。
解决方案：该探头单元配有用于将探针组件电连接到外部设备的连接电缆部分，连接电缆部件配备有短路部分，用于将FPC电缆的每根电线连接到每个探针探头组件的一侧。短路部分配备有在探针组件的每个探针侧上的每根导线上单独提供的短凸块，以及与一排排列的所有短凸起同时接触的冗长的短棒。每个短凸块分别对应于红色，绿色和黄色的一个横排排列，并且每行红色，绿色和黄色设置在每个相互移位的位置。三条短条对应于红色，绿色和黄色提供，并且每个短条被设置为具有与所有短凸起同时接触的长度。版权所有（C）2009，JPO＆INPIT

10. 发明专利

JP2005077269A Electrical connection device 有权
标题翻译：电气连接装置
公开(公告)号：JP2005077269A
公开(公告)日：2005-03-24
申请号：JP2003308793
申请日：2003-09-01
申请人： Micronics Japan Co Ltd , 株式会社日本マイクロニクス
发明人： FUKUSHI TOSHIO , SAITO TAKESHI
IPC分类号： G01R1/06 , G01R1/073 , G01R31/26 , G01R31/28 , H01L21/66
摘要： PROBLEM TO BE SOLVED: To prevent a needlepoint of a probe from coming off an electrode of a display panel without upsizing a device.
SOLUTION: This electrical connection device includes: a plurality of base members disposed on a plate-like body base so as to respectively correspond to sides of an imaginary rectangle and extend longitudinally of the corresponding sides; probe units respectively disposed on at least a pair of adjoining base members; and coupling means for together coupling adjoining base members or adjoining probe units so that at least one of the adjoining base members or at least one of the adjoining probe units is allowed to move in the longitudinal direction of the corresponding sides but is prevented from moving in the other directions.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：为了防止探针的针尖脱离显示面板的电极，而不会增大设备的尺寸。解决方案：该电连接装置包括：多个基座构件，其设置在板状体基座上，以分别对应于假想矩形的边并且延伸到相应边的纵向; 探针单元分别设置在至少一对邻接的基底构件上; 以及耦合装置，用于一起联接邻接的基座构件或相邻的探针单元，使得邻接的基座构件或至少一个邻接的探针单元中的至少一个允许沿着相应的侧面的纵向方向移动，但是被阻止在其他方向。版权所有（C）2005，JPO＆NCIPI

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