专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明专利

JP2013199332A Passenger conveyor 有权
标题翻译：乘客输送机
公开(公告)号：JP2013199332A
公开(公告)日：2013-10-03
申请号：JP2012066941
申请日：2012-03-23
申请人： Hitachi Ltd , 株式会社日立製作所
发明人： TAKAGI YUJI , NAKAJO ISATO , OBARA TAKAO
IPC分类号： B66B23/22 , B66B31/00
摘要： PROBLEM TO BE SOLVED: To provide a passenger conveyor in which light emitting diodes are used as light sources of a balustrade illumination, and the maintenance operation or replacement operation of light sources can be readily performed even if the light sources are disposed in a deeper position than an illumination cover to suppress the uneven brightness of the illumination cover to eliminate a unlit portion in the illumination cover.SOLUTION: A passenger conveyor includes: a supporting structure disposed in a building; a plurality of endlessly-coupled step plates that circulate in the support structure; a balustrade vertically provided along the moving direction of the step plates; a moving handrail 4 moving along the circumferential edge of the balustrade; a light source 11 having a plurality of light-emitting element 13 in a longitudinal direction; and a retaining part that is provided in the balustrade and retains the light sources 11 by a plurality of elastic pawls 15a, 15b.
摘要翻译：要解决的问题：提供一种乘客输送机，其中使用发光二极管作为栏杆照明的光源，并且即使光源设置在更深的位置，也可以容易地进行光源的维护操作或更换操作以抑制照明罩的不均匀亮度，以消除照明罩中的未点亮部分。解决方案：乘客输送机包括：布置在建筑物中的支撑结构; 多个在所述支撑结构中循环的环形联接踏板; 沿台阶板的移动方向垂直设置的栏杆; 沿着栏杆周边移动的移动扶手4; 在长度方向具有多个发光元件13的光源11; 以及设置在栏杆中并由多个弹性爪15a，15b保持光源11的保持部。

2. 发明专利

JP2010080969A Method and apparatus for observation of sample 有权
标题翻译：用于观察样品的方法和装置
公开(公告)号：JP2010080969A
公开(公告)日：2010-04-08
申请号：JP2009265869
申请日：2009-11-24
申请人： Hitachi Ltd , 株式会社日立製作所
发明人： OBARA KENJI , TAKAGI YUJI , SHIMODA ATSUSHI , NAKAGAKI AKIRA , ISOGAI SHIZUSHI , OZAWA YASUHIKO , BABA HIDEHARU , WATANABE KENJI , SHISHIDO CHIE
IPC分类号： H01L21/66 , G01N21/956 , H01J37/22
摘要： PROBLEM TO BE SOLVED: To provide a method and apparatus for observation of a sample by which, upon detailed inspection of a defective part of the sample by means of magnification or the like, the amount of stage movement is reduced as little as possible to shorten image acquiring time thereby effectively observing defects. SOLUTION: The method for observation of the sample includes the steps of: acquiring a reference image not including a defect of the sample by imaging the sample on the basis of information of the defect of the sample detected by an inspection device; adjusting a position of the sample on the basis of the information of the defect of the sample detected by the inspection device so that the defect comes in sight of imaging; acquiring a defect image including the defect of the sample by imaging the sample whose position has been adjusted; detecting the defect in the defect image by comparing the reference image and the defect image; acquiring a magnified image of the defect by imaging a partial region including the detected defect in the sight of imaging; and displaying the magnified image of the defect on a screen. COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：提供一种用于观察样品的方法和装置，通过这种方法和装置，通过借助于放大率等对样品的缺陷部分进行详细检查后，台架移动量减少到少至可能缩短图像获取时间，从而有效地观察缺陷。解决方案：用于观察样本的方法包括以下步骤：基于由检查装置检测到的样本的缺陷的信息，通过对样本进行成像来获取不包括样本缺陷的参考图像; 基于由检查装置检测到的样本的缺陷的信息来调整样本的位置，使得缺陷进入成像; 通过对已经调整了位置的样本进行成像来获取包括样本缺陷的缺陷图像; 通过比较参考图像和缺陷图像来检测缺陷图像中的缺陷; 通过在成像的视觉中成像包括检测到的缺陷的部分区域来获取缺陷的放大图像; 并在屏幕上显示缺陷的放大图像。版权所有（C）2010，JPO＆INPIT

3. 发明专利

JP2009227352A Handrail of passenger conveyer 有权
标题翻译：客船输送机
公开(公告)号：JP2009227352A
公开(公告)日：2009-10-08
申请号：JP2008071824
申请日：2008-03-19
申请人： Hitachi Ltd , Hitachi Mito Engineering Co Ltd , 日立水戸エンジニアリング株式会社 , 株式会社日立製作所
发明人： OKAMURA NAOKO , ICHIGE TOSHIHIKO , OBARA TAKAO , TAKAGI YUJI , KASHIWAKURA SHINYA , NAKAMURA HIDEHIRO , CHIBA HISAO
IPC分类号： B66B23/22 , B66B29/04
摘要： PROBLEM TO BE SOLVED: To provide a handrail of a passenger conveyor capable of avoiding a risk that a passenger is caught between a skirt guard and a step and preventing clothing from being damaged.
SOLUTION: This handrail of the passenger conveyor is constituted of a skirt guard 2 erected on a side of endless traveling steps 1 and fixed to a deck base 4 at an upper end thereof, a handrail panel 6 erected above the skirt guard 2 in a position on the opposite side to the step 1, and an inside deck 8 provided between the handrail panel 6 and the skirt guard 2 and fixed to the deck base 4 on a skirt guard 2 side thereof. A folding end of the inside deck 8 on a skirt guard 2 side thereof is fixed to the deck base 8 so as to be arranged almost flush with the skirt guard 2 or therein, and an upper end fixation part of the skirt guard 2 and the fixation part of the deck base 4 are covered with a molding 10 provided to protrude toward the steps 1, and the molding 10 is fixed to the deck base 4 with a bolt 11 to be housed in the molding 10.
COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：提供一种能够避免乘客被夹在裙部护罩和台阶之间并防止衣物被损坏的乘客输送机的扶手。
解决方案：乘客输送机的该扶手由在直立于无端行驶台阶1的侧面的裙部护罩2构成，并在其上端固定在甲板基座4上，扶手板6竖立在裙部护罩2的上方在与步骤1相反的一侧的位置和设置在扶手板6和裙部护罩2之间的内侧甲板8，并在其裙部护罩2侧固定在甲板基座4上。内侧甲板8的裙部护罩2侧的折叠端部固定在甲板底座8上，与裙部护罩2或其内部大致平齐，裙部护罩2的上端固定部和甲板底座4的固定部分被设置成朝向台阶1突出的模制件10覆盖，并且模具10用一个螺栓11固定在甲板基座4上，以容纳在模制件10中。 C）2010，JPO＆INPIT

4. 发明专利

JP2004355300A Printing suppression print system 审中-公开
公开(公告)号：JP2004355300A
公开(公告)日：2004-12-16
申请号：JP2003151780
申请日：2003-05-29
申请人： Hitachi Ltd , 株式会社日立製作所
发明人： TAKAGI YUJI , IMAI TSUNEO
IPC分类号： B41J29/38 , G06F3/12
摘要： PROBLEM TO BE SOLVED: To provide a print system for printing only really necessary print data, when the print data are printed by a printer, by suppressing any wasteful print to be performed under the consideration of "for the time being" in the case of print data which need only to be taken notes of.
SOLUTION: When a printer issues a print start instruction, a printer driver instructs a "troublesome operation" to the printer just before the print. The printer is made to perform the "troublesome operation", and when it is confirmed that the operation has been performed, the print start instruction is executed by the printer driver.
COPYRIGHT: (C)2005,JPO&NCIPI

5. 发明专利

JP2004226328A Appearance inspection system, quality evaluation system using the same and quality evaluation information providing system 审中-公开
公开(公告)号：JP2004226328A
公开(公告)日：2004-08-12
申请号：JP2003016749
申请日：2003-01-24
申请人： Hitachi Ltd , 株式会社日立製作所
发明人： NAKAGAKI AKIRA , TAKAGI YUJI , HIROI TAKASHI , NAKAGAWA YASUO
IPC分类号： G01N21/956 , H01L21/66 , H05K3/00
摘要： PROBLEM TO BE SOLVED: To provide a technology for miniaturizing an inspector installed at a point of production and easily configuring a process condition of a detected result. SOLUTION: An appearance inspection system for obtaining an image of an inspection object and inspecting an appearance is provided with an image detector 100 for detecting the image of the inspection object and an information processor 200 for processing the image detected by the image detector 100 and determining the existence of abnormality emerging in the image of the inspection object. The image detector 100 and the information processor 200 can be connected through a network 300. The image detector 100 adds a data identifier to at least one of the detected image and its processed data and transmits it to the information processor. The information processor 200 identifies the received image based on the identifier included in the received data and determines the existence of the abnormality. COPYRIGHT: (C)2004,JPO&NCIPI

6. 发明专利

JP2004117229A Defect data analytic method, apparatus for the same and review system 有权
公开(公告)号：JP2004117229A
公开(公告)日：2004-04-15
申请号：JP2002282173
申请日：2002-09-27
申请人： Hitachi Electronics Eng Co Ltd , Hitachi High-Technologies Corp , Hitachi Ltd , 日立電子エンジニアリング株式会社 , 株式会社日立ハイテクノロジーズ , 株式会社日立製作所
发明人： SHIBUYA HISAE , TAKAGI YUJI
IPC分类号： G01B11/24 , G01B5/28 , G01N21/956 , G06T7/00 , H01L21/02
CPC分类号： G06T7/0004 , G06T2207/30148
摘要： PROBLEM TO BE SOLVED: To analyze a defect distribution state based on defect data detected by an inspection apparatus and easily identify a defect reason due to an apparatus or a process in a semiconductor wafer manufacturing process.
SOLUTION: A defect data analytic method analyzes the defect distribution state based on defect location coordinates detected by the inspection apparatus and categorizes the defect distribution state into one of distribution feature categories including repetitive defects, aggregate defects, circular distribution defects, radial distribution defects, linear distribution defects, ring or cluster distribution defects and random defects.
COPYRIGHT: (C)2004,JPO

7. 发明专利

JP2011063327A Passenger conveyor 有权
标题翻译：乘客输送机
公开(公告)号：JP2011063327A
公开(公告)日：2011-03-31
申请号：JP2009212626
申请日：2009-09-15
申请人： Hitachi Ltd , 株式会社日立製作所
发明人： KAMATA HIROTAKA , KASHIWAKURA SHINYA , OKAMURA NAOKO , TAKAGI YUJI
IPC分类号： B66B23/24
摘要： PROBLEM TO BE SOLVED: To provide a passenger conveyor easy in maintenance work, and having no risk of damaging handrail inner surface canvas even if a sliding member is abraded by friction with a handrail. SOLUTION: This passenger conveyor for solving the problem includes a step 1 traveling by being connected in an endless shape, a handrail 2 erected along the advancing direction at the side of the step 1, a guide body 6 and the sliding members 8a and 8b provided at the outer edge of the handrail 2, and a handrail 3 for guiding the handrail 2 outer edge by the guide body 6 and the sliding members 8a and 8b. In the passenger conveyor, the sliding members 8a and 8b are elastically deformed and installed in the guide body 6, and fixed to the guide body 6 by elastic forces of the sliding members 8a and 8b themselves. COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：为了使乘客输送机容易进行维护工作，并且即使滑动构件与扶手的摩擦磨损，也不会损坏扶手内表面帆布。解决方案：用于解决问题的该乘客输送机包括通过连接成环状行进的踏板1，沿台阶1侧的前进方向竖立的扶手2，引导体6和滑动部件8a 设置在扶栏2的外缘的扶手栏杆3，以及用于通过引导体6和滑动构件8a，8b引导扶手2的外缘的扶栏3。在乘客输送机中，滑动部件8a，8b弹性变形并安装在引导体6内，并通过滑动部件8a，8b本身的弹力而固定在引导体6上。版权所有（C）2011，JPO＆INPIT

8. 发明专利

JP2010076860A Handrail device of passenger conveyer 有权
标题翻译：客船输送机的船舶装置
公开(公告)号：JP2010076860A
公开(公告)日：2010-04-08
申请号：JP2008244603
申请日：2008-09-24
申请人： Hitachi Ltd , 株式会社日立製作所
发明人： OKAMURA NAOKO , ICHIGE TOSHIHIKO , OBARA TAKAO , TAKAGI YUJI , KASHIWAKURA SHINYA , NAKAMURA HIDEHIRO
IPC分类号： B66B23/22
摘要： PROBLEM TO BE SOLVED: To provide a handrail device of a passenger conveyor capable of easily fine-adjusting skirt guards horizontally.
SOLUTION: This handrail of a passenger conveyor includes the plurality of skirt guards which are opposed on both sides of the steps endlessly connected to each other and circulating in a frame and which are continuously arranged in the moving direction of the steps and a lower skirt base 39 for fixing the lower parts of the skirt guards to the frame side. A skirt base clip 38 is provided to the frame side, the horizontal side 39b of the lower skirt base 39 is held by the skirt base clip 38, and the lower part of the skirt guard is fixed to the frame side. Since the skirt guards can be fine-adjusted horizontally by such a simple method as to hit the lower parts of the skirt guards, the labor and time required for the operation can be reduced.
COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：提供能够水平地容易地微调护罩的乘客输送机的扶手装置。
解决方案：乘客输送机的该扶手包括多个裙部保护件，它们在彼此不连续地连接并在框架中循环并且在台阶的移动方向上连续布置的台阶的两侧相对，并且下裙部基座39，用于将裙部护罩的下部固定到框架侧。裙部底座38设置在框架侧，下裙部基部39的水平侧面39b由裙部基部夹子38保持，裙部护罩的下部固定在框架侧。由于可以通过简单的方法水平地对裙边保护装置进行微调，从而可以降低裙部护罩的下部，从而可以减少操作所需的劳动和时间。版权所有（C）2010，JPO＆INPIT

9. 发明专利

JP2006074065A Inspection device of sample 审中-公开
标题翻译：样品检验装置
公开(公告)号：JP2006074065A
公开(公告)日：2006-03-16
申请号：JP2005305912
申请日：2005-10-20
申请人： Hitachi Ltd , 株式会社日立製作所
发明人： OBARA KENJI , TAKAGI YUJI , HONDA TOSHIFUMI , NAKAGAKI AKIRA , KUROSAKI TOSHISHIGE , OZAWA YASUHIKO
IPC分类号： H01L21/66 , G01N23/223 , G01N23/225 , H01L21/02
摘要： PROBLEM TO BE SOLVED: To increase inspection efficiency in detailed inspection of defect which is performed on the basis of inspection information of defect inspection.
SOLUTION: For example, contaminations and defects which are detected with a defect inspection device 1 are inspected in detail with a detailed inspection device 3 using SEM and the like, and the cause of the occurrence and the like are clarified. Before performing the detailed inspection, contaminations and defects which are detected with the defect inspection device 1 are inspected with an attribute inspection device using optical microscope and the like, and each attribute is searched for. The defects and contaminations are classified into a type which needs the detailed inspection and a type which does not need the detailed inspection or a type which can not be performed the detailed inspection, based on the attributes. Only contaminations and defects which need the detailed inspection are inspected with the detailed inspection device 3.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：根据缺陷检查的检查信息进行的缺陷的详细检查，提高检查效率。解决方案：例如，使用SEM等详细检查装置3来详细检查用缺陷检查装置1检测的污染物和缺陷，并且说明发生的原因等。在进行详细检查之前，使用光学显微镜等用属性检查装置检查用缺陷检查装置1检测到的污染物和缺陷，并搜索每个属性。根据属性，将缺陷和污染分为需要详细检查的类型和不需要详细检查的类型或不能进行详细检查的类型。只需要详细检查的污染物和缺陷，请仔细检查。3.版权所有（C）2006，JPO＆NCIPI

10. 发明专利

JP2004077165A Defect classification method and its device 有权
公开(公告)号：JP2004077165A
公开(公告)日：2004-03-11
申请号：JP2002234302
申请日：2002-08-12
申请人： Hitachi Ltd , 株式会社日立製作所
发明人： OKUDA HIROTO , HONDA TOSHIFUMI , TAKAGI YUJI , MIYAMOTO ATSUSHI
IPC分类号： G01N21/88 , G01N21/956 , G06T1/00 , G06T7/00
CPC分类号： G06T7/001
摘要： PROBLEM TO BE SOLVED: To provide a method that automatically classifies images of defects occurring in surfaces of a semiconductor electronic circuit substrate or the like, does not need to collect much teaching data, can flexibly respond to different defect classifying requests depending on users, and has high reliability, and to provide its device.
SOLUTION: A user defines classification class constitution by arbitrarily combining a class provided by a system or a class defined by the user. Additionally, the user provides prior knowledge about a defect class as a constraint, and learning with the constraint is performed.
COPYRIGHT: (C)2004,JPO

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式