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    • 2. 发明专利
    • Component-based application construction method
    • 基于组件的应用程序构建方法
    • JP2006099308A
    • 2006-04-13
    • JP2004283032
    • 2004-09-29
    • Hitachi Ltd株式会社日立製作所
    • NAKAMURA TOMOHIROFUJII KEIMEIEGUCHI TOSHIHIROKATO CHIAKIKUKI KAZUYATAKEUCHI MASARU
    • G06F9/44G06F11/36
    • G06F11/008G06F11/0727G06F11/0793
    • PROBLEM TO BE SOLVED: To efficiently construct an application realizing required reliability by evaluating the reliability when a component-based application is constructed.
      SOLUTION: A component-based application construction method is characterized in that a table for a history at execution time in which the history at the execution time such as the occurrence frequency of an error, a time required for restoration in error occurrence and processing capability in preventive maintenance implementation is recorded for each execution environment such as application ID, combined component ID and executed hardware ID, is added to each software component, the interval of preventive maintenance implementation recommended for each software component in system construction is calculated from the above information, reliability of each software component is compared with reliability required for the system to thereby perform the determination of propriety and the evaluation of adaptability, and reliability/processing capability as a whole system is calculated and compared with reliability/processing performance required as the whole system to thereby perform the determination of propriety and the evaluation of adaptability.
      COPYRIGHT: (C)2006,JPO&NCIPI
    • 要解决的问题:通过在构建基于组件的应用程序时评估可靠性来有效地构建实现所需可靠性的应用程序。 解决方案:一种基于组件的应用程序构造方法的特征在于,在执行时的历史表,其中执行时的历史,例如错误的发生频率,错误发生恢复所需的时间, 在每个软件组件中添加应用程序ID,组合组件ID和执行硬件ID等每个执行环境的预防性维护实施的处理能力,系统构建中每个软件组件推荐的预防性维护实施间隔由 将每个软件组件的可靠性与系统所需的可靠性进行比较,从而执行适当性的确定和适应性评估,并计算整个系统的可靠性/处理能力,并将其与所需的可靠性/处理性能进行比较 整个系统由此执行 确定适宜性和适应性评估。 版权所有(C)2006,JPO&NCIPI
    • 3. 发明专利
    • SIGN LANGUAGE TEACHING DEVICE, SIGN LANGUAGE TEACHING METHOD AND RECORDING MEDIUM RECORDED WITH THE METHOD
    • JP2000330467A
    • 2000-11-30
    • JP13675699
    • 1999-05-18
    • HITACHI LTD
    • SAGAWA HIROHIKOTAKEUCHI MASARU
    • G09B7/02G09B21/00
    • PROBLEM TO BE SOLVED: To enable executing the learning of sign language effectively by displaying an evaluation that in what degree the action of sign language performed by a user is near the action of correct signal language to the user and displaying moving pictures of the action of sign language performed by the user and the action of the correct sign language while comparing them. SOLUTION: A teaching control part 117 performs the inputting and outputting of information with respect to a sign-language word information storage part 108, a sign-language sentence information storage part 109, a sign-language composition information storage part 110 and a user information storage part 111 by controlling a sign-language action inputting part 101, a character inputting part 104, a screen operation inputting part 106, a sign language recognizing part 112, a retrieval part 113, a sign-language moving picture generating part 114 and an output part 115 based on an input and information of sign language from a user. Then, the control part 117 recognizes and evaluates sign-language words expressed in sign- language data inputted by the user from the data inputted by the user and displays these results in order to make the user oneself to be able to confirm the action of the sign language performed by the user. Moreover, the part 117 simultaneously displays the moving picture generated from the inputted sign-language data and the moving picture of the correct sign language generated from information being stored in this device.
    • 4. 发明专利
    • FINGER LANGUAGE MAILING DEVICE
    • JP2000214764A
    • 2000-08-04
    • JP1397399
    • 1999-01-22
    • HITACHI LTD
    • ANDOU HARUSAGAWA HIROHIKOTAKEUCHI MASARU
    • G09B5/06G09B5/02G09B21/00
    • PROBLEM TO BE SOLVED: To make it possible to receive a mail in a user's favorite data form by converting transmitted finger language heading and non-language information into a data display form corresponding to an information output means set by a receiving side or a transmitting side such as finger language animation and text display. SOLUTION: This mailing device extracts non-language information from a finger language animation data which are edited by a user to an animation automatically generated by inputting a finger language word heading. And, when a finger language word heading and non-language information are transmitted by using a data communication means, this device converts them into a data display form corresponding to an information output means set by the receiving side or transmitting side such as a finger language animation, a text display, or a speech output transmitted. In this device, a CUP 101 executes processing according to a started program process. An program to be executed and data to be accessed to are read on a main memory device 102 at need, and the data are processed by the CPU 101.
    • 7. 发明专利
    • SEMICONDUCTOR MANUFACTURING PROCESS CONTROLLING SYSTEM
    • JPS60247937A
    • 1985-12-07
    • JP10255684
    • 1984-05-23
    • HITACHI LTD
    • TAKEUCHI MASARUKADOTA KAZUYATANUMA MASAYAOONARI MIKIHIKO
    • H01L21/50
    • PURPOSE:To contrive accomplishment of a highly precise control over the semiconductor manufacturing process as well as to expedite said control by a method wherein a measuring process is provided between each treatment process, and the condition of each treatment process is established based on the measured data of the adjoining measuring process. CONSTITUTION:A measuring process is provided between each process constituting the manufacturing process of a semiconductor device. Each process 1 is controlled by a controlling part 3 based on the data obtained by the measuring process 2 located adjoining to the process 1. To be more precise, a controlling signal Si+1 is formed by the controlling part 3 based on the measured data Ti sent from the measuring process 2 and the desined data M given from outside, and the controlling signal is inputted to the treatment process 1. A treatment is performed based on said controlling signal by the treatment process 1. As a result, the control of a treatment process is automated, the control is performed in a highly precise manner, the speed of control is improved, and also the stability of control can be improved.
    • 9. 发明专利
    • Process control system
    • 过程控制系统
    • JPS58206161A
    • 1983-12-01
    • JP8795182
    • 1982-05-26
    • Hitachi Ltd
    • TAKEUCHI YOUICHIOONARI MIKIHIKOMATSUMOTO KUNIAKIMATSUBA IKUOTAKEUCHI MASARUFUNABASHI SEIJIYU
    • H01L21/66H01L29/78
    • H01L29/78
    • PURPOSE:To reduce the quantity of variation of the electric characteristic to be generated at the manufacturing process of a semiconductor element by a method wherein the channel doping quantity under a gate is adjusted conforming to impurity density of a substrate and the deviation value of the shape of the gate from the aiming value. CONSTITUTION:At the manufacturing process of the semiconductor element having gate structure of an MOSFET, etc., the sheet resistance value is measured at first to be inputted to a CPU, and the impurity density of p type Si substrate 101 is calculated. Then after an oxide film to isolate between the FET's is formed, channel width (w) is measured. Then an oxide film is formed on the whole surface of the substrate, and film thickness (d) of the gate oxide film 102 is measured. Then channel doping is performed according to ion implantation to form a p type surface inversion layer in the whole region of the surface of the substrate. At this time, the channel doping quantity is calculated according to operation from impurity density of the substrate and the measured values (w), (d). After then, diffusion layers 103, 104 and electrodes 106, 107, 108 are formed.
    • 目的:为了减少在半导体元件的制造过程中产生的电特性的变化量,其中栅极下的沟道掺杂量被调整为符合衬底的杂质浓度和形状的偏差值 的门从目标价值。 构成:在具有MOSFET等的栅极结构的半导体元件的制造工序中,首先测量薄层电阻值以输入CPU,并计算p型Si衬底101的杂质浓度。 然后在形成FET之后隔离氧化膜,测量通道宽度(w)。 然后在基板的整个表面上形成氧化物膜,并且测量栅极氧化膜102的膜厚度(d)。 然后根据离子注入进行沟道掺杂,以在衬底表面的整个区域中形成p型表面反转层。 此时,根据基板的杂质浓度和测定值(w),(d)的运算计算沟道掺杂量。 之后,形成扩散层103,104和电极106,107,108。