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    • 61. 发明专利
    • Temperature dependent self refresh module for memory device
    • 用于存储器件的温度依赖性自激模块
    • JP2007018693A
    • 2007-01-25
    • JP2006186638
    • 2006-07-06
    • Qimonda Agキモンダ アクチエンゲゼルシャフト
    • THWAITE PETERHOKENMAIER WOLFGANG
    • G11C11/406G11C11/403
    • G11C11/406G11C7/04G11C11/40615G11C11/40626
    • PROBLEM TO BE SOLVED: To reduce power consumption during standby by reducing the fundamental frequency of a self refresh oscillator.
      SOLUTION: The self refresh module includes the oscillator constituted so as to supply a first signal having a first frequency, a trimming divider constituted so as to supply a second signal having a second frequency by trimming the first signal, and a temperature sensor constituted so as to supply a temperature signal by sensing the temperature of a memory device. The self refresh module includes a temperature reference table constituted so as to receive the temperature signal and supply a third signal based on the temperature signal, and a temperature divider constituted so as to supply a self refresh pulse based on the second signal and the third signal.
      COPYRIGHT: (C)2007,JPO&INPIT
    • 要解决的问题:通过降低自刷新振荡器的基频来降低待机期间的功耗。 解决方案:自刷新模块包括构成为提供具有第一频率的第一信号的振荡器,通过修整第一信号来提供具有第二频率的第二信号的微调分频器,以及温度传感器 构成为通过感测存储器件的温度来提供温度信号。 自刷新模块包括温度基准表,其构成为接收温度信号并且基于温度信号提供第三信号;以及温度分配器,其构成为基于第二信号和第三信号提供自刷新脉冲 。 版权所有(C)2007,JPO&INPIT
    • 62. 发明专利
    • Fluid for immersion lithography system
    • 流体力学系统
    • JP2007013180A
    • 2007-01-18
    • JP2006179810
    • 2006-06-29
    • Qimonda Agキモンダ アクチエンゲゼルシャフト
    • GOODWIN FRANCISMARTINICK BRIANBRANDL STEFAN
    • H01L21/027G03F7/20
    • G03F7/2041G03F7/70341
    • PROBLEM TO BE SOLVED: To provide a fluid for use in an immersion lithography system. SOLUTION: A resistivity-altering substance is introduced into a fluid so as to make the fluid conductive. The fluid 230 is then positioned between the immersion head 220 of a projection lens system and a semiconductor wafer 202 during an exposure process. Because the fluid 230 is conductive, electrostatic energy that is generated while the semiconductor wafer moves with respect to the projection lens system during the exposure process is discharged through the conductive fluid, thereby preventing damage to the immersion head 220 of the projection lens system, the semiconductor wafer 202, and sensors in a stage supporting the semiconductor wafer. COPYRIGHT: (C)2007,JPO&INPIT
    • 要解决的问题:提供一种用于浸没式光刻系统中的流体。 解决方案:将电阻率变化物质引入流体中以使流体导电。 然后在曝光过程中将流体230定位在投影透镜系统的浸没头220和半导体晶片202之间。 由于流体230是导电的,所以在曝光过程中半导体晶片相对于投影透镜系统移动时产生的静电能量通过导电流体被​​排出,从而防止对投影透镜系统的浸没头220的损坏, 半导体晶片202以及支撑半导体晶片的台阶中的传感器。 版权所有(C)2007,JPO&INPIT
    • 64. 发明专利
    • Probing apparatus and operation method therefor
    • 探测器及其操作方法
    • JP2008277831A
    • 2008-11-13
    • JP2008118812
    • 2008-04-30
    • Qimonda Agキモンダ アクチエンゲゼルシャフト
    • JANUSCH PETER
    • H01L21/66G01R1/06G01R31/28
    • G01R31/286G01R31/2874
    • PROBLEM TO BE SOLVED: To provide a probing apparatus that is capable of reducing the time period (maximum of five hours) when the production test is unable to be carried out by using adaptation of the probing apparatus, and to provide an operation method for such a probing apparatus.
      SOLUTION: An operation method for the probing apparatus has a step to control the temperature of the probing apparatus at least partially. Another operation method for the probing apparatus has a step for generating and transferring the thermal energy between a heat-exchange means and at least one member on the probing apparatus, wherein a generation step, a transfer step, and a generation and transfer step for the thermal energy are controlled. The probing apparatus includes, at least one heat-exchange element 24, which is arranged in a spatial relation relative to at least one probe fixture support 22 and affect the temperature of the probe fixture support.
      COPYRIGHT: (C)2009,JPO&INPIT
    • 要解决的问题:提供一种探测装置,该探测装置能够通过使用探测装置的适应性而不能进行生产测试而缩短时间段(最多5小时),并提供操作 这种探测装置的方法。 解决方案:用于探测装置的操作方法具有至少部分地控制探测装置的温度的步骤。 用于探测装置的另一种操作方法具有在热交换装置和探测装置上的至少一个构件之间产生和传递热能的步骤,其中生成步骤,转移步骤以及生成和转移步骤 热能被控制。 探测装置包括至少一个热交换元件24,该热交换元件24相对于至少一个探针夹具支撑件22以空间关系布置并且影响探针夹具支撑件的温度。 版权所有(C)2009,JPO&INPIT
    • 67. 发明专利
    • Memory cell array and method of forming the memory cell array
    • 存储单元阵列和形成存储单元阵列的方法
    • JP2008072106A
    • 2008-03-27
    • JP2007222134
    • 2007-08-29
    • Qimonda Agキモンダ アクチエンゲゼルシャフト
    • HEINECK LARSPOPP MARTIN
    • H01L21/8242H01L27/108
    • H01L29/945H01L27/0207H01L27/10829H01L27/10861H01L27/10867H01L27/10876H01L27/10882H01L27/10891
    • PROBLEM TO BE SOLVED: To provide a DRAM memory cell array with a narrowed memory cell region. SOLUTION: Each memory cell includes a storage capacitor 3, an access transistor 16, a plurality of bit lines 2 oriented in a first direction, a plurality of word lines 8 oriented in a second direction, the second direction being perpendicular to the first direction, a semiconductor substrate 1 with a surface, and a plurality of active areas being formed in the semiconductor substrate, each active area extending in the second direction. Each of the access transistors is partially formed in the active areas and electrically couples corresponding ones of the storage capacitors to corresponding bit lines, wherein a gate electrode 19 of each of the access transistors is connected with a corresponding word line 8, a capacitor dielectric 38 of the storage capacitor has a relative dielectric constant of more than 8, and the word lines are disposed above the bit lines. COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:提供具有变窄的存储单元区域的DRAM存储单元阵列。 解决方案:每个存储单元包括存储电容器3,存取晶体管16,沿第一方向定向的多个位线2,沿第二方向定向的多个字线8,第二方向垂直于 第一方向,具有表面的半导体衬底1和形成在半导体衬底中的多个有源区,每个有源区沿第二方向延伸。 每个存取晶体管部分地形成在有源区域中并将对应的存储电容器电耦合到对应的位线,其中每个存取晶体管的栅极电极19与对应的字线8,电容器电介质38 的存储电容器的相对介电常数大于8,并且字线设置在位线上方。 版权所有(C)2008,JPO&INPIT