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    • 13. 发明专利
    • LAYOUT VERIFYING METHOD AND IT'S DEVICE
    • JPH0495168A
    • 1992-03-27
    • JP21090490
    • 1990-08-07
    • MATSUSHITA ELECTRIC IND CO LTD
    • UCHIUMI NORIO
    • G06F17/50
    • PURPOSE:To efficiently detect the node in which noncoincidence of connection occurs by extracting all attributes for showing the node name in which the total of the number of circuit element connected to each node exceeds a prescribed threshold. CONSTITUTION:this device is provided with a net list connecting information extracting means 1, a layout connecting information extracting means 2, an attribute extracting means 3, an adding means 4, and a collating means 5. In such a state, attributes for showing the node name in which the total of the number of transistors and the number of gates connected to each node of a circuit element of a net list of a semiconductor integrated circuit exceeds a certain threshold are all extracted, added newly to the corresponding node of connecting information of the circuit element of a layout, and a connecting collation of connecting information of the circuit element extracted from the net list, and connecting information of the circuit element extracted from the processed layout is executed by using the attribute for showing a fact that it is the initial corresponding node and the attribute for showing the extracted node name. In such a way, the node in which noncoincidence of connection occurs can efficiently be detected.
    • 14. 发明专利
    • OPTICAL WIRING DEVICE
    • JPH02256005A
    • 1990-10-16
    • JP7881689
    • 1989-03-29
    • MATSUSHITA ELECTRIC IND CO LTD
    • YONEZAWA HIROKAZUISHII HIDEOUCHIUMI NORIONAGAOKA TAKAHIROURANO YOSHINORIKANO SHINGOTANAKA TETSUYA
    • G02B6/122G02B6/12
    • PURPOSE:To execute an optical wiring at the size to allow mounting on a package by forming the device in such a manner that the light emitted from a light source at the time of operation is made incident to a dielectric thin film, is bent to a semiconductor element side in the thin film, is once received and reflected by the optical function element on the semiconductor element, is again guided in the thin film and is received by a photodetector. CONSTITUTION:The light emitted from the light source 4 is made incident nearly horizontally to the low-refractive index region of the dielectric thin film 1 and is bent to the semiconductor element 2 side of a high refractive index by the effect of a distributed refractive index as the light is guided in the thin film 1. As a result, the light finally arrives at the optical function element 6 and is received by this element. The light is modulated and reflected inaccordance with the signal of the semiconductor element 2. The light is guided again through the thin film 1 in the route symmetrical with the route starting from the light source 4 to the optical function element 6 and is emitted nearly horizontally from the low refractive index region until finally the light is received in a photodetector 5. Since the dielectric thin film is used for the medium to guide the light, the device is disposed nearly flatly and the optical wiring is executed at the side to allow the mounting to the package.
    • 17. 发明专利
    • INFORMATION PROCESSOR
    • JPH06342376A
    • 1994-12-13
    • JP13034693
    • 1993-06-01
    • MATSUSHITA ELECTRIC IND CO LTD
    • UCHIUMI NORIO
    • G06F1/32G06F9/46
    • PURPOSE:To reduce the power consumption by detecting an endless loop by using an idle state recognition start address and an idle state recognition end address. CONSTITUTION:The idle state recognition start address 2a and idle state recognition end address 2b can be set in a 1st register of an address coincidence detecting means 30. A 1st comparator 7 compares the address stored in this register with an address stored in a program counter 1. A period wherein an idle state is detected can be set in a 2nd register 9. A counter 8 counts variation of the detection signal from the address coincidence detecting means 30. A 2nd comparator 10 compares the contents of the 2nd register 9 with the contents of the counter 8. The detection signal from the 2nd comparator 10 is controlled to detect the idle state. Consequently, when a microprocessor is in the idle state for a certain time, its power supply can be stopped.
    • 19. 发明专利
    • METHOD OF VERIFYING LAYOUT
    • JPH03257847A
    • 1991-11-18
    • JP5531090
    • 1990-03-07
    • MATSUSHITA ELECTRIC IND CO LTD
    • UCHIUMI NORIOTAKAGI YOSHIYUKI
    • H01L21/822G06F17/50H01L21/82H01L27/04
    • PURPOSE:To make it possible to detect the source of a transistor having no feed from a wiring for feeding a power supply potential or a ground potential by subtracting the graphical data, which corresponds to the connections between the wiring for feeding a power supply potential or a ground potential and a substrate, from the graphical data of a semiconductor integrated circuit and by extracting the information for connecting transistors with each other and by performing electrical rule checking and connection collation. CONSTITUTION:Graphical data of P diffusions 9, 10 are subtracted from the graphical data of a semiconductor integrated circuit. The information for connecting transistors with each other are extracted from the graphical data of the semiconductor integrated circuit after completing its processings. At this time, a ground potential is given directly to an N diffusion 2 for the source of a transistor through a wiring 8 for feeding a ground potential. Since the wiring 8 for feeding a ground potential is disconnected at a point A, an N diffusion 4 for the source of another transistor hasn't the ground potential. Electrical rule checking(ERC) is performed for the information for connecting transistors with each other after completing their processings. Then, the source 4 of the N channel transistor having no ground potential is detected as an error.