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1. 发明专利

JP2009188128A Laser irradiation apparatus 审中-公开
标题翻译：激光辐射装置
公开(公告)号：JP2009188128A
公开(公告)日：2009-08-20
申请号：JP2008025589
申请日：2008-02-05
申请人： Jasco Corp , 日本分光株式会社
发明人： SATO FUMINORI , TAKAHARA HIROYUKI , KAMENO ITSUHITO , INOUE TSUTOMU
IPC分类号： H01S3/02 , H01S3/00
摘要： PROBLEM TO BE SOLVED: To provide a laser irradiation apparatus that allows operator to observe and position the radiation point of laser beam on an object, with an access panel being opened.
SOLUTION: When an open/close detecting sensor 21 attached to a laser irradiation apparatus 20 whose safety class exceeds 1 detects opening of a door 14, a control part 22 raises an ND filter 23 of a selected absorption index which is positioned at a waiting point based on an inputted opening detecting signal so that it is inserted into the optical path 4 of the laser beam. Since the ND filter 23 absorbs laser beam and decreases the amount of transmitted light, to attain a safety class of 1, an operator can manually move a test piece 1, while observing an irradiated point P of the laser beam on the test piece 1, for accurate alignment on a predetermined position.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：提供一种激光照射装置，其允许操作者将激光束的辐射点观察并定位在物体上，同时打开检修面板。解决方案：当安装在安全等级超过1的激光照射装置20上的打开/关闭检测传感器21检测到门14的打开时，控制部分22将选定的吸收指数的ND滤波器23升高到位于基于输入的开启检测信号的等待点，使其被插入到激光束的光路4中。由于ND滤光器23吸收激光束并减少透射光量，为了达到安全等级1，操作者可以在观察测试片1上的激光束的照射点P的同时手动移动测试片1，用于在预定位置上精确对准。版权所有（C）2009，JPO＆INPIT

2. 发明专利

JP2008233109A Near-field optical probe 审中-公开
标题翻译：近场光学探头
公开(公告)号：JP2008233109A
公开(公告)日：2008-10-02
申请号：JP2008157284
申请日：2008-06-16
申请人： Japan Science & Technology Agency , Jasco Corp , Kanagawa Acad Of Sci & Technol , 日本分光株式会社 , 独立行政法人科学技術振興機構 , 財団法人神奈川科学技術アカデミー
发明人： NARITA TAKAHITO , INOUE TSUTOMU , NAKAMURA TAKAHIRO , OTSU GENICHI
IPC分类号： G01Q60/22
摘要： PROBLEM TO BE SOLVED: To provide a near-field optical probe capable of properly executing spectral analysis in a desired wavelength range in order to carry out recognition of a surface shape of a sample, and analysis of its constituents and the like.
SOLUTION: This near-field optical probe 22 is provided with a tapered core 44 formed by sharpening a tip of an optical fiber formed of a material excelling in infrared permeability, and a mask 46 formed on a surface of the tapered core 44 by excluding the tip of the tapered core 44, and characterized by being capable of irradiating a measurement sample with incident light in an infrared range from the tip 48 of the tapered core 44 exposed to the outside from the mask 46 or capturing scattered near-field light from the measurement sample.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：为了提供能够在期望的波长范围内适当地执行光谱分析以便进行样品的表面形状的识别，以及其成分等的分析的近场光学探针。解决方案：该近场光学探针22设置有通过锐化由具有优异的红外线透过率的材料形成的光纤的尖端形成的锥形芯44和形成在锥形芯44的表面上的掩模46 通过排除锥形芯44的尖端，并且其特征在于能够从具有从掩模46暴露于外部的锥形芯44的尖端48的红外范围内的入射光照射测量样本，或者捕获散射的近场来自测量样品的光。版权所有（C）2009，JPO＆INPIT

3. 发明专利

JP2004125454A Near-field spectroscope, and manufacturing method of optical fiber probe 审中-公开
公开(公告)号：JP2004125454A
公开(公告)日：2004-04-22
申请号：JP2002286436
申请日：2002-09-30
申请人： Jasco Corp , 日本分光株式会社
发明人： NARITA TAKAHITO , SATO FUMINORI , INOUE TSUTOMU , SAITO OMIYA , MIYAJIMA TATSUYA , SAKAMAKI TORU , KOJIMA MAKOTO
IPC分类号： G01B11/30 , G01N21/27 , G01N21/39 , G01Q60/18 , G01Q60/22 , G01N13/14 , G12B21/06
摘要： PROBLEM TO BE SOLVED: To reduce influence of background light, in a near-field spectroscope.
SOLUTION: This near-field spectroscope is provided with a light radiation means 10 for radiating a laser beam having a predetermined wavelength; an optical fiber probe 12 having a surface coated with a metal or a dielectric material and having a minute opening at a tip; and a spectroscopy means 14 for making spectral diffraction of light emission by a sample; and is so structured that the laser beam is radiated to the sample 22 from the optical fiber probe opening as a near field, the light emission of the sample 22 by the near field is converged to send it to the spectroscopy means 14. The device is equipped with a filter 16 for removing a wavelength region including the wavelength of the laser beam, and characterized in that light emission caused by multiphoton excitation is selectively sent to the spectroscopy means 14 by setting light density in the vicinity of the opening of the fiber probe 12 high and by transmitting the light emission from the sample through the filter 16.
COPYRIGHT: (C)2004,JPO

4. 发明专利

JP2014016531A Confocal microscopic device 有权
标题翻译：协同微型器件
公开(公告)号：JP2014016531A
公开(公告)日：2014-01-30
申请号：JP2012154398
申请日：2012-07-10
申请人： Jasco Corp , 日本分光株式会社
发明人： AIZAWA KENTO , MAEDA KATSUSHI , INOUE TSUTOMU
IPC分类号： G02B21/06 , G01N21/65
CPC分类号： G02B21/0024 , G02B21/0032 , G02B21/004 , G02B21/0064
摘要： PROBLEM TO BE SOLVED: To provide a confocal microscopic device that can maintain spatial resolution at the same level as that of a single aperture, acquire respective spectra of light from a plurality of points of a specimen at a time, and thus perform a distribution measurement of the specimen with high resolution and at high speed.SOLUTION: The confocal microscopic device irradiating a measurement area of a specimen S with a linear beam and acquiring spectrum information on Raman light from the measurement area is configured to include: a line irradiation light source 20 that irradiates the measurement area with the linear beam; an objective lens 32 that is arranged to focus on a focal plane in the measurement area; an imaging lens 34 that images light collected by the objective lens 32; a multi-aperture 36 that has a plurality of opening holes 38 arranged on an imaging plane of the imaging lens 34; and spectrum acquisition means 50 and 60 that detect light passing through the multi-aperture 36 and acquire spectrum information on the passed-through light for each opening hole 38.
摘要翻译：要解决的问题：为了提供可以将空间分辨率保持在与单个孔径相同水平的共焦显微装置，一次从样本的多个点获取光的各个光谱，并且因此执行分布测量的高分辨率的样品。解决方案：利用线性光束照射样品S的测量区域并从测量区域获取关于拉曼光的光谱信息的共焦显微镜装置被配置为包括：线照射光源 20，用线性光束照射测量区域; 被配置为聚焦在测量区域中的焦平面上的物镜32; 成像透镜34，其成像由物镜32收集的光; 具有布置在成像透镜34的成像平面上的多个开孔38的多孔36; 以及频谱获取装置50和60，其检测通过多孔径36的光，并获取每个开孔38的穿过光的光谱信息。

5. 发明专利

JP2009063410A Near-field fiber probe, and near-field optical microscope 有权
标题翻译：近场光纤探头和近场光学显微镜
公开(公告)号：JP2009063410A
公开(公告)日：2009-03-26
申请号：JP2007231263
申请日：2007-09-06
申请人： Jasco Corp , 日本分光株式会社
发明人： INOUE TSUTOMU , SATO FUMINORI , NARITA TAKAHITO
IPC分类号： G01Q60/22
摘要： PROBLEM TO BE SOLVED: To provide a near-field fiber probe capable of improving its general versatility.
SOLUTION: The near-field fiber probe 14 used for near-field measurement of a sample 32 is characterized by using a short probe shortening a length of an optical fiber.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：提供能够改善其通用性的近场光纤探针。解决方案：用于样品32的近场测量的近场光纤探针14的特征在于使用缩短光纤长度的短探针。版权所有（C）2009，JPO＆INPIT

6. 发明专利

JP2003004623A Near field optical probe and its manufacturing method 有权
标题翻译：近场光学探测及其制造方法
公开(公告)号：JP2003004623A
公开(公告)日：2003-01-08
申请号：JP2001193356
申请日：2001-06-26
申请人： Jasco Corp , 日本分光株式会社
发明人： INOUE TSUTOMU , NARITA TAKAHITO
IPC分类号： G01Q60/22 , G01N13/14 , G12B21/06
摘要： PROBLEM TO BE SOLVED: To provide a near field optical probe for enhancing light transmission efficiency of the core and its manufacturing method.
SOLUTION: In the near field optical probe and its manufacturing method, end part 110 of a fiber is immersed sequentially into a plurality of etching liquids exhibiting different ratio of dissolution rate to the clad part 114 of the core part 112 to form second and third tapered stages 118b and 118c having a different taper angle sequentially and continuously to the bottom side of a first tapered stage 118a formed at the pointed part 116 thus producing the near field optical probe in which a multi-stage tapered pointed part of three stages or more is formed.
COPYRIGHT: (C)2003,JPO
摘要翻译：要解决的问题：提供一种用于提高芯的光传输效率的近场光探针及其制造方法。解决方案：在近场光学探针及其制造方法中，将纤维的端部110依次浸入多个与核心部分112的包层部分114的溶解速率不同的蚀刻液中，形成第二和第三锥形阶段118b和118c具有不同的锥角，并且连续地连接到形成在尖部116处的第一锥形台118a的底侧，从而产生近场光学探针，其中三级或更多级的多级锥形尖部是形成。

7. 发明专利

JP2012042486A Near-field spectral instrument 有权
标题翻译：近场光谱仪器
公开(公告)号：JP2012042486A
公开(公告)日：2012-03-01
申请号：JP2011262539
申请日：2011-11-30
申请人： Jasco Corp , 日本分光株式会社
发明人： NARITA TAKAHITO , SATO FUMINORI , SAKAMAKI TORU , INOUE TSUTOMU , KIMURA SHIGEYUKI
IPC分类号： G01Q60/18 , G01Q10/06
摘要： PROBLEM TO BE SOLVED: To provide a near-field spectral instrument capable of efficiently obtaining true spectral information.SOLUTION: The present invention relates to a near-field spectral instrument 10 including Z-axis scan means 18, 20 and arithmetic means 46. When obtaining near-field spectral information of a sample 24, the Z-axis scan means 18, 20 makes the sample 24 and a distal end of a probe 12 close to each other within a predetermined distance inside a near field area 25. When obtaining background spectral information, the Z-axis scan means 18, 20 makes them separated from each other for a predetermined distance outside the near field area 25. The arithmetic means 46 subtracts the background spectral information from the near-field spectral information to obtain true near-field spectral information from which the background has been excluded. Background information acquisition means obtains the background spectral information of a corresponding measuring portion while the sample 24 and the distal end of the probe 12 are separated for the predetermined distance outside of the near-field area 25.
摘要翻译：要解决的问题：提供能够有效获得真实光谱信息的近场光谱仪器。解决方案：本发明涉及包括Z轴扫描装置18,20和算术装置46的近场光谱仪器10.当获得样品24的近场光谱信息时，Z轴扫描装置18 ，20使得样本24和探针12的远端在近场区域25内的预定距离内彼此靠近。当获得背景光谱信息时，Z轴扫描装置18,20使它们彼此分离在近场区域25之外预定距离。算术装置46从近场光谱信息中减去背景光谱信息，以获得背景被排除的真实的近场光谱信息。背景信息获取装置在样本24和探针12的远端在近场区域25之外分离预定距离的同时获得相应测量部分的背景光谱信息。版权所有（C）2012 ，JPO＆INPIT

8. 发明专利

JP2011232107A Spectrometry, spectrometer and cylindrical member 有权
标题翻译：光谱仪，光谱仪和圆柱体成员
公开(公告)号：JP2011232107A
公开(公告)日：2011-11-17
申请号：JP2010101406
申请日：2010-04-26
申请人： Jasco Corp , 日本分光株式会社
发明人： INOUE TSUTOMU , NAGAMORI KOJI , YUMOTO MASAAKI
IPC分类号： G01N21/65 , G01N21/64 , G02B6/032
摘要： PROBLEM TO BE SOLVED: To provide a method for enhancing light from a solution sample and to improve measurement sensitivity in spectrometry for analyzing the solution sample.SOLUTION: The method is carried out by using a cylindrical member 4 and comprises: immersing one open end 42 of the cylinder member in a solution sample W to take the solution sample W into a cylindrical portion 43 of the cylindrical member 4; irradiating the other open end 41 of the cylindrical portion 43 with irradiation light; subjecting the light from the solution sample W, the light induced by propagation of the taken irradiation light through the solution sample, to multiple reflection on an inner circumference of the cylindrical portion 43 in the solution sample so as to enhance the light exiting from the other open end 41; and detecting the light from the solution sample W, the light exiting from the other open end 41.
摘要翻译：要解决的问题：提供一种用于增强溶液样品的光的方法，并提高用于分析溶液样品的光谱测定中的测量灵敏度。解决方案：该方法通过使用圆柱形构件4进行，并且包括：将圆筒构件的一个开口端42浸入溶液样品W中以将溶液样品W取入圆筒构件4的圆筒部43; 用照射光照射圆筒部43的另一个开口端41; 使来自溶液样品W的光通过溶液样品将所摄取的照射光的传播感应的光在溶液样品中的圆筒部43的内周上进行多次反射，以增强从另一方出射的光开口端41; 并检测来自溶液样品W的光，从另一个开口端41射出的光。版权所有（C）2012，JPO＆INPIT

9. 发明专利

JP2010175266A Phase difference measuring instrument 有权
标题翻译：相差测量仪器
公开(公告)号：JP2010175266A
公开(公告)日：2010-08-12
申请号：JP2009015196
申请日：2009-01-27
申请人： Jasco Corp , 日本分光株式会社
发明人： WADA AKIO , FUKAZAWA TOMOYUKI , INOUE TSUTOMU , SATO FUMINORI , SANO MITSURU , MASAGO HIROSHI , HASEGAWA KATSUJI
IPC分类号： G01N21/23 , G01J4/04
摘要： PROBLEM TO BE SOLVED: To provide a phase difference measuring instrument capable of measuring an axial orientation and phase difference with high precision using a polarizing probe. SOLUTION: Since a rotation mechanism 5 for rotating the polarizer 41 of the front stage of a sample S in integrated relation to PEM 42 is provided to obtain the light intensity signal of the near-field light condensed by the polarizing probe 2 by altering the orientation angle of the transmission axis of the polarizer 41 with respect to the transmission axis of the polarizing probe 2 of the rear stage of the sample 5, it becomes unnecessary not only to rotate the sample S with respect to the polarizing probe 2 but also to rotate the polarizing probe 2 with respect to the sample S. Further, the near-field light produced on the measuring surface of the sample S is measured with in-plane space resolution of an order of the wavelength or below of light by condensing the near-field light using the polarizing probe 2. Accordingly, the axial orientation and phase difference of the sample S is measured with high precision using the polarizing probe 2. COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：提供一种能够使用偏振探测器以高精度测量轴向取向和相位差的相位差测量仪器。解决方案：由于提供了用于旋转与PEM42成一体的样品S的前级的偏振器41的旋转机构5，以获得由偏振探针2会聚的近场光的光强度信号，通过改变偏振器41的透射轴相对于样品5的后级的偏振探测器2的透射轴的取向角，不仅不需要使样品S相对于偏振探针2旋转，而且也可以使偏振探针2相对于样品S旋转。此外，在样品S的测量表面上产生的近场光通过冷凝的波长或波长以下的面内空间分辨率来测量使用偏光探针2的近场光。因此，使用偏振探测器2以高精度测量样品S的轴向取向和相位差。（C）2010，JPO＆INPIT

10. 发明专利

JP2006300708A Near field polarization measuring instrument 有权
标题翻译：近场偏振测量仪器
公开(公告)号：JP2006300708A
公开(公告)日：2006-11-02
申请号：JP2005122311
申请日：2005-04-20
申请人： Jasco Corp , 日本分光株式会社
发明人： INOUE TSUTOMU , SATO FUMINORI , NARITA TAKAHITO , SENUMA MUTSUMI
IPC分类号： G01B11/00 , G01N21/21 , G01Q60/18 , G01Q60/22
CPC分类号： G01J4/00 , B82Y20/00 , B82Y35/00 , G01N21/21 , G01Q30/02 , G01Q60/22
摘要： PROBLEM TO BE SOLVED: To provide a near field rotatory polarization measuring instrument having a spatial resolution of light diffraction limit or more. SOLUTION: This near field rotatory polarization measuring instrument 10 is provided with: a near field probe 14 having in its tip an opening smaller than a wavelength of light used in measurement, and for emitting a near field light of linear polarization from the opening to irradiate a sample with the near field light; a detecting means 22 for detecting the light transmitted through the sample; an analyzer 18 provided in a preceding stage of the detecting means; and an analyzer rotating means 20 for rotating the analyzer around an optical axis as the center, and for changing an angle of a transmission axis thereof, and measures an angle of rotation of the sample by rotating the analyzer with the analyzer rotating means. COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：提供具有光衍射极限以上的空间分辨率的近场旋转极化测定仪。解决方案：该近场旋转极化测量仪器10设置有：近场探针14，其尖端具有比测量中使用的光的波长小的开口，并且用于从线偏振的近场光发射开放用近场光照射样品; 用于检测透过样品的光的检测装置22; 设置在检测装置的前级的分析器18; 以及用于使分析器围绕作为中心的光轴旋转并用于改变其透射轴的角度的分析器旋转装置20，并且通过用分析器旋转装置旋转分析器来测量样品的旋转角度。版权所有（C）2007，JPO＆INPIT

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