专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明专利

JPH0792215A AC ELECTRONIC LOAD EQUIPMENT 失效
公开(公告)号：JPH0792215A
公开(公告)日：1995-04-07
申请号：JP23935793
申请日：1993-09-27
申请人： HITACHI LTD , YAMABISHI ELECTRIC
发明人： OZAKI FUMITAKA , OMORI TETSUO , KANOU YOSHIHISA
IPC分类号： G01R31/00 , H02J9/00 , H02M7/12 , H02M7/219
摘要： PURPOSE:To surely execute an evaluation test by making a current of the same waveform as an actual current waveform flow through UPS(uninterruptive power supply unit) to be tested, regarding an AC electronic load equipment which is used for a tester of a power supply such as the UPS which outputs alternating current. CONSTITUTION:A current waveform stored in a storage circuit 27 is compared and amplified by error amplifying circuits 21 and 22 and given to transistors 6 and 7 of an output stage. On the occasion, a synchronizing circuit for synchronization with an input power supply is constructed with a transformer 12, comparators 17 and 18, etc. Since execution of a test is made possible by the same waveform as an actual load current has, accordingly, even a waveform having a complicated form can be prepared and tested easily and testing and evaluation of a power supply unit to be tested are made possible. Therefore, execution of complete evaluation is made possible and sharp reduction of troubles (faults) relating to waveforms in a field is made possible.

2. 发明专利

JPH0599968A SIMPLE TYPE ELECTRON LOADING DEVICE 失效
公开(公告)号：JPH0599968A
公开(公告)日：1993-04-23
申请号：JP28574391
申请日：1991-10-04
申请人： HITACHI LTD
发明人： OZAKI FUMITAKA , OMORI TETSUO , HORIUCHI YASUHIRO , KUBOTA SEISHI
IPC分类号： G01R31/00
摘要： PURPOSE:To obtain a simple type electron loading device capable of maintaining load control stably with high reliability by connecting an amplifier circuit for current control and the output point of a buffer amplifier circuit, giving priority to the buffer amplifier circuit at startup and operating the amplifier circuit for current control at a certain time later. CONSTITUTION:To an element for current control 20, a resistance for current detection is connected in series and the device is constituted to be a low current load by stabilizing the voltage on the resistance 19. And an amplifier circuit for current control 10 and a buffer amplifier circuit 6 are provided to make the output voltage of the circuit 6 is ramp state. The circuit 10 and the circuit 6 are connected in wired OR by diodes 11 and 13. Or by using an electron switch or mechanical relay contact, a ramp voltage generation circuit and the circuit 6 are operated only at startup. By this, a tested power source 30 is operated in constant resistance mode for a cetain time at startup and in constant current mode after the certain time. By this, structure parts are reduced and reliability is raised.

3. 发明专利

JP2000014133A DC POWER SUPPLY DEVICE 失效
公开(公告)号：JP2000014133A
公开(公告)日：2000-01-14
申请号：JP17248098
申请日：1998-06-19
申请人： HITACHI LTD
发明人： OZAKI FUMITAKA , OMORI TETSUO , MIYAUCHI MASASHI
IPC分类号： G06F1/28 , G05F1/10 , H02J1/00 , H02M3/28
摘要： PROBLEM TO BE SOLVED: To permit the use of a widely usable power source, and to reduce cost by additionally providing a mechanism for setting an operating current value of the overcurrent protecting circuit of a power unit again, using the actual value of a load current used as a reference. SOLUTION: An output voltage f of a current detector circuit 7 is inputted to a current detecting protecting circuit 8 and a current value storage circuit 15. This current value storage circuit 15 monitors the current value of the current detector circuit for a preset fixed time, and stores a maximum current value at this time, if a trigger signal k for a set command is generated. To keep the maximum value of this current until the next trigger direction arrives, a means of utilizing a back-up by the use of a battery only for this circuit, using nonvolatile memories, etc., for example are utilized. It is possible to set a overcurrent protecting value corresponding to a load current, by using this stored voltage value as a reference voltage 1 for the overcurrent protecting circuit 8. It is possible to make the output voltage of a reference voltage generating circuit a voltage proportional to a detected current through the operation of a reference voltage generating circuit 14.

4. 发明专利

JPH0934597A OVERCURRENT PROTECTIVE CIRCUIT 失效
公开(公告)号：JPH0934597A
公开(公告)日：1997-02-07
申请号：JP18383995
申请日：1995-07-20
申请人： HITACHI LTD
发明人： OZAKI FUMITAKA , ARAMICHI HIDEKI
IPC分类号： G06F1/30
摘要： PROBLEM TO BE SOLVED: To promptly interrupt a circuit when output voltage lowers due to the abnormality of outputted load, etc., and to protect the circuit and components by providing a means deciding the potential difference of input voltage and output voltage, a circuit interrupting an output circuit based on this signal and a means suppressing the operation of this circuit when a power source is turned on. SOLUTION: Between the terminals of input terminals 2 and 3, the winding side of a relay 18 and a switch element operating the relay are connected, and the contact side is inserted between the anode poles of a DC reactor and a diode 6. Between the input terminal 2, an output terminal 10 and a (-) terminal 3, a bridge connection is performed for resistances 25, 26, 27 and 28, and each connection point is connected with the input terminal of a comparison amplifier 24. The output terminal of the comparison amplifier 214 is connected with the base terminal of a transistor 21. In the same way, also the output terminal of a timer circuit 23 is connected. The connection of the input signal of the timer circuit 23 is performed by the opening/closing of an on/off switch 22. When a load resistance is lowered and the voltage of the input terminal 2 becomes higher than the voltage of the output terminal 10, the relay 18 operates.

5. 发明专利

JPH01100468A ELECTRONIC LOAD APPARATUS 失效
公开(公告)号：JPH01100468A
公开(公告)日：1989-04-18
申请号：JP25722687
申请日：1987-10-14
申请人： HITACHI LTD , HITACHI TECHNO ENG
发明人： OMORI TETSUO , KURAUCHI JUNJI , OZAKI FUMITAKA
IPC分类号： G01R31/00 , G05F1/10
摘要： PURPOSE:To prevent a hunting otherwise caused by an electronic load along with a reduction in man-hour of automatic test, by switching a current value fixed mode over to a resistance value fixed mode immediately before a drooping mode without selecting characteristic of a power source unit. CONSTITUTION:In the initial state of an electronic load 3, a changeover switch 9 is connected to a contact 1 to enter a current value fixed mode and a set value from a personal computer 6 is applied to an amplification circuit 14 through a D/A converter 19. On the other hand, a voltage across a resistance 18 for detecting current is inputted into a division circuit 12 by way of an amplification circuit 15 and an A/D converter 16 to hold a current flowing through the resistance 18 at an indicated value with a transistor 7. At this point, an output value of the division circuit 12 is stored sequentially into a register 20 and when an output of a subtraction circuit 21 is negative as indicating the gradient of a current-voltage characteristic of a power source 2 to be tested, an FF 24 is set to connect the changeover switch 9 to a contact 2. In this case, a voltage as electronic load 3 is applied to an amplification circuit 10 to operate a circuit system in the resistance value fixed mode.

6. 发明专利

JP2002006004A WAVEFORM ANALYZING DEVICE 失效
公开(公告)号：JP2002006004A
公开(公告)日：2002-01-09
申请号：JP2000192679
申请日：2000-06-22
申请人： HITACHI LTD
发明人： KUBOTA SEISHI , OZAKI FUMITAKA , NONAKA OSAMU , FUKASE HIDEKI
IPC分类号： G01R13/00 , G01R31/316
摘要： PROBLEM TO BE SOLVED: To verify stability of an analogue circuit and to secure quality in the mass-production process, wherein waveform measurement and failure analysis of the analogue circuit, being difficult so far, are automatically performed for quicker and easier testing of the analogue circuit. SOLUTION: A defective waveform data for a circuit is taken out of a defective waveform database where defective waveform data is accumulated, and materialized at a waveform generating part. The waveform of a circuit which is to be tested is measured at a waveform measuring part, and compared with a reference waveform at a comparing part. The compared waveform is judged whether it matches with a defective waveform at an error judging part. At disagreement, another defective waveform is taken out of the defective waveform database again for comparison. At agreement, a defect corresponding to the agreed waveform is outputted at a defect outputting part.

7. 发明专利

JPH07111390A POWER SUPPLY DEVICE 失效
公开(公告)号：JPH07111390A
公开(公告)日：1995-04-25
申请号：JP25550293
申请日：1993-10-13
申请人： HITACHI LTD , HITACHI COMPUTER ELECTRONIC
发明人： OMORI TETSUO , IMAI TSUTOMU , OTA AKIICHI , SHIGEMARU TAKESHI , USHIDA HITOSHI , OZAKI FUMITAKA
IPC分类号： G06F1/20 , H05K7/20
摘要： PURPOSE:To reduce the thickness and cost and to improve reliability of a power supply for electronic equipment. CONSTITUTION:The title device is constituted of a printed wiring board 1, a plurality of or one metal plate. a cooling fin 8. and power supply modules 5 and 6, the thick aluminum plate 7 and the cooling fin 8 are overlapped according to the amount of calorific value with the thin aluminum plate 7 as a base, and the printed wiring board 1 and the power supply modules 5 and 6 on the aluminum plate 7 are connected by a wire. Therefore, by combining the printed wiring board 1 and the aluminum plate 7, packaging to the same block as a logic part can be achieved and the configuration of a cooling material for heat dissipation (aluminum plate, cooling fin) can be changed according to the level of the calorific value of a power supply module, thus reducing the thickness, reducing cost, and improving reliability.

8. 发明专利

JPH0495786A TESTING APPARATUS FOR ELECTRONIC CIRCUIT 失效
公开(公告)号：JPH0495786A
公开(公告)日：1992-03-27
申请号：JP20807390
申请日：1990-08-08
申请人： HITACHI LTD
发明人： OZAKI FUMITAKA , OMORI TETSUO
IPC分类号： G01R31/30 , G01R31/00
摘要： PURPOSE:To judge the resistance against induction noises in the EMI environment by a method wherein a test lead is bonded to a node of an electronic circuit thereby to generate an electromagnetic wave from an electromagnetic wave generator, so that an optional voltage is induced to the test lead. CONSTITUTION:Particularly in the electromagnetic interference (EMI) environ ment, a testing apparatus 2 for testing a source package 1 as an electronic circuit is provided with an electromagnetic wave generator 4 which generates electromagnetic waves of an optional frequency or a shock wave noise pulse, and a metallic test lead 5 having an optionally variable or a fixed length. While the test lead 5 is put in touch with a node of the electronic circuit, and an electromagnetic wave is obtained from the electromagnetic wave generator 4, an optional voltage is induced to the test lead 5. Therefore, the driving allow ance of the electronic circuit to any induced voltage can be analyzed. The resistance to induction noises in the EMI environment can be detected in this manner.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式