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81. 发明专利

JP2005127765A Semiconductor test module and test method of semiconductor device 审中-公开
标题翻译：半导体器件的半导体测试模块和测试方法
公开(公告)号：JP2005127765A
公开(公告)日：2005-05-19
申请号：JP2003361572
申请日：2003-10-22
申请人： Toshiba Corp , 株式会社東芝
发明人： OSADA TATSUO , GOTO KENJI , TSURUMURA KOJI , FUJIMORI MASARU , NAKAJIMA YASUYUKI
IPC分类号： G01R31/316 , G01R31/28 , G01R31/3183 , G01R31/319
CPC分类号： G01R31/2889
摘要： PROBLEM TO BE SOLVED: To provide a semiconductor device test module and its test method capable of testing a semiconductor device in a short time, while keeping reliability of the semiconductor device, without increasing the number of testers.
SOLUTION: This semiconductor device test module 100 is equipped with an interface 195 for inputting test condition information when a test object is tested from an external testing device 300 for testing an electrical characteristic of the test object 400, and outputting test result information for showing a test result of the test object to the external testing device, a storage part 115 capable of storing the test condition information, an operation processing part 170 for processing the test condition information independently of the external testing device, output parts 130, 140 for outputting a test signal based on the test condition information to the test object following an instruction from the operation processing part, input parts 150, 160 for inputting a response signal from the test object to the test signal, and a storage part 114 capable of storing information based on the response signal as test result information.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供一种能够在保持半导体器件的可靠性的同时在短时间内测试半导体器件的半导体器件测试模块及其测试方法，而不增加测试器的数量。解决方案：该半导体器件测试模块100配备有用于当从外部测试装置300测试测试对象以测试测试对象400的电气特性时输入测试条件信息的接口195，并输出测试结果信息用于将测试对象的测试结果显示给外部测试装置，能够存储测试条件信息的存储部分115，用于独立于外部测试装置处理测试条件信息的操作处理部分170，输出部分130,140 用于根据来自操作处理部分的指令将测试条件信息输出到测试对象信息，以及用于将来自测试对象的响应信号输入到测试信号的输入部分150,160以及能够基于响应信号存储信息作为测试结果信息。版权所有（C）2005，JPO＆NCIPI

82. 发明专利

JP3632670B2 Ic tester 有权
公开(公告)号：JP3632670B2
公开(公告)日：2005-03-23
申请号：JP2002045879
申请日：2002-02-22
申请人：横河電機株式会社
发明人：大輔谷村
IPC分类号： G01R31/316 , G01R31/3183 , H03M1/10

83. 发明专利

JP3617621B2 Inspection apparatus and method of the semiconductor integrated circuit 有权
公开(公告)号：JP3617621B2
公开(公告)日：2005-02-09
申请号：JP2000299844
申请日：2000-09-29
申请人：シャープ株式会社
发明人：練内田
IPC分类号： G01R31/316 , G01R31/26 , G01R31/28 , G01R31/3183 , G02F1/133 , H01L21/822 , H01L27/04 , H03M1/10 , H03M1/76
CPC分类号： G01R31/2841

84. 发明专利

JP2004333249A Inspection circuit 审中-公开
标题翻译：检查电路
公开(公告)号：JP2004333249A
公开(公告)日：2004-11-25
申请号：JP2003128012
申请日：2003-05-06
申请人： Matsushita Electric Ind Co Ltd , 松下電器産業株式会社
发明人： IDE YUJI , MATSUMOTO ASAKO , NARUSE KAZUHIRO
IPC分类号： G01R31/3183 , G01R31/316 , H03M1/10
摘要： PROBLEM TO BE SOLVED: To solve problems that inspection costs for AD converters and DA converters increase as inspection time is lengthened when serially measuring the AD and DA converters, and that the price of an LSI tester rises to increase the inspection cost for the AD and DA converters even if the LSI tester is given a plurality of analog units allowing the AD and DA converters to be measured in parallel by the respective analog units.
SOLUTION: The DA converters 5 are measured in parallel by means of analog input signal generators 2 fewer than the AD converters 5 by using an analog input signal conversion circuit 4 capable of converting input signals outputted from the signal generators 2 into one or more signals and a digital signal selector circuit 7 capable of selecting/outputting, in an arbitrary order, output signals of the plurality of DA converters 5. The DA converters 15 also uses a conversion circuit 14 and a selector circuit 16.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：为了解决AD转换器和DA转换器的检测成本随着AD和DA转换器串行测量时检测时间的延长而增加的问题，LSI测试仪的价格上涨，从而增加了检测成本 AD和DA转换器，即使LSI测试仪被给予多个模拟单元，允许AD和DA转换器由相应的模拟单元并行测量。解决方案：DA转换器5通过使用能够将从信号发生器2输出的输入信号转换为一个或多个的模拟输入信号转换电路4，通过比AD转换器5少的模拟输入信号发生器2来并行测量更多信号和数字信号选择电路7能够以任意顺序选择/输出多个DA转换器5的输出信号.DA转换器15还使用转换电路14和选择器电路16。（C）2005，JPO＆NCIPI

86. 发明专利

JP2004531728A Test circuit 有权
公开(公告)号：JP2004531728A
公开(公告)日：2004-10-14
申请号：JP2002591850
申请日：2002-05-21
申请人：コーニンクレッカフィリップスエレクトロニクスエヌヴィKoninklijke Philips Electronics N.V.
发明人：ロジャーエフスクッテルト , ウィルデヨハネスデ , ジョングフランシスカスジーエムデ , ベステンゲリットダブリューデン
IPC分类号： G01R31/28 , G01R19/165 , G01R31/316 , H01L21/822 , H01L27/04
CPC分类号： G01R19/16552
摘要：集積回路への電源接続部が試験される。この電源接続部は集積回路の電源導体に接続している。試験のために、試験中の電源接続部が電源導体に接続している位置の近くで、電流引き抜き回路の組合せはスイッチを入れられる。電流引き抜き回路は、この接続が操作可能か調べるため、電源接続部上で検出可能な電圧降下を引き起こすために相当な電流を引き出す。電流引き抜き回路の異なるサブセットが連続して稼動させられる。誤って電流引き抜き回路の全てが同時にスイッチを入れられることを防止するため、各サブセットの稼動は、先行するサブセットの稼動の完了を表す信号により制御される。サブセットに対して信号を提供するために、各サブセットに対してそれぞれの信号線が提供される。

87. 发明专利

JP3569275B2 Sampling digitizer, a semiconductor integrated circuit testing apparatus including the method and sampling digitizers 有权
公开(公告)号：JP3569275B2
公开(公告)日：2004-09-22
申请号：JP2002501054
申请日：2001-05-29
申请人：株式会社アドバンテスト
发明人：昌郎須貝
IPC分类号： G01R13/34 , G01R31/316
CPC分类号： G01R13/345

88. 发明专利

JP2004253031A Semiconductor integrated circuit and its test method 审中-公开
公开(公告)号：JP2004253031A
公开(公告)日：2004-09-09
申请号：JP2003040530
申请日：2003-02-19
申请人： Renasas Northern Japan Semiconductor Inc , Renesas Technology Corp , 株式会社ルネサステクノロジ , 株式会社ルネサス北日本セミコンダクタ
发明人： SEGAWA TOMOKI
IPC分类号： G01R31/28 , G01R31/316 , G06F15/78 , G11C16/02 , G11C16/06 , G11C29/00 , G11C29/02 , G11C29/12 , H01L21/822 , H01L27/04
摘要： PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit in which threshold voltage measurement of a nonvolatile memory cell can be conducted by linearly changing a word line selection level without directly driving a word line by a D/A converting circuit. SOLUTION: A nonvolatile memory (4), in which stored information is rewritable, is provided with drivers (33R1 to 33Rn) which drive word lines by reading operations and a first power supply circuit (39A) which supplies operating power to the drivers. In a test mode, the operating power supply voltages of the drivers generated by the circuit (39A) are controlled based on the conversion output voltage of the D/A converting circuit. When the threshold voltage of the nonvolatile memory cell is detected for device defect, it is possible to linearly change the operating power supply voltages of the drivers generated by the circuit (39A) in an approximate manner based on the conversion output voltage of the D/A converting circuit. Thus, no current driving capability is required to drive word line loads for the D/A converting circuit. COPYRIGHT: (C)2004,JPO&NCIPI

89. 发明专利

JP3558964B2 Inspection apparatus and method of the semiconductor integrated circuit 有权
公开(公告)号：JP3558964B2
公开(公告)日：2004-08-25
申请号：JP2000174119
申请日：2000-06-09
申请人：シャープ株式会社
发明人：英明坂口
IPC分类号： G01R31/316 , G01R31/00 , G01R31/26 , G01R31/28 , G01R31/319 , G09G3/00 , H03M1/10
CPC分类号： G09G3/006 , G01R31/31924 , G09G2310/027

90. 发明专利

JP3558074B2 Correction method of measurement error, the quality determination method and the electronic component characteristic measuring apparatus of electronic components 有权
公开(公告)号：JP3558074B2
公开(公告)日：2004-08-25
申请号：JP2002277393
申请日：2002-09-24
申请人：株式会社村田製作所
发明人：岳神谷
IPC分类号： G01R27/28 , G01R31/316 , G01R35/00 , H05K13/00
CPC分类号： G01R35/005

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