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    • 9. 发明专利
    • METHOD AND DEVICE FOR ROTATIONAL TREATMENT
    • JPH10242110A
    • 1998-09-11
    • JP4823997
    • 1997-03-03
    • HITACHI LTD
    • HIROKAWA JUN
    • H01L21/306H01L21/027H01L21/304
    • PROBLEM TO BE SOLVED: To obtain even results from rotational treatment in the rotationally treating process of a platy object by eliminating the uneven treatment of the central part of a rotating shaft. SOLUTION: A rotationally treating device performs cleaning and rotational drying treatment by housing a chuck 11 supported by a motor 12 for rotating substrata through a rotating shaft 11a in a port 15 and supplying a cleaning solution 14 from a nozzle 13 which the chock 11 supporting a semiconductor wafer 10 is rotated together with the wafer 10. Since a tilting mechanism composed of the tilting shaft 17 and a tilting motor 18 which tilt the whole bodies of the pot 15 and the rotating shaft 11a of the chuck 11 at a desired angle from the vertical direction is provided on the side face of the pot 15, the occurrence of uneven cleaning and uneven drying (residual solution drops) of the wafer 10 which occurs near the center of rotation of the wafer 10 is avoided by performing desired rotational treatment while the chuck 11 is inclined at a desired angle and even cleaned and dried results can be obtained in a short time.
    • 10. 发明专利
    • SEMICONDUCTOR DEVICE AND ITS MANUFACTURE
    • JPH097975A
    • 1997-01-10
    • JP15576995
    • 1995-06-22
    • HITACHI LTD
    • HIROKAWA JUNYOSHIDA IKUO
    • H01L21/301H01L21/02
    • PURPOSE: To obtain a semiconductor chip formed into an arbitrary planar shape by forming a resist material on a device formation surface of a semiconductor wafer in an arbitrary pattern, and etching the semiconductor wafer until it is cut down over the entire thickness following a desired pattern. CONSTITUTION: A plurality of desired devices are first formed on a wafer 13 into a circular shape for example. A resist 14 is applied on a device formation surface 13A and is dipped in an etching solution for etching. A circular shape pattern resist 14 is formed on the resulting device formation surface 13A of the wafer 13, and an etching resistant tape 15 is bonded to a surface 13B opposite to the device formation surface 13A. Then, the wafer 13 is dipped in a wet etching solution for etching, and a separation groove 16 is formed such that the wafer 13 is cut down over the entire thickness following the circular pattern of the resist 14, and hence the wafer 13 is divided into a plurality of semiconductor chips 1. In succession, the etching resistant tape 15 is mechanically exfoliated, and the resist 14 is removed with a solvent.