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    • 2. 发明专利
    • Semiconductor device
    • 半导体器件
    • JP2000077608A
    • 2000-03-14
    • JP24300798
    • 1998-08-28
    • Hitachi LtdHitachi Ulsi Systems Co Ltd株式会社日立製作所株式会社日立超エル・エス・アイ・システムズ
    • NAKAMURA ATSUSHIKATAGIRI MITSUAKIYOKOMIZO KOICHINAKAUCHI ATSUHIKOTOTANI TATSUROSHIMIZU HIROYASHIRAKAWA SHINJIIWABUCHI MASARU
    • H01L23/52H01L21/3205H01L21/822H01L27/00H01L27/04
    • H01L2924/0002H01L2924/00
    • PROBLEM TO BE SOLVED: To provide a semiconductor device capable of realizing a sufficient EMI(electromagnetic wave interference) countermeasure by a method wherein a dropped voltage is stabilized and further a noise propagation to an external part is reduced in a circuit structure integral with an inner voltage drop circuit. SOLUTION: This semiconductor device is a microcomputer in which a power source voltage VCC supplied from an external part is dropped by an inner voltage drop circuit VCLG, and an inner circuit is driven by use of a dropped voltage VCL lower than the power source voltage VCC, and in order to stabilize the dropped voltage VCL, in an external part of an LSI package containing an LSI chip of the microcomputer, a capacitor C10 is attached externally between an external terminal of the dropping voltage VCL and an external terminal of a ground voltage VSS. Furthermore, in order to reduce a noise propagation to an external part, an inductance component comprising a high inductance element, wiring, a wiring lead, and the like is imparted to the power source voltage VCC.
    • 要解决的问题:提供一种半导体器件,其能够通过一种方法实现足够的EMI(电磁波干扰)对策,其中降低的电压稳定,并且进一步减小与外部部分的噪声传播的电路结构与内部 降压电路。 解决方案:该半导体器件是其中由外部部分提供的电源电压VCC由内部电压降电路VCLG掉下的微型计算机,并且通过使用低于电源电压VCC的下降电压VCL来驱动内部电路 并且为了稳定下降电压VCL,在包含微计算机的LSI芯片的LSI封装的外部部分中,电容器C10外部附接在滴电压VCL的外部端子与接地电压的外部端子之间 VSS。 此外,为了减少对外部的噪声传播,对电源电压VCC赋予包括高电感元件,布线,布线引线等的电感成分。
    • 3. 发明专利
    • SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
    • JPS6223131A
    • 1987-01-31
    • JP16194785
    • 1985-07-24
    • HITACHI MICROCUMPUTER ENGHITACHI LTD
    • NAKAUCHI ATSUHIKO
    • H01L27/092H01L21/3205H01L21/82H01L21/8238H01L23/52H01L27/118
    • PURPOSE:To lower power consumption by a method wherein an unnecessary current route is eliminated from between a power source voltage wiring and reference voltage wiring. CONSTITUTION:The gate electrode 9 of a unit cell 4A in some cases out of use is connected to a reference voltage Vss (or to a power source voltage Vcc) that is a fixed voltage source. A signal-outputting wiring 16, connecting semiconductor regions 10 and 11 that are to serve as drains for MISFET Qp and Qn, is intentionally disconnected for the establishment of electrical isolation between the semiconductor regions 10 and 11. With the isolation established, there will be no unnecessary current route between the reference voltage Vss wiring and source voltage Vcc wiring, even in the presence of a minor defect 1 in a P-N junction between the semiconductor region 11 and a well region 7A. That is, between the well region 7A supplied with the reference voltage Vss and signal outputting wiring 16 supplied with the power source voltage Vcc, there will be no electric current route that may otherwise be constituted of the semiconductor region 11, signal outputting wiring 16, and p-channel MISFET Qp. This reduces the power consumption of the unit cell 4A not in use.