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1. 发明专利

JPH06174779A INSULATION DIAGNOSIS METHOD FOR ELECTRIC APPLIANCE 失效
公开(公告)号：JPH06174779A
公开(公告)日：1994-06-24
申请号：JP32677592
申请日：1992-12-07
申请人： TOSHIBA CORP , CENTRAL RES INST ELECT
发明人： KUMAZAWA RYOJI , MITSUI HISAYASU , KUROKI TOSHITAKA , IKEDA YASUYUKI , ISHIDA MASAYOSHI , NAOHARA NOBUYUKI
IPC分类号： G01R31/12 , G21C17/003
摘要： PURPOSE:To allow the effective diagnosis of the remaining service life of insulator in an electric equipment operated at a specified high temperature or above by making a decision whether increasing rate of AC current per unit time has exceeded a predetermined level or whether a time has elapsed for the AC current to increase by a specific factor from initial level. CONSTITUTION:Conductor 1 of a bar coil is produced by applying nickel plating to electrolytic copper and lining with an insulator 2, i.e., an alumina cloth, applying alumina silicate to the end part of a ground electrode 3 for measuring dielectric characteristics to form a stress cone, and then hardening under same conditions as primary hardening. Furthermore, alumina cloth is wound around the bar coil over the entire length thereof while applying alkyl silicate thereto thus forming an electrode protective layer 5. AC current flowing through the inorganic coil insulator in an electric appliance, employing such bar coil and operating under high temperature environment of 300 deg.C or above, is then monitored on-line at a predetermined time interval in order to detect increasing tendency of AC current thus preventing dielectric breakdown.

2. 发明专利

JPH06310076A TRANSMISSION TYPE SCANNING ELECTRON BEAM DEVICE AND SAMPLE DENSITY MEASURING METHOD 失效
公开(公告)号：JPH06310076A
公开(公告)日：1994-11-04
申请号：JP10215393
申请日：1993-04-28
申请人： HITACHI LTD , CENTRAL RES INST ELECT
发明人： NAKAIZUMI YASUSHI , ISHIDA MASAYOSHI , OKAMOTO TATSUKI , OKURA AKIMITSU , NAKAGAWA MINE
IPC分类号： H01J37/05 , H01J37/244 , H01J37/26 , H01J37/28
摘要： PURPOSE:To measure density of a substance in a scanning area by arranging a means to detect incident electron intensity to a sample and a means to detect transmitted electron intensity after passing through the sample, and carrying out computation on a ratio of the incident electron intensity to the transmitted electron intensity. CONSTITUTION:An electron beam 4 emitted from a field emission type electron gun 3 is converged to a narrow electron probe 10 on a surface of a sample 9 by capacitor lenses 5 and 6 and an objective lens 7. Here, in order to make a part of the probe 10 detected by an objective lens diaphragm 26 in proportion to an incident electron current, an absorption electron signal detected by the diaphragm 26 is amplified, and is converted into a signal having incident electron intensity Iin by multiplying a proportional constant. On the other hand, transmitted electron intensity Iout is regarded as the same with a transmitted electron signal detected by a transmitted electron detector 19, and is introduced to a computing circuit 28, and computation on Iin/Iout is carried out, and it is displayed on a CRT22 by a changeover switch 29. Thereby, density of a substance in a scanning area can be found from the relationship between transmissivity of the electron beam of the sample, a sample thickness (t) in the scanning area and density rho of a substance.

3. 发明专利

JPH0456009A IMPROVING METHOD FOR SEMICONDUCTIVE LAYER INTERFACE OF POLYOLEFIN INSULATED CABLE 失效
公开(公告)号：JPH0456009A
公开(公告)日：1992-02-24
申请号：JP16537390
申请日：1990-06-22
申请人： CENTRAL RES INST ELECT
发明人： OKAMOTO TATSUKI , HOZUMI TADAHIRO , ISHIDA MASAYOSHI
IPC分类号： H01B9/02
摘要： PURPOSE:To enhance the dielectric breakdown strength by adding non-ion activating agent in a certain molecular weight to a semiconductive layer material, and thereby performing removal or reduction. CONSTITUTION:To a semiconductive layer material an anion activating agent is added having a molecular weight of 300-20000 such as sorbitane aliphatic acid ester, glycelin aliphatic acid ester, decagrlne aliphatic acid ester, polyglyceline aliphatic acid ester, polypropylene glycol, or pentelystor aliphatic acid ester. This additive is moved dispersively to the connection surface with an insulative substance layer 2, i.e. the interface of the semiconductive layer 3, through utilization of a hot cross-linking temp. in the process of cable manufacture. With heating, the dispersiveness of carbon particles in the semiconductive layer in the neighborhood of the interface of the layer 3, which controls in turn the crystalline structure in the insulative substance layer 2 in the neighborhood of the semiconductive layer interface, and electric irregularity of around one mum on the layer 3 interface is reduced.

4. 发明专利

JPH03110496A FUEL ASSEMBLY AND CORE OF NUCLEAR REACTOR 失效
公开(公告)号：JPH03110496A
公开(公告)日：1991-05-10
申请号：JP24951989
申请日：1989-09-26
申请人： HITACHI LTD , CENTRAL RES INST ELECT
发明人： KAWASHIMA KATSUYUKI , BANDO MASARU , ISHIDA MASAYOSHI , YOKOO TAKESHI
IPC分类号： G21C3/328
摘要： PURPOSE:To enhance the reactivity value of plutonium by providing a 1st fuel region alternately disposed with low-enrichment degree fuel regions and the high-enrichment degree fuel regions near the center in the axial direction of fuel rods. CONSTITUTION:The atom density of a fertile material is high and the average energy of neutrons is low as compared to the high-enrichment degree fuel 5a in the low-enrichment degree region 5b and, therefore, the fission reaction of the fertile material decreases and on the contrary, the neutron capturing reactivity increases. As a result, the plutonium is formed in the low-enrichment degree region 5b. The number of the neutron generated in the high-enrichment degree fuel 5a, 5c is increased by the fission chain reaction and these neutrons flow into the low-enrichment degree fuel 5b. The neutron flux level of the low- enrichment degree fuel 5b, therefore, increases and the formation reaction of the plutonium is accelerated. Namely, the amt. of the plutonium in the lo- enrichment degree fuel 5b is increased.

5. 发明专利

JPH0765770A ELECTRON MICROSCOPE WITH CURRENT-CARRYING FUNCTION WHILE COOLING, AND SUPERCONDUCTIVE CURRENT DISTRIBUTION MEASURING METHOD BY USING THE ELECTRON MICROSCOPE 失效
公开(公告)号：JPH0765770A
公开(公告)日：1995-03-10
申请号：JP22966293
申请日：1993-08-24
申请人： CENTRAL RES INST ELECT
发明人： ICHINOSE ATARU , ISHIDA MASAYOSHI
IPC分类号： H01J37/20
摘要： PURPOSE:To observe the cooling and the current-carrying condition in a minute visual by making it possible to carry the current to a sample while cooling the sample. CONSTITUTION:A coolant such as a liquid helium and a liquid nitrogen is fed to a container, from the coolant feeding port 72 of a sample holder 7 on which a sample 8 is set, and delivered to a pipe 73 for cooling. The pipe 73 cools the sample 8 by the heat conduction of a sample loader 74 provided at the front end of the pipe 73. A current-carrying wire 75 is connected to a current-carrying device, and the carried current and the fed voltage can be set as desired. When a sample 8 of a superconductor is set on the sample loader 74, and the power is fed to the sample while cooling the sample at the temperature lower than the superconductive transfer temperature by using a cooling device 15, a temperature controller 17, and a power feeding device 16, connected to a holder 7, a superconductive current or a normal conductive current flows to the sample 8, so as to generate a magnetic field. By observing the bending of the electron beam by this magnetic field, the current distributing condition of the superconductive material and its variation can be measured.

6. 发明专利

JPH074925A METHOD AND APPARATUS FOR ANALYSIS OF POLYMER SPHERULITE 失效
公开(公告)号：JPH074925A
公开(公告)日：1995-01-10
申请号：JP3578492
申请日：1992-01-28
申请人： CENTRAL RES INST ELECT
发明人： ISHIDA MASAYOSHI , IMASHIRO NAOHISA
IPC分类号： G01B11/08 , G01N21/27
摘要： PURPOSE:To measure, in a short time and with high accuracy, a spherlity size, a number densite and the like which have a large influence on the material characteristic of a polymer by a method wherein the absorbance spectrum or the scattering-intensity spectrun of polymer spherulity as an object to be measured is found and it is multiplied by the power of a wavelength so as to be standardized. CONSTITUTION:The absorbance spectrum or the scattering-intensity spectrum of a polymer spherulity as an object to be measured is found, it is muliplied by the power of a wavelength (wavelength , where (b) represents a real number of 2 to 4) so as to be standardized, and a spherulity size is found on the basis of the peak wavelength of the spectrum. Then, by using the polymer spherulity radius (a) which has been found, the wavelength of the standardized spectrum is divided by 2pia, the absorbance spectrum or a scattered-light spectrum is standardized with reference to the wavelength, and the distribution of the spherulite is found on the basis of the degree of the spread of the standardized spectrum. In this manner, a measuring operation becones extremely simple, no special skill is required, and the measuring operation of high accuracy can be performed in several minutes.

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