会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 4. 发明专利
    • Proximity exposure apparatus
    • JP5261665B2
    • 2013-08-14
    • JP2008138030
    • 2008-05-27
    • 株式会社ブイ・テクノロジー
    • 大助 石井
    • G03F9/02H01L21/027
    • PROBLEM TO BE SOLVED: To provide a proximity exposure apparatus capable of inexpensively aligning a substrate and an exposure mask with high accuracy. SOLUTION: The proximity exposure apparatus is equipped with a conveying means 4 that mounts and conveys a work W as an exposure object, an exposure mask 31 opposing and close to the work W, and an imaging means 5 that simultaneously images an alignment mark WB on the work W and an alignment mark 31d on the exposure mask 31, and exposes the work W while aligning the work W to the exposure mask 31 based on the respective images of the alignment mark WB and the alignment mark 31d. The apparatus is also equipped with an optical path length correcting means 52 having an optical member 52a that discontinuously varies the optical path length (L1 or L2) between the imaging means 5 and the work W or the exposure mask 31, the correcting means placed between the imaging means 5 and the work W or the exposure mask 31. COPYRIGHT: (C)2010,JPO&INPIT