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1. 发明专利

JP2012255663A Optical analyzer with power-saving mode function 有权
标题翻译：具有省电模式功能的光学分析仪
公开(公告)号：JP2012255663A
公开(公告)日：2012-12-27
申请号：JP2011127559
申请日：2011-06-07
申请人： Jasco Corp , 日本分光株式会社
发明人： SOGA YOSHIAKI , KOSHOBU JUN , KASHIWABARA HARUICHI , SHIMOMURA MIYUKI
IPC分类号： G01N21/01 , G01J3/10 , G01N35/00
摘要： PROBLEM TO BE SOLVED: To provide an optical analyzer capable of automating operation of shifting to and exiting from an energy-saving mode and achieving power-saving effect and reduction of the start-up time of a light source at the same time.SOLUTION: An optical analyzer is constituted of optical analysis means 1 including a light source 11 and devices 12 other than the light source, power supply means 2 and control means 3. The power supply means 2 includes a switch 23 for the light source and a switch 24 for the devices. The control means 3 comprises a memory 31 for storing a scheduled time in accordance with an analysis schedule, a timer 32 and a CPU for issuing ON/OFF instructions of respective switches. The switch 23 for the light source can be switched to a plurality of power-saving modes S, Sin which power supply ratio is more than 0% and less than 100%. The CPU keeps the switch 23 for the light source in a power-saving mode Swith a lower level of power supply until a mode switching time T, switches it to a power-saving mode Swith a higher level of power supply at the mode switching time T, and turns it ON at a start time Tof a start-up.
摘要翻译：要解决的问题：提供一种能够自动化从节能模式转出的操作的光学分析仪，并且同时实现节能效果和减少光源的启动时间。解决方案：光学分析仪由包括光源11和除了光源，电源装置2和控制装置3之外的装置12的光学分析装置1构成。电源装置2包括用于光的开关23 源和用于设备的开关24。控制装置3包括用于根据分析计划存储预定时间的存储器31，用于发出各个开关的ON / OFF指令的定时器32和CPU。用于光源的开关23可以被切换到多个功率保持模式S 1 ，S 2 供应比率超过0％且小于100％。 CPU将光源的开关23保持在具有较低电源电平的省电模式S 1 中，直到模式切换时间T 1 ，在模式切换时间T 下切换到省电模式S 2 ，电源电平较高 1 ，并在启动时间的开始时间T 2 时将其打开。版权所有（C）2013，JPO＆INPIT

2. 发明专利

JP2007285945A Infrared microscope 有权
标题翻译：红外显微镜
公开(公告)号：JP2007285945A
公开(公告)日：2007-11-01
申请号：JP2006115097
申请日：2006-04-19
申请人： Jasco Corp , 日本分光株式会社
发明人： SOGA YOSHIAKI , KOSHOBU JUN
IPC分类号： G01N21/27 , G01N21/35 , G01N21/3563
摘要： PROBLEM TO BE SOLVED: To provide an infrared microscope capable of observing a sample image and an aperture image, simultaneously using a simple structure. SOLUTION: This infrared microscope comprises an infrared light irradiation means 12 for irradiating infrared light to a sample measurement portion; a microscopic means 14 for condensing the light from the sample; an aperture 16 for shielding light from the other portion than the sample measurement portion; an infrared light detection means 18 for detecting the infrared light from the sample through the aperture 16; an aperture irradiating light source 20 for projecting an aperture image on the sample; a sample lighting light source 22 for irradiating visible light in the vicinity of the sample measurement portion; a sample image observation means 26 for observing visible light from the sample and observing the sample image to which the aperture image is projected; an observing beam splitter 24 placed on a light path between the microscopic means 14 and the aperture 16 and guiding visible light, from the sample to the sample image observation means 26 and infrared light from the sample to the aperture 16. COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供能够同时使用简单结构来观察样本图像和孔径图像的红外显微镜。解决方案：该红外显微镜包括用于将红外光照射到样品测量部分的红外光照射装置12; 用于冷凝来自样品的光的微观装置14; 用于屏蔽来自与样本测量部分相对的另一部分的光的孔16; 用于通过孔16检测来自样品的红外光的红外光检测装置18; 用于将样本上的孔径图像投影的孔径照射光源20; 用于照射样品测量部分附近的可见光的采样点亮光源22; 用于观察来自样品的可见光并观察投影光圈图像的样本图像的样本图像观察装置26; 放置在微观装置14和孔16之间的光路上的观察光束分离器24，并将可见光从样品引导到样品图像观察装置26，并将红外光从样品导向孔16。（C）2008，JPO＆INPIT

3. 发明专利

JP2000019314A BEAM SPLITTER 失效
公开(公告)号：JP2000019314A
公开(公告)日：2000-01-21
申请号：JP18244398
申请日：1998-06-29
申请人： JASCO CORP
发明人： NAGOSHI TOSHIYUKI , MINEO HIROSHI , TSUKADA HIROSHI , SEO TSUGIO , SOGA YOSHIAKI
IPC分类号： G01N21/3563 , G01N21/35 , G02B5/08 , G02B7/182
摘要： PROBLEM TO BE SOLVED: To provide a beam splitter reducing an effect of vibration. SOLUTION: The beam splitter 114 is provided with a translucent surface 115 dividing one beam to at least two splitted beams and hold bodies 126, 128 holding the translucent surface 115, and the translucent surface 115 is a sheet of thin film, and the hold bodies 126, 128 are provided with opening parts 126a, 128a for an infrared ray for inputting/emitting infrared rays to the translucent surface 115 and the opening parts 126b, 128b for a laser beam for inputting/ emitting the laser beam to the translucent surface 115, and the translucent surface 115 consisting of a sheet of thin film is partitioned to form a translucent surface part 115a for the infrared ray exposed to the outside from the opening parts 126a, 128a and the translucent surface part 115b for the laser beam exposed to the outside from the opening parts 126b, 128b.

4. 发明专利

JP2014182077A Infrared spectrometry apparatus and method 有权
标题翻译：红外光谱仪和方法
公开(公告)号：JP2014182077A
公开(公告)日：2014-09-29
申请号：JP2013058061
申请日：2013-03-21
申请人： Jasco Corp , 日本分光株式会社
发明人： SOGA YOSHIAKI , KOSHOBU JUN
IPC分类号： G01N21/3563
摘要： PROBLEM TO BE SOLVED: To provide a spectrometry apparatus using an FT/IR capable of analyzing components without grinding or polishing the surface of a quartz block cut out from a quartz column immediately after the production.SOLUTION: An infrared spectrometry apparatus includes two cylindrical lenses 25 and 26 on an optical path extending from a light source 21 of the FT/IR to a detector 22, where the quartz block is inserted between the two cylindrical lenses. On the basis of the shape of a lateral face of the quartz block, refraction of measurement light to be generated is corrected by the two cylindrical lenses so as to analyze the components of the quartz without performing a grinding/polishing step for a cutting surface of the quartz block.
摘要翻译：要解决的问题：提供一种使用能够分析组分而不研磨或抛光生产后立即从石英柱切出的石英块表面的FT / IR的光谱测定装置。解决方案：一种红外分光装置包括两个柱面透镜 25和26在从FT / IR的光源21延伸到检测器22的光路上，其中石英块被插入在两个柱面透镜之间。基于石英块的侧面的形状，通过两个柱面透镜校正要产生的测量光的折射，以便分析石英的组分，而不进行用于切割表面的研磨/抛光步骤石英块。

5. 发明专利

JP2010281690A Microscopic total reflection measuring apparatus 有权
标题翻译： MICROSCOPIC总反射测量装置
公开(公告)号：JP2010281690A
公开(公告)日：2010-12-16
申请号：JP2009135258
申请日：2009-06-04
申请人： Jasco Corp , 日本分光株式会社
发明人： SOGA YOSHIAKI , SUGIYAMA CHIKAMI , SERA TAKAYUKI , KOSHOBU JUN
IPC分类号： G01N21/27 , G01N21/552
CPC分类号： G02B17/0808 , G01N21/3563 , G01N21/55 , G01N21/8806 , G02B21/0016
摘要： PROBLEM TO BE SOLVED: To provide a total reflection measuring apparatus capable of visually observing a specific minute part of a measurement object and efficiently obtaining optical data by total reflection measurement. SOLUTION: A Cassegrain mirror 12 having a Cassegrain primary mirror 16 and a Cassegrain secondary mirror 18 condenses incident light 20 on a measurement object 20 by making the incident light reflected by the secondary mirror 18 and the primary mirror 16 in this order, and obtains reflected light 32 by making the reflected light reflected by the primary mirror 16 and the secondary mirror 18 in this order. A total reflection prism 14 is disposed below the Cassegrain secondary mirror 18. The incident light contains visible light for visual observation and measurement light for the acquisition of analytical information. A visible light filter separates at least one of the incident light to the total reflection prism 14 and the reflected light from the total reflection prism into a total reflection area B and a normal reflection area A, and eliminates the visible light in the total reflection area B from the incident light or the reflected light. COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供一种能够目视观察测量对象的特定微小部分并通过全反射测量有效地获得光学数据的全反射测量装置。解决方案：具有卡塞格林主镜16和卡塞格伦二次镜18的卡塞格林镜12依次由副镜18和主镜16反射的入射光将入射光20冷凝在测量对象20上，并且通过使主反射镜16和副反射镜18反射的反射光依次得到反射光32。全反射棱镜14设置在卡塞格伦副镜18的下方。入射光包含用于目视观察的可见光和用于获取分析信息的测量光。可见光滤光器将入射光中的至少一个与全反射棱镜14和来自全反射棱镜的反射光分离成全反射区域B和正反射区域A，并且消除全反射区域中的可见光 B从入射光或反射光。版权所有（C）2011，JPO＆INPIT

6. 发明专利

JP2005249674A Reflection measuring instrument of high sensitivity 有权
标题翻译：反射测量仪器的高灵敏度
公开(公告)号：JP2005249674A
公开(公告)日：2005-09-15
申请号：JP2004062558
申请日：2004-03-05
申请人： Jasco Corp , 日本分光株式会社
发明人： SOGA YOSHIAKI , MINEO HIROSHI , AKAO KENICHI
IPC分类号： G01N21/35 , G01J3/30 , G01N21/3563
CPC分类号： G01J3/453 , G01N21/211 , G01N2021/215 , G01N2021/3595
摘要： PROBLEM TO BE SOLVED: To provide a reflection measuring instrument of high sensitivity capable of bringing high sensitivity of measurement by simple constitution. SOLUTION: This reflection measuring instrument 12 of high sensitivity provided on an optical path X 1 (X 4 ) between a light emitting means 14 and a detection means 16 of an analyzer 10, constituted to bring an incident angle θ of a measuring light 22 to a sample measuring face 20 into a range of 70° or more to less than 90° with respect to a direction orthogonal to the sample measuring face 20, and used when obtaining information about the sample measuring face 20, based on reflected light 24 from the sample measuring face 20, is provided with an incident angle side optical element 28 for bending an optical path of the measuring light 22 from the light emitting means 14 (X 1 -X 2 ) to bring the incident angle θ of the measuring light 22 to the sample measuring face 20 into a desired angle within the range of 70° or more to less than 90°, and for transmitting the measuring light 22 as a linear polarization light having a desired vibration direction to get incident into the sample measuring face 20. COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供一种具有高灵敏度的反射测量仪器，能够通过简单的结构实现高灵敏度的测量。解决方案：在发光装置14和检测装置16的光路X 1（X 4 ）之间提供高灵敏度的反射测量仪12 分析器10，其被构造成使得测量光22相对于样品测量面20的入射角θ相对于与样品测量面20正交的方向成70°以上且小于90°的范围，并使用当获取关于样品测量面20的信息时，基于来自样品测量面20的反射光24，设置有入射角侧光学元件28，用于弯曲来自发光装置14的测量光22的光路（X 1 -X 2 ），使得测量光22与样品测量面20的入射角θ成为70°以上的范围内的期望角度并且用于将测量光22作为具有期望的振动方向的线偏振光发射（C）2005，JPO＆NCIPI

7. 发明专利

JP2005127908A Mapping measurement apparatus 有权
标题翻译：映射测量装置
公开(公告)号：JP2005127908A
公开(公告)日：2005-05-19
申请号：JP2003364804
申请日：2003-10-24
申请人： Jasco Corp , 日本分光株式会社
发明人： SOGA YOSHIAKI , KOSHOBU JUN , TSUKADA HIROSHI
IPC分类号： G01N21/27 , G01N21/59
CPC分类号： G01N21/3563 , G01N21/55 , G01N21/59 , G01N2201/1053 , G01N2201/117
摘要： PROBLEM TO BE SOLVED: To provide a mapping measurement apparatus for implementing mapping measurement using a simple apparatus constitution. SOLUTION: The mapping measurement apparatus 10 is provided with a light irradiating means 12 for irradiating a sample with a light and a light detecting means 14 for detecting a light reflected from or transmitted through the sample via an aperture 16, limits the light detected by the light detecting means 14 to the light from a predetermined measured region by leading the light reflected from or transmitted through the sample to the aperture 16, and implements the mapping measurement within a predetermined range of the sample by changing and measuring the measured region. A detecting scan mirror 18 is provided on an optical path from the sample 28 to the aperture 16, and has a reflecting face with a movable orientation. Since the reflecting face of the scan mirror 18 is variable in an incident direction of the reflected light or the transmitted light, the measured region detected by the light detecting means 14 can be changed. COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供一种使用简单的装置结构实现映射测量的映射测量装置。解决方案：映射测量装置10设置有用于用光照射样品的光照射装置12和用于检测通过孔16反射或透过样品的光的光检测装置14，限制光由光检测装置14检测到来自预定测量区域的光，将通过样品反射或透射的光引导到孔16，并通过改变和测量测量区域在样品的预定范围内实现映射测量。检测扫描镜18设置在从样品28到孔16的光路上，并且具有可移动取向的反射面。由于扫描镜18的反射面在反射光或透射光的入射方向上是可变的，所以可以改变由光检测装置14检测到的测量区域。版权所有（C）2005，JPO＆NCIPI

8. 发明专利

JP2010223846A DETECTOR AND INFRARED MICROSCOPE 审中-公开
公开(公告)号：JP2010223846A
公开(公告)日：2010-10-07
申请号：JP2009073105
申请日：2009-03-25
申请人： JASCO CORP
发明人： MINEO HIROSHI , SERA TAKAYUKI , SOGA YOSHIAKI , KOSHOBU JUN
IPC分类号： G01N21/01 , G01N21/27
摘要： PROBLEM TO BE SOLVED: To provide a detector that is readily removable and can reduce the burden of optical adjustment, when exchanging the detector, and to provide an infrared microscope equipped with the detector. SOLUTION: The detector 18 includes a case 50 slidably disposed to the casing of the infrared microscope; a lighting opening 56 for guiding infrared light from the casing into the inside along the sliding direction; and a detection center section that is contained in the case 50 and detects the infrared light. The case 50 includes a male connector 58, that is connected with a casing side female connector and outputs detection data; a drawing screw 52 and a prop screw 54 for moving the case along the sliding direction; and a cap screw 64 for fixing the case to the casing. A line connecting a release position at which the coupling of the connectors is released and a coupling position, at which the connectors are coupled together is parallel to the sliding direction. The case 50 is fixed to the casing by the cap screw 64, in a state where the case has been slid by the drawing screw 52 to the coupling position from the release position. COPYRIGHT: (C)2011,JPO&INPIT

9. 发明专利

JP2005249481A Attachment for analyzer and analyzer using it 有权
标题翻译：使用分析仪和分析仪的附件
公开(公告)号：JP2005249481A
公开(公告)日：2005-09-15
申请号：JP2004057789
申请日：2004-03-02
申请人： Jasco Corp , 日本分光株式会社
发明人： KASHIWABARA HARUICHI , MATSUDA KIYOHARU , MINEO HIROSHI , AKAO KENICHI , SOGA YOSHIAKI
IPC分类号： G01N21/15
摘要： PROBLEM TO BE SOLVED: To provide an analyzer capable of performing gas purge of an attachment simply and excellently.
SOLUTION: This attachment 12 for the analyzer provided detachably on a body 14 of the analyzer 10 is equipped with an optical system constituent member 18 for performing optical analysis together with the body 14. The attachment 12 for the analyzer is characterized as follows: the optical system constituent member 18 is provided; an attachment base 20 to be brought into contact with the analyzer body 14 when setting the attachment for the analyzer on the analyzer body 14 is provided; the attachment base 20 is provided with a purging hole 24 positioned on the periphery on an optical path 22 in the attachment 12 for the analyzer; and the periphery of the optical system constituent member 18 provided on the attachment base 20 is gas-purged through the purging hole 24 of the attachment base 20.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供能够简单且优异地执行附件的气体吹扫的分析器。解决方案：可拆卸地安装在分析器10的主体14上的用于分析仪的附件12配备有用于与主体14一起进行光学分析的光学系统构成部件18.用于分析器的附件12的特征如下：设置光学系统构成构件18; 设置在分析器主体14上设置用于分析器的附件时与检测器主体14接触的安装基座20; 安装基座20设置有位于周边的清洗孔24，该清洗孔24位于用于分析器的附件12中的光路22上。并且设置在安装基座20上的光学系统构成部件18的周边通过安装基座20的排气孔24进行气体净化。版权所有（C）2005，JPO＆NCIPI

10. 发明专利

JP2000146695A METHOD OF ADJUSTING INTERFERENCE METER, AND APPARATUS THEREFOR 失效
公开(公告)号：JP2000146695A
公开(公告)日：2000-05-26
申请号：JP32825098
申请日：1998-11-18
申请人： JASCO CORP
发明人： SOGA YOSHIAKI , MINEO HIROSHI , SEO TSUGIO , TSUKADA HIROSHI , NAGOSHI TOSHIYUKI
IPC分类号： G01B9/02 , G01J1/06 , G01J3/45
摘要： PROBLEM TO BE SOLVED: To make adequately correctable the deviation of the optical axis of an interferometer by moving a beam splitter at right angles to its semi- transmissible plane through beam splitter position adjusting means, and moving a fixed mirror at right angles to its optical axis through fixed mirror position adjusting means. SOLUTION: Beam splitter position adjusting means 126 moves and adjusts a beam splitter 114 at right angles to its semi-transmissible plane 130. After the splitter 114 is replaced, an interferometer emits a light which is then reflected from a moving mirror 118 and superposed on the pass course of an interfering light emitted from the interferometer after replacing the splitter 114. Fixed mirror position adjusting means 128 moves and adjusts a fixed mirror 116 at right angles to its optical axis through fixed mirror position adjusting means. After the splitter 114 is replaced, the interferometer emits a light which is then reflected from the fixed mirror 116 and superposed on the pass course of an interfering light emitted from the interferometer after replacing the splitter 114. The fixed and moving mirrors 116, 118 use corner cubic mirrors.

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