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    • 2. 发明专利
    • Method for manufacturing magnetoresistance effect element
    • 制造磁阻效应元件的方法
    • JP2010045398A
    • 2010-02-25
    • JP2009261796
    • 2009-11-17
    • Canon Anelva Corpキヤノンアネルバ株式会社
    • MAEHARA DAIKIOSADA TOMOAKIDOI MIHOKOTSUNEKAWA KOJIWATANABE NAOKI
    • H01L43/12C23F1/00C23F1/12G11B5/39H01L21/3065H01L21/8246H01L27/105H01L43/08
    • PROBLEM TO BE SOLVED: To provide a method for manufacturing a magnetoresistance effect element capable of preventing the reduction of the MR ratio of the element and keeping high performance as the magnetoresistance effect element even if an oxidized layer is formed on the top surface layer of a protective layer by an oxidation process inevitable in the manufacturing process by doubly stacking a mask material for fine processing without particular alteration to a manufacturing process for fine processing by dry etching in a vacuum.
      SOLUTION: The method for dry etching a magnetoresistance effect element is composed of a magnetic multilayer film including at least two magnetic layers, wherein a second mask formed of one of Ru, Rh, Os, Nb, Ir, and Re is doubly stacked on a lower layer of a first mask formed of Ta.
      COPYRIGHT: (C)2010,JPO&INPIT
    • 要解决的问题:提供一种制造磁阻效应元件的方法,即使在顶表面上形成氧化层,其能够防止元件的MR比降低并保持高性能,作为磁阻效应元件 通过在制造过程中不可避免地通过双重堆叠掩模材料进行精细加工而不会特别改变用于在真空中的干蚀刻的精细加工的制造工艺的氧化工艺的保护层层。 解决方案:用于干蚀刻磁阻效应元件的方法由包括至少两个磁性层的磁性多层膜组成,其中由Ru,Rh,Os,Nb,Ir和Re中的一种形成的第二掩模是双重的 堆叠在由Ta形成的第一掩模的下层上。 版权所有(C)2010,JPO&INPIT
    • 3. 发明专利
    • Method for manufacturing magnetoresistance element, and apparatus for manufacturing the magnetoresistance element
    • 制造磁阻元件的方法和制造磁阻元件的装置
    • JP2008172266A
    • 2008-07-24
    • JP2008042175
    • 2008-02-22
    • Canon Anelva Corpキヤノンアネルバ株式会社
    • NAGAMINE YOSHINORITSUNEKAWA KOJIDAVID JAYAPURAWIRAMAEHARA DAIKI
    • H01L43/12G11B5/39H01L21/8246H01L27/105H01L43/08H01L43/10
    • PROBLEM TO BE SOLVED: To provide a method for manufacturing a magnetoresistance element having a high MR ratio, while being low in RA, and to provide an apparatus for manufacturing the magnetoresistance element.
      SOLUTION: The magnetoresistance element which has an MgO layer between a first ferromagnetic layer and a second ferromagnetic layer has a step of forming the first ferromagnetic layer, a step of forming the MgO layer, and a step of forming the second ferromagnetic layer. The step of forming the MgO layer is performed under the condition that a substrate be at a floating voltage potential. Moreover, the step of forming the MgO layer may be performed, by placing the substrate to a substrate placing stage in which a part close to the substrate is an insulator. Moreover, the step of forming the MgO layer may be performed under the condition that the substrate be electrically insulated from a substrate holding part which holds the substrate.
      COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:提供一种制造具有高MR比的磁阻元件的方法,同时RA低,并提供用于制造磁阻元件的装置。 解决方案:在第一铁磁层和第二铁磁层之间具有MgO层的磁阻元件具有形成第一铁磁层的步骤,形成MgO层的步骤,以及形成第二铁磁层的步骤 。 在基板处于浮置电压电位的条件下进行形成MgO层的工序。 此外,可以通过将基板放置到其中靠近基板的部分是绝缘体的基板放置台来进行形成MgO层的步骤。 此外,可以在基板与保持基板的基板保持部电绝缘的条件下进行形成MgO层的工序。 版权所有(C)2008,JPO&INPIT
    • 5. 发明专利
    • Manufacturing process of tunnel magnetoresistive element
    • 隧道磁阻元件的制造工艺
    • JP2014003313A
    • 2014-01-09
    • JP2013163153
    • 2013-08-06
    • Canon Anelva Corpキヤノンアネルバ株式会社
    • TSUNEKAWA KOJINAGAMINE YOSHINORINISHIMURA KAZUMASAERNULT FRANCK
    • H01L43/12G11B5/39H01L21/8246H01L27/105H01L43/08H01L43/10
    • PROBLEM TO BE SOLVED: To provide a manufacturing process of a tunnel magnetoresistive element and a manufacturing apparatus which have comparatively small number of steps and excellent characteristics in RA uniformity, and have a high MR ratio acquired in low RA.SOLUTION: An embodiment of the present invention is a manufacturing process of a tunnel magnetoresistive element which has a first ferromagnetic layer, a tunnel barrier layer, and a second ferromagnetic layer, and the process manufacturing the tunnel barrier layer is a process in which a metal target is sputtered by applying an electric power to the metal target and forming plasma, and a first metal layer is film-formed on the first ferromagnetic layer. The manufacturing process has: a process of forming the first metal layer with oxygen doped by that oxygen gas is not introduced in only either one stage and the oxygen gas is introduced in only the other stage among an initial stage and a later stage of film forming; a process in which a metal oxide layer is formed by oxidation-treating the first metal layer with oxygen doped; and a process in which a second metal layer is film-formed on the metal oxide layer.
    • 要解决的问题:提供一种隧道磁阻元件的制造工艺和具有相对较少数量的步骤和优异的RA均匀性特性的制造装置,并且在低RA下获得高MR比。解决方案: 本发明是具有第一铁磁层,隧道势垒层和第二铁磁层的隧道磁阻元件的制造工艺,制造隧道势垒层的工艺是通过施加金属靶溅射金属靶的过程 对金属靶的电力并形成等离子体,第一金属层被膜形成在第一铁磁层上。 该制造方法具有:仅在一个阶段中仅引入氧气掺杂的氧的第一金属层的形成过程,并且在初始阶段和后期的成膜阶段仅将氧气引入到另一个阶段 ; 通过用氧掺杂氧化处理第一金属层来形成金属氧化物层的工艺; 以及在金属氧化物层上成膜形成第二金属层的工序。