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1. 发明专利

JP2014182077A Infrared spectrometry apparatus and method 有权
标题翻译：红外光谱仪和方法
公开(公告)号：JP2014182077A
公开(公告)日：2014-09-29
申请号：JP2013058061
申请日：2013-03-21
申请人： Jasco Corp , 日本分光株式会社
发明人： SOGA YOSHIAKI , KOSHOBU JUN
IPC分类号： G01N21/3563
摘要： PROBLEM TO BE SOLVED: To provide a spectrometry apparatus using an FT/IR capable of analyzing components without grinding or polishing the surface of a quartz block cut out from a quartz column immediately after the production.SOLUTION: An infrared spectrometry apparatus includes two cylindrical lenses 25 and 26 on an optical path extending from a light source 21 of the FT/IR to a detector 22, where the quartz block is inserted between the two cylindrical lenses. On the basis of the shape of a lateral face of the quartz block, refraction of measurement light to be generated is corrected by the two cylindrical lenses so as to analyze the components of the quartz without performing a grinding/polishing step for a cutting surface of the quartz block.
摘要翻译：要解决的问题：提供一种使用能够分析组分而不研磨或抛光生产后立即从石英柱切出的石英块表面的FT / IR的光谱测定装置。解决方案：一种红外分光装置包括两个柱面透镜 25和26在从FT / IR的光源21延伸到检测器22的光路上，其中石英块被插入在两个柱面透镜之间。基于石英块的侧面的形状，通过两个柱面透镜校正要产生的测量光的折射，以便分析石英的组分，而不进行用于切割表面的研磨/抛光步骤石英块。

2. 发明专利

JP2011247756A Circular dichroism dispersion measurement method using atr method and circular dichroism dispersion meter 审中-公开
标题翻译：使用ATR方法和循环二色散射计的圆二色散射测量方法
公开(公告)号：JP2011247756A
公开(公告)日：2011-12-08
申请号：JP2010121496
申请日：2010-05-27
申请人： Jasco Corp , 日本分光株式会社
发明人： KONDO YOSHIRO , ETTORE CASTIGLIONI
IPC分类号： G01N21/19 , G01J3/447 , G01N21/27 , G01N21/552
CPC分类号： G01N21/552 , G01N21/19
摘要： PROBLEM TO BE SOLVED: To provide a method and a circular dichroism dispersion meter for easily measuring circular dichroism dispersion nondestructively with no processing without transmitting light to a liquid/cream/gel sample of low transparency.SOLUTION: The circular dichroism dispersion is measured by making measurement light 28 which is a counterclockwise or clockwise circularly polarized light be incident from an incidence surface 20 of a prism 16, making it be incident with the incidence angle of 80° to a sample mounting surface 22 of the prism 16 where a gel sample 26 is mounted, having it totally reflected on the sample mounting surface 22, detecting each of the measurement light 28 emitted from an emission surface 24 respectively and measuring respective absorbance.
摘要翻译：要解决的问题：提供一种方法和圆二色性分散计，用于在不将光照射到低透明度的液体/乳膏/凝胶样品的情况下，非破坏性地测量圆二色性分散体。解决方案：通过使来自反射镜或顺时针圆偏振光的测量光28从棱镜16的入射表面20入射来测量圆二色性色散，使其以80°的入射角入射到棱镜16的样品安装表面22，其中安装有凝胶样品26，其在样品安装表面22上被全反射，分别检测从发射表面24发射的每个测量光28并测量相应的吸光度。版权所有（C）2012，JPO＆INPIT

3. 发明专利

JP2011247753A Holding method of solution sample, sample cell and measuring apparatus of circular dichroism 有权
标题翻译：溶液样品，样品池和循环二色体测量装置的保存方法
公开(公告)号：JP2011247753A
公开(公告)日：2011-12-08
申请号：JP2010121416
申请日：2010-05-27
申请人： Jasco Corp , 日本分光株式会社
发明人： ETTORE CASTIGLIONI , KONDO YOSHIRO , TAKASHITA ICHITARO
IPC分类号： G01N21/01 , G01N1/28 , G01N21/03 , G01N21/19
摘要： PROBLEM TO BE SOLVED: To provide a method capable of clamping and holding a solution sample between two translucent members even when the solution sample is a minute amount, in order to measure light transmitted through the solution sample.SOLUTION: By using one translucent member 34 having a dripping area 34A where the solution sample S is dripped and a liquid repellent area 34B surrounding the dripping area 34A, first, the minute amount of the solution sample S is dripped to the dripping area 34A. Then, the solution sample S is covered with the other translucent member 36, and an interval (L) between the one translucent member 34 and the other translucent member 36 is kept in a predetermined size. The liquid repellent area 34B is covered with a liquid repellent material, and the minute amount of the solution sample S is held in the state of being brought into contact with both of the two translucent members 34 and 36.
摘要翻译：要解决的问题：为了提供即使当溶液样品是微量时也能够将溶液样品夹持并保持在两个半透明构件之间的方法，以便测量透过溶液样品的光。解决方案：通过使用具有滴下溶液样品S的滴落区域34A的一个半透明构件34和围绕滴落区域34A的疏液区域34B，首先，将微量的溶液样品S滴入滴下区域34A。然后，溶液样品S被另一个半透明部件36覆盖，并且一个透光部件34和另一个透光部件36之间的间隔（L）保持在预定尺寸。防液区域34B被防液性材料覆盖，并且溶液样本S的微量保持在与两个半透明构件34和36两者接触的状态。版权所有：（C ）2012，JPO＆INPIT

4. 发明专利

JP2011220962A Apparatus for measuring physical property of ultraviolet curing resin 有权
标题翻译：用于测量超紫外线固化树脂的物理性能的装置
公开(公告)号：JP2011220962A
公开(公告)日：2011-11-04
申请号：JP2010093089
申请日：2010-04-14
申请人： Jasco Corp , Jasco International Co Ltd , ジャスコインタナショナル株式会社 , 日本分光株式会社
发明人： NAGOSHI TOSHIYUKI , KOSHOBU JUN , WATANABE MITSUO , INOUE TAKASHI , ITO SHIGERU
IPC分类号： G01N11/00 , G01N21/27 , G01N21/35 , G01N21/552
CPC分类号： G01N11/142 , G01N2011/008 , G01N2203/0092
摘要： PROBLEM TO BE SOLVED: To provide an apparatus for measuring a physical property of an ultraviolet curing resin that is capable of measuring absorption spectrum, as well as viscosity and viscoelasticity simultaneously in the curing process, whereby the load on the measurer is reduced.SOLUTION: An apparatus for measuring a physical property of an ultraviolet curing resin includes a rotating plate 17 and a torque detection plate 18, holding in-between an ultraviolet curing resinoid specimen S, and a torque sensor 20 for detecting torque that emerges on the torque detection plate 18 as the rotation plate 17 rotates. The torque detection plate 18 has a refractive index greater than the specimen S, and is defined as a total reflection prism transmitting ultraviolet and infrared light. Therefore, by irradiating ultraviolet light on the specimen S through the total reflection prism, viscosity and viscoelasticity can be measured using the torque to be detected. Simultaneously, infrared absorption spectrum can be measured by injecting infrared light through the total reflection prism, and then detecting infrared interference light, which attenuates due to the total reflection within the prism, by using an interference light detector 14.
摘要翻译：要解决的问题：提供一种能够测量在固化过程中同时测量吸收光谱以及粘度和粘弹性的紫外线固化树脂的物理性质的装置，由此测量仪上的负荷降低。解决方案：用于测量紫外线固化树脂的物理性能的装置包括：旋转板17和保持在紫外线固化树脂样品S之间的转矩检测板18和用于检测出现的扭矩的扭矩传感器20 在旋转板17旋转时在扭矩检测板18上。转矩检测板18的折射率大于样本S，并且被定义为透射紫外线和红外光的全反射棱镜。因此，通过全反射棱镜对试样S照射紫外光，可以使用要检测的转矩来测定粘度和粘弹性。同时，通过使用干涉光检测器14，通过全反射棱镜注入红外光，然后检测由于棱镜内的全反射而衰减的红外干涉光，可以测量红外吸收光谱。 C）2012，JPO＆INPIT

5. 发明专利

JP2011022294A Method for producing holographic notch filter, and holographic notch filter produced by the method 有权
标题翻译：用于生产全息式过滤器的方法和由该方法生产的全息式过滤器
公开(公告)号：JP2011022294A
公开(公告)日：2011-02-03
申请号：JP2009166325
申请日：2009-07-15
申请人： Jasco Corp , 日本分光株式会社
发明人： KAMENO ITSUHITO , YOSHIKI YASUNOBU
IPC分类号： G03H1/04 , G02B5/26 , G02B5/32
摘要： PROBLEM TO BE SOLVED: To provide a method for producing a holographic notch filter where light absorption peaks based on two or more dimensional, high order interferences are generated on the wavelength region along the long wavelength side, and high light absorption peaks having high absorbance at a narrow band width can be produced, and to provide a notch filter produced by the method.
SOLUTION: In the method for producing a holographic notch filter, the surface of a recording material 16 supported to a transparent support body 14 with the back surface as a mirror 18 is mounted with a prism 30 having a refractive index almost same as that of the recording material 16 in such a manner that the bottom face 33 tightly adheres thereto. Recording light 20 is made incident from the incidence plane 31 of the prism 30 and is passed through the boundary between the prism 30 and the recording material 16. Then, the recording light 20 passed through the boundary and reflected light 20r from the plane of the mirror 18 are interfered within the recording material 16 to record a non-sinusoidal wave-form index modulation in such a manner that the two-dimensional, high order interferences are produced in the wavelength region corresponding to the wavelength λof the light to be removed.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供一种制造全息陷波滤波器的方法，其中在沿着长波长侧的波长区域上产生基于两维或更多维的高阶干扰的光吸收峰值，并且具有高的光吸收峰值可以产生窄带宽的高吸光度，并提供通过该方法制造的陷波滤波器。解决方案：在制造全息陷波滤波器的方法中，以背面为反射镜18支撑在透明支撑体14上的记录材料16的表面安装有折射率几乎相同的棱镜30 记录材料16的底面33紧贴在其上。记录光20从棱镜30的入射面31入射，并通过棱镜30和记录材料16之间的边界。然后，记录光20从边界和反射光20r的平面通过反射镜18在记录材料16内被干扰以记录非正弦波形索引调制，使得在对应于待去除的光的波长λ的波长区域中产生二维高阶干扰。版权所有（C）2011，JPO＆INPIT

6. 发明专利

JP2010281690A Microscopic total reflection measuring apparatus 有权
标题翻译： MICROSCOPIC总反射测量装置
公开(公告)号：JP2010281690A
公开(公告)日：2010-12-16
申请号：JP2009135258
申请日：2009-06-04
申请人： Jasco Corp , 日本分光株式会社
发明人： SOGA YOSHIAKI , SUGIYAMA CHIKAMI , SERA TAKAYUKI , KOSHOBU JUN
IPC分类号： G01N21/27 , G01N21/552
CPC分类号： G02B17/0808 , G01N21/3563 , G01N21/55 , G01N21/8806 , G02B21/0016
摘要： PROBLEM TO BE SOLVED: To provide a total reflection measuring apparatus capable of visually observing a specific minute part of a measurement object and efficiently obtaining optical data by total reflection measurement. SOLUTION: A Cassegrain mirror 12 having a Cassegrain primary mirror 16 and a Cassegrain secondary mirror 18 condenses incident light 20 on a measurement object 20 by making the incident light reflected by the secondary mirror 18 and the primary mirror 16 in this order, and obtains reflected light 32 by making the reflected light reflected by the primary mirror 16 and the secondary mirror 18 in this order. A total reflection prism 14 is disposed below the Cassegrain secondary mirror 18. The incident light contains visible light for visual observation and measurement light for the acquisition of analytical information. A visible light filter separates at least one of the incident light to the total reflection prism 14 and the reflected light from the total reflection prism into a total reflection area B and a normal reflection area A, and eliminates the visible light in the total reflection area B from the incident light or the reflected light. COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供一种能够目视观察测量对象的特定微小部分并通过全反射测量有效地获得光学数据的全反射测量装置。解决方案：具有卡塞格林主镜16和卡塞格伦二次镜18的卡塞格林镜12依次由副镜18和主镜16反射的入射光将入射光20冷凝在测量对象20上，并且通过使主反射镜16和副反射镜18反射的反射光依次得到反射光32。全反射棱镜14设置在卡塞格伦副镜18的下方。入射光包含用于目视观察的可见光和用于获取分析信息的测量光。可见光滤光器将入射光中的至少一个与全反射棱镜14和来自全反射棱镜的反射光分离成全反射区域B和正反射区域A，并且消除全反射区域中的可见光 B从入射光或反射光。版权所有（C）2011，JPO＆INPIT

7. 发明专利

JP2010276480A Baseline setting method 有权
标题翻译：基线设置方法
公开(公告)号：JP2010276480A
公开(公告)日：2010-12-09
申请号：JP2009129494
申请日：2009-05-28
申请人： Jasco Corp , 日本分光株式会社
发明人： FUKUSHIMA TAKEO , OKUBO MASAHARU
IPC分类号： G01J3/28 , G01J3/02
CPC分类号： G01N21/35 , G01N21/274
摘要： PROBLEM TO BE SOLVED: To simply and accurately set a baseline with reduced calculation load.
SOLUTION: A semicircular, semi-elliptical or quadratic curve figure is present on an X axis, and is scanned in the X axis direction. The figure is fixed at an optional position relative to a reference point. If a peak appears in the positive Y axis direction, the minimum value of a difference between a spectrum and a height of the figure is obtained in a range in which the figure is present on the X axis. The sum of the minimum value and the height of the figure at the reference point is obtained. The figure is shifted in a range including the reference point. At each position of the figure, the sum of the minimum value of the difference between the spectrum and the height of the figure and the height of the figure at the reference point is similarly calculated. The maximum value L
(xi) is obtained among calculated values, and obtained as a baseline value at an X coordinate of the reference point.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：简单而准确地设定一个减少计算负荷的基线。
解决方案：X轴上存在半圆形，半椭圆形或二次曲线图形，并沿X轴方向扫描。该图被固定在相对于参考点的可选位置。如果正Y轴方向出现峰值，则在X轴上存在图形的范围内，可以得到光谱与高度之差的最小值。获得参考点的图形的最小值和高度之和。该图在包括参考点的范围内移动。在图的每个位置处，类似地计算了频谱与图形的高度之间的差值与参考点的图形的高度的最小值之和。在计算值之间获得最大值L （xi），并作为参考点的X坐标处的基线值获得。版权所有（C）2011，JPO＆INPIT

8. 发明专利

JP2010243359A Measuring instrument and method of inspecting performance of automatic alignment mechanism 有权
标题翻译：测量仪器和检测自动对准机构性能的方法
公开(公告)号：JP2010243359A
公开(公告)日：2010-10-28
申请号：JP2009093128
申请日：2009-04-07
申请人： Jasco Corp , 日本分光株式会社
发明人： SEKIZAWA KAZUTOSHI , MUTO ISAMU , FUCHIGAMI MASAO
IPC分类号： G01B5/252
摘要： PROBLEM TO BE SOLVED: To provide a measuring instrument for smoothly and correctly measuring eccentricity. SOLUTION: The measuring instrument 30 includes a body 31 mounted on a shaft, a measuring means 34 for measuring an interval size from the shaft to an inner peripheral surface of a cylinder, and an operating means 32 for transmitting operation driving force input from a tip to the measuring means 34. The measuring means 34 includes four spindles 41 provided around a center axis at predetermined intervals, an urging part for urging the spindles 41 in a longitudinal direction, and a ring for keeping the spindles 41 not to advance by the urging. When the ring rotates, the holding of the spindles 41 is canceled. The ring is rotated to advance the spindles 41 while the body 31 is inserted into the cylinder, so that their tips are in contact with the inner peripheral surface of the cylinder. Then, the interval size is measured from the position of the spindles 41. COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供一种用于平稳和正确测量偏心度的测量仪器。解决方案：测量仪器30包括安装在轴上的主体31，用于测量从轴到圆筒的内周面的间隔尺寸的测量装置34以及用于传送操作驱动力输入的操作装置32 测量装置34包括以预定间隔设置在中心轴线周围的四个心轴41，用于沿长度方向推动心轴41的推动部分和用于保持心轴41不能前进的环通过敦促。当环旋转时，主轴41的保持被取消。当主体31插入到气缸中时，环旋转以推进心轴41，使得其尖端与气缸的内周表面接触。然后，从主轴41的位置测量间隔尺寸。版权所有（C）2011，JPO＆INPIT

9. 发明专利

JP2009188128A Laser irradiation apparatus 审中-公开
标题翻译：激光辐射装置
公开(公告)号：JP2009188128A
公开(公告)日：2009-08-20
申请号：JP2008025589
申请日：2008-02-05
申请人： Jasco Corp , 日本分光株式会社
发明人： SATO FUMINORI , TAKAHARA HIROYUKI , KAMENO ITSUHITO , INOUE TSUTOMU
IPC分类号： H01S3/02 , H01S3/00
摘要： PROBLEM TO BE SOLVED: To provide a laser irradiation apparatus that allows operator to observe and position the radiation point of laser beam on an object, with an access panel being opened.
SOLUTION: When an open/close detecting sensor 21 attached to a laser irradiation apparatus 20 whose safety class exceeds 1 detects opening of a door 14, a control part 22 raises an ND filter 23 of a selected absorption index which is positioned at a waiting point based on an inputted opening detecting signal so that it is inserted into the optical path 4 of the laser beam. Since the ND filter 23 absorbs laser beam and decreases the amount of transmitted light, to attain a safety class of 1, an operator can manually move a test piece 1, while observing an irradiated point P of the laser beam on the test piece 1, for accurate alignment on a predetermined position.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：提供一种激光照射装置，其允许操作者将激光束的辐射点观察并定位在物体上，同时打开检修面板。解决方案：当安装在安全等级超过1的激光照射装置20上的打开/关闭检测传感器21检测到门14的打开时，控制部分22将选定的吸收指数的ND滤波器23升高到位于基于输入的开启检测信号的等待点，使其被插入到激光束的光路4中。由于ND滤光器23吸收激光束并减少透射光量，为了达到安全等级1，操作者可以在观察测试片1上的激光束的照射点P的同时手动移动测试片1，用于在预定位置上精确对准。版权所有（C）2009，JPO＆INPIT

10. 发明专利

JP2008233109A Near-field optical probe 审中-公开
标题翻译：近场光学探头
公开(公告)号：JP2008233109A
公开(公告)日：2008-10-02
申请号：JP2008157284
申请日：2008-06-16
申请人： Japan Science & Technology Agency , Jasco Corp , Kanagawa Acad Of Sci & Technol , 日本分光株式会社 , 独立行政法人科学技術振興機構 , 財団法人神奈川科学技術アカデミー
发明人： NARITA TAKAHITO , INOUE TSUTOMU , NAKAMURA TAKAHIRO , OTSU GENICHI
IPC分类号： G01Q60/22
摘要： PROBLEM TO BE SOLVED: To provide a near-field optical probe capable of properly executing spectral analysis in a desired wavelength range in order to carry out recognition of a surface shape of a sample, and analysis of its constituents and the like.
SOLUTION: This near-field optical probe 22 is provided with a tapered core 44 formed by sharpening a tip of an optical fiber formed of a material excelling in infrared permeability, and a mask 46 formed on a surface of the tapered core 44 by excluding the tip of the tapered core 44, and characterized by being capable of irradiating a measurement sample with incident light in an infrared range from the tip 48 of the tapered core 44 exposed to the outside from the mask 46 or capturing scattered near-field light from the measurement sample.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：为了提供能够在期望的波长范围内适当地执行光谱分析以便进行样品的表面形状的识别，以及其成分等的分析的近场光学探针。解决方案：该近场光学探针22设置有通过锐化由具有优异的红外线透过率的材料形成的光纤的尖端形成的锥形芯44和形成在锥形芯44的表面上的掩模46 通过排除锥形芯44的尖端，并且其特征在于能够从具有从掩模46暴露于外部的锥形芯44的尖端48的红外范围内的入射光照射测量样本，或者捕获散射的近场来自测量样品的光。版权所有（C）2009，JPO＆INPIT

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