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1. 发明专利

JP3519203B2 X-ray apparatus 失效
公开(公告)号：JP3519203B2
公开(公告)日：2004-04-12
申请号：JP5675296
申请日：1996-02-20
申请人：理学電機株式会社
发明人：等大神田 , 吉男岩崎 , 志朗梅垣
IPC分类号： G01N23/20 , G01N23/201 , G01N23/207 , G01N31/00 , G21K1/06

2. 发明专利

JP2004093492A X-ray small angle scattering optical system 有权
公开(公告)号：JP2004093492A
公开(公告)日：2004-03-25
申请号：JP2002257825
申请日：2002-09-03
申请人： Rigaku Corp , 理学電機株式会社
发明人： FUJINAWA TAKESHI , OKANDA HITOSHI
IPC分类号： G01N23/201
CPC分类号： G01N23/201
摘要： PROBLEM TO BE SOLVED: To easily switch to the other X-ray incident optical system for analyzing X rays by using a paraboloid multilayer film mirror for an X-ray small angle scattering optical system. SOLUTION: The paraboloid multilayer film mirror 24, an optical path selection slit apparatus 26 and a small angle selection slit apparatus 30 are disposed between an X-ray source 22 and a sample side slit 23. An X-ray beam 60 passes through a first aperture 34 of an aperture slit plate 32 and is interrupted by the optical path selection slit apparatus 26. An X-ray beam 62 passes through a second aperture 36, is reflected by a reflection face of the multilayer film mirror 24 and converted into a collimated beam 40, and passes through an aperture 42 of the optical path selection slit apparatus 26. When the collimated beam passes through a thin bundle slit 48 of the small angle selection slit apparatus 28, a beam width is limited. The collimated beam passes through the sample side slit 23 which functions as a scattered beam prevention slit, and is converted into an X-ray beam 64 for small angle scattering measurement. The X-ray beam 64 enters a sample 66. COPYRIGHT: (C)2004,JPO

3. 发明专利

JP3504985B2 High-voltage bushing of the X-ray tube 失效
公开(公告)号：JP3504985B2
公开(公告)日：2004-03-08
申请号：JP25983194
申请日：1994-09-30
申请人：理学電機株式会社
发明人：勝美塚本
IPC分类号： H05G1/08 , H01B17/36

4. 发明专利

JP2004020476A Ion exchange membrane evaluating method, organic material evaluating method, and x-ray measurement device 有权
公开(公告)号：JP2004020476A
公开(公告)日：2004-01-22
申请号：JP2002178360
申请日：2002-06-19
申请人： Rigaku Corp , 理学電機株式会社
发明人： HOSHINO KAZUTO , IWASAKI YOSHIO
IPC分类号： G01N23/201
CPC分类号： G01N23/201
摘要： PROBLEM TO BE SOLVED: To enable to accurately evaluate the molecular structure of an organic high polymer material, e.g., an ion exchange membrane, by using a widely and generally used device.
SOLUTION: In an evaluation method for evaluating the performance of an ion exchange membrane 29, by using an X-ray measurement device capable of detecting scattered X-rays in a small angle area centered at the optical axis of an injection X-ray. a small angle scatter diagram G is derived. On the basis of the angle position and the intensity at the peak P on the small angle scatter diagram G, the molecular structure of the ion exchange membrane, accordingly the ion exchange ability, is evaluated.
COPYRIGHT: (C)2004,JPO

5. 发明专利

JP2004020397A System for evaluating crystal 有权
公开(公告)号：JP2004020397A
公开(公告)日：2004-01-22
申请号：JP2002176435
申请日：2002-06-17
申请人： Inst Of Physical & Chemical Res , Rigaku Corp , 理化学研究所 , 理学電機株式会社
发明人： YAMANO AKITO , MIYANO MASASHI , HAMADA KENSAKU
IPC分类号： G01N23/20
CPC分类号： G01N23/20
摘要： PROBLEM TO BE SOLVED: To rapidly carry out X-ray diffraction measurements for many crystal samples, and realize analyzsis and evaluation of a crystal structure with high reliability. SOLUTION: The system is provided with a sample stage 10 where a sample holder 40, which transmits X-rays and contains a crystal sample, can be arranged horizontally, an X-ray emitting unit 20 by which the X-rays are projected from above or below onto the crystal sample in the sample holder 40 arranged on the sample stage 10, and an X-ray detector 30 which detects diffracted X-rays from the crystal sample. Both the X-ray emitting unit 20 and the X-ray detector 30 are fixed to a rotatable arm 50, and the rotatable arm 50 is set so that it can be rotated about an approximately horizontal axis at an arbitrary angle by a rotation drive mechanism 51. COPYRIGHT: (C)2004,JPO

6. 发明专利

JP3474101B2 Pole measuring method 失效
公开(公告)号：JP3474101B2
公开(公告)日：2003-12-08
申请号：JP11570998
申请日：1998-04-24
申请人：理学電機株式会社
发明人：等大神田 , 義行山田 , 吉男岩崎 , 剛藤縄 , 和彦表
IPC分类号： G01N23/207

7. 发明专利

JP2003276594A Intra-pipe traveling device and pipe inspecting device 审中-公开
标题翻译：管道内行驶装置和管道检查装置
公开(公告)号：JP2003276594A
公开(公告)日：2003-10-02
申请号：JP2002078216
申请日：2002-03-20
申请人： Rigaku Corp , 理学電機株式会社
发明人： TAKECHI MITSUO , HAGIWARA HIROSUKE
IPC分类号： G01N23/04 , B61B13/10
摘要： PROBLEM TO BE SOLVED: To provide an intra-pipe traveling device which enables stable traveling in a pipe all the time even if the pipe bends upward. SOLUTION: This intra-pipe traveling device 1 has a traveling body 6 arranged inside the pipe 2, a driving wheel 16 rotating in contact with the inner face of the pipe 2, and an air cylinder device 19 provided on the opposite side of the driving wheel 16 in relation to the traveling body 6 and pressing on the inner face of the pipe 2. The air cylinder device 19 generates a constant pressing force even if an interval between the traveling body 6 and the inner face of the pipe 2 is changed, and the driving wheel 16 makes the traveling body 6 travel with a constant driving force all the time. As a result, even if the pipe 2 is bent upward, the traveling body 6 can be made to travel upward. COPYRIGHT: (C)2004,JPO
摘要翻译：要解决的问题：提供一种管道内行进装置，即使管道向上弯曲，也能够始终保持在管道中的稳定行进。解决方案：该管内行进装置1具有布置在管2内的行进体6，与管2的内表面接触旋转的驱动轮16和设置在管2的相对侧的气缸装置19 驱动轮16相对于行进体6并按压在管2的内表面上。气缸装置19即使行进体6与管2的内表面之间的间隔也产生恒定的按压力驱动轮16使行走体6始终以恒定的驱动力行进。结果，即使管2向上弯曲，也可以使行进体6向上方行进。版权所有（C）2004，JPO

8. 发明专利

JP2003059439A X-ray target and x-ray generator 有权
标题翻译： X射线目标和X射线发生器
公开(公告)号：JP2003059439A
公开(公告)日：2003-02-28
申请号：JP2001241443
申请日：2001-08-08
申请人： Rigaku Corp , 理学電機株式会社
发明人： KURIBAYASHI MASARU , CHAGI TOMOHIRO , TAKAHASHI SADAYUKI
IPC分类号： G21K5/08 , H01J35/10
摘要： PROBLEM TO BE SOLVED: To provide an X-ray target having sufficient strength and heat conductivity, capable of taking out an X-ray close to pure copper, and capable of taking out the highly intensive X-ray, and an X-ray generator having this X-ray target. SOLUTION: This X-ray target takes out the X-ray from an excited constitutive element by colliding a thermoelectron emitted from an electron gun against the surface, and is constituted so as to include copper as a main component of a constitutive material, and to further include chromium, zirconium and silicon as sub-components to this main component.
摘要翻译：要解决的问题：为了提供具有足够的强度和导热性的X射线靶，能够取出接近纯铜的X射线，并且能够取出高度密集的X射线，以及X射线发生器具有这个X射线靶。解决方案：该X射线靶从激发的本构元件取出X射线，将从电子枪射出的热电子与表面碰撞，构成为包含铜作为构成材料的主要成分，进一步包括铬，锆和硅作为该主要组分的子组分。

9. 发明专利

JP3376073B2 Sample rotation jig and sample holding device of the X-ray diffraction apparatus 失效
$Sample rotation jig and sample holding device of the X-ray diffraction apparatus$
公开(公告)号：JP3376073B2
公开(公告)日：2003-02-10
申请号：JP1870094
申请日：1994-02-15
申请人：理学電機株式会社
发明人：登大沢
IPC分类号： G01N23/207 , G01N1/28
摘要： PURPOSE:To make it possible to perform continuous automatic measurement by loading a plurality of samples so that the samples are freely turned, and to make it possible to cast X rays on the rear surface of each sample. CONSTITUTION:In an X-ray diffraction apparatus, a sample holding device is provided on a base stage of a goniometer, which can be rotated with respect to an X-ray source. The device comprises a sample stage 2 on the base stage 1, and a detachable sample rotating jig 3 on the sample stage 2. In the sample rotating jig 3, a plurality of holder mounting members 330 are attached to a rotary plate 320. A plurality of the sample holder mounting members 330 are sequentially fixed to a rotary member 350 and rotated together with the member 350. A sample holder 340 filled with a sample S can be mounted on the sample holder mounting member 330, respectively. X-ray transmitting holes 332 and 354 are formed in the sample holder mounting member 330 and the rotary member 350, which are to be located at the rear side of the sample S. The X rays can be cast on the rear surface of the sample S by way of the X-ray transmitting holes.

10. 发明专利

JP3373803B2 Combinatorial x-ray diffraction apparatus 有权
$Combinatorial x-ray diffraction apparatus$
公开(公告)号：JP3373803B2
公开(公告)日：2003-02-04
申请号：JP14921399
申请日：1999-05-28
申请人：理学電機株式会社 , 科学技術振興事業団
发明人：雅司川崎 , 哲夫菊池 , 和彦表 , 秀臣鯉沼
IPC分类号： G01N23/20 , G01N23/207 , H01L21/66
CPC分类号： G01N23/207 , B01J2219/00527 , B01J2219/00585 , B01J2219/00596 , B01J2219/00605 , B01J2219/00612 , B01J2219/00659 , B01J2219/00689 , B01J2219/00707 , B01J2219/00756

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