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1. 发明授权

EP4084038B1 AUTOMATED REGULATION OF A POSITION OF AN X-RAY FOCUS OF AN X-RAY IMAGING SYSTEM 有权转让
公开(公告)号：EP4084038B1
公开(公告)日：2023-07-05
申请号：EP21170605.6
申请日：2021-04-27
发明人： Weidinger, Thomas , Gareus, Johannes , Lanz, Ulf
IPC分类号： H01J35/14 , H05G1/52 , A61B6/00

2. 发明公开

EP3900007A1 ELECTRON COLLECTOR WITH OBLIQUE IMPACT PORTION 有权
公开(公告)号：EP3900007A1
公开(公告)日：2021-10-27
申请号：EP19818123.2
申请日：2019-12-17
申请人： Excillum AB
发明人： TUOHIMAA, Tomi , LUNDSTRÖM, Ulf , HANSSON, Björn
IPC分类号： H01J35/02 , H05G1/52

3. 发明公开

EP3579664A1 METHOD FOR CONTROLLING AN X-RAY SOURCE 审中-公开
公开(公告)号：EP3579664A1
公开(公告)日：2019-12-11
申请号：EP18176702.1
申请日：2018-06-08
申请人： Excillum AB
发明人： Takman, Per , Lundström, Ulf
IPC分类号： H05G1/46 , H05G1/28 , H05G1/26 , H05G1/52
摘要： The present inventive concept relates to a method for controlling an X-ray source configured to emit, from a region of interest (232b) on a target, X-ray radiation generated by an interaction between an electron beam and the target, the method comprising the steps of: providing the target (210b); providing the electron beam arranged to interact with the target to generate X-ray radiation; setting a width and a total power of the electron beam such that a width of the electron beam exceeds the region of interest in at least one direction, and such that an X-ray source performance indicator is below a predetermined threshold.

4. 发明授权

EP3089192B1 FOCUSING AN ELECTRON BEAM IN AN X-RAY SOURCE 有权
标题翻译：聚焦在X射线源中的电子束
公开(公告)号：EP3089192B1
公开(公告)日：2018-05-09
申请号：EP16175161.5
申请日：2011-12-21
申请人： Excillum AB
发明人： HEMBERG, Oscar , TUOHIMAA, Tomi , SUNDMAN, Björn
IPC分类号： H01J35/14 , H05G1/52 , H01J35/08
CPC分类号： H01J35/14 , H01J35/08 , H01J2235/082 , H05G1/52
摘要： The invention provides a technique for indirectly measuring the degree of alignment of a beam in an electron-optical system comprising aligning means, focusing means and deflection means. To carry out the measurements, a simple sensor may be used, even a single-element sensor, provided it has a well-defined spatial extent. When practised in connection with an X-ray source which is operable to produce an X-ray target, the invention further proposes a technique for determining and controlling a width of an electronbeam at its intersection point with the target.

5. 发明公开

EP3240011A1 ELECTRONIC FOCAL SPOT ALIGNMENT OF AN X-RAY TUBE 审中-公开
标题翻译： X射线管的电子焦点对准
公开(公告)号：EP3240011A1
公开(公告)日：2017-11-01
申请号：EP17168100.0
申请日：2017-04-26
申请人： Varex Imaging Corporation
发明人： CANFIELD, Bradley , MEILER, Michael , WOODMAN, Colton , YOON, Inwoo
IPC分类号： H01J35/14 , H05G1/52
CPC分类号： H05G1/52 , A61B6/035 , A61B6/54 , A61B6/582 , A61B6/584 , H01J35/06 , H01J35/08 , H01J35/14 , H01J35/305
摘要： Technology is described for electronically aligning a central ray 352 of an x-ray tube 210 to a radiation detector 240. In an example, an x-ray system includes an x-ray tube and a tube control unit (TCU). The x-ray tube includes a cathode that includes an electron emitter configured to emit an electron beam, an anode configured to receive the electron beam and generate x-rays with a central ray from electrons of the electron beam colliding on a focal spot of the anode, and a steering magnetic multipole between the cathode and the anode that is configured to produce a steering magnetic field from a steering signal. At least two poles of the steering magnetic multipole are on opposite sides of the electron beam. The TCU includes at least one steering driver configured to generate the steering signal. The TCU is configured to convert an offset value to the steering signal.
摘要翻译：描述了用于将X射线管210的中心射线352与辐射检测器240电子对准的技术。在一个示例中，X射线系统包括X射线管和管控制单元（TCU）。所述X射线管包括阴极，所述阴极包括被配置为发射电子束的电子发射器，被配置为接收所述电子束并且产生具有来自所述电子束的电子的中心射线的X射线，所述电子束在所述以及在阴极和阳极之间的转向磁性多极，其被配置为从转向信号产生转向磁场。转向磁性多极的至少两个极位于电子束的相对侧。 TCU包括至少一个被配置为产生转向信号的转向驱动器。 TCU被配置为将偏移值转换为转向信号。

6. 发明授权

EP2364648B1 X-ray imaging apparatus 有权转让
标题翻译： X射线成像设备
公开(公告)号：EP2364648B1
公开(公告)日：2016-03-09
申请号：EP11001996.5
申请日：2011-03-10
申请人： J. MORITA MANUFACTURING CORPORATION
发明人： Suzuki, Masakazu , Yoshikawa, Hideki , Honjo, Makoto
IPC分类号： A61B6/00 , A61B6/03 , A61B6/06 , A61B6/08 , A61B6/14 , G01N23/04 , H01J35/08 , H05G1/52
CPC分类号： H01J35/08 , A61B6/032 , A61B6/06 , A61B6/08 , A61B6/14 , A61B6/4476 , A61B6/587

7. 发明授权

EP2139397B1 X-RAY BEAM Z-AXIS POSITIONING 有权
标题翻译： Z-轴定位X射线
公开(公告)号：EP2139397B1
公开(公告)日：2016-01-13
申请号：EP08751091.3
申请日：2008-03-28
申请人： Koninklijke Philips N.V.
发明人： MILLER, Lester, M. , KAMATH, Janardhan, K. , LUHTA, Randall, P.
IPC分类号： A61B6/00 , A61B6/08 , H05G1/36 , G21K1/02 , A61B6/06 , H05G1/26 , H01J35/10 , H05G1/52
CPC分类号： A61B6/08 , A61B6/032 , A61B6/4021 , A61B6/4488 , H01J35/14 , H05G1/52

8. 发明公开

EP2827135A1 X-ray testing device for material testing and method for the generation of high-resolution projections of a test object by means of x-ray beams 审中-公开
标题翻译：用于材料测试X射线检查装置，用于通过X射线的装置产生测量物体的高分辨率投影方法
公开(公告)号：EP2827135A1
公开(公告)日：2015-01-21
申请号：EP14177760.7
申请日：2014-07-21
申请人： GE Sensing & Inspection Technologies GmbH
发明人： Schmitt, Andreas , Aslami, Farid John , Friedemann, Reinhard
IPC分类号： G01N23/04 , H01J35/30 , H05G1/52
CPC分类号： G01N23/02 , G01B15/00 , G01N23/04 , G01N2223/308 , H01J35/18 , H01J35/26 , H01J35/305 , H05G1/00 , H05G1/52
摘要： The invention relates to an X-ray testing device (1) for material testing for generating high-resolution geometric projections of a test object (100) by means of X-ray beams. It comprises a highly focusing X-ray source (10) comprising a rotary anode assembly (20) with a rotatably mounted anode plate (22) and an anode plate drive (28) which is configured to set the anode plate (22) into a rotary motion. Furthermore, it comprises an electron gun (40) which is configured to generate a focused electron beam (42), and an electron beam control unit (50), which comprises an electron beam deflecting unit (52) and a control unit (54), and which is configured to control the point of incidence (44) of the electron beam (42) generated by the electron gun (40) on the anode plate (22). Finally, a bracket (102) for a test object (100) is provided, with the position of the bracket (102) relative to the rotary anode assembly (20) being fixed or capable of being fixed. Furthermore, the invention relates to a method for generating high-resolution geometric projections of a test object (100) by means of X-ray beams, using an X-ray testing device according to the invention.The principle underlying the invention is to compensate for the motion of the focal point incident on the anode plate (22) which results from mechanical instabilities and/or thermal expansion of said anode plate (22).
摘要翻译：本发明涉及X射线检查装置（1），用于通过X射线束的手段生成测试对象（100）的高分辨率几何突起材料测试。它包括被配置于阳极板（22）设置成一个高度聚焦的X射线源（10），其包括具有可旋转地安装阳极板（22）的旋转阳极组件（20）和阳极板驱动器（28）的所有旋转运动。进一步，它包括向电子枪（40），其被配置以产生聚焦的电子束（42），以及电子束控制单元（50），其包括在电子束偏转单元（52）和控制单元（54）和所有其被配置为控制由电子枪（40）在所述阳极板（22）产生的电子束（42）的发生率（44）的点。最后，对于一个检查对象（100）的支架（102）设置，与所述托架的位置（102）相对于所述旋转阳极组件（20）被固定或者能够被固定。进一步，本发明涉及一种用于通过X射线束的手段生成测试对象（100）的高分辨率几何预测的方法，使用X射线检查装置的雅丁到invention.The原理的本发明的基础是补偿为焦点入射到阳极板（22），其从机械不稳定性和/或所述阳极板的热膨胀系数（22）产生的运动。

9. 发明公开

EP2465331A4 APPARATUS FOR PRODUCING X-RAYS FOR USE IN IMAGING 有权
标题翻译：器具，用于产生X射线成像FOR
公开(公告)号：EP2465331A4
公开(公告)日：2014-01-22
申请号：EP10807249
申请日：2010-08-06
申请人： UNIV CALIFORNIA
发明人： TRAVISH GIL , YODER RODNEY B , ROSENZWEIG JAMES
IPC分类号： H05G1/52 , G01N23/20
CPC分类号： H01J35/065

10. 发明公开

EP2494576A2 SWITCHING OF ANODE POTENTIAL OF AN X-RAY GENERATING DEVICE 审中-公开
标题翻译：阳极电位变化，在X射线发生器
公开(公告)号：EP2494576A2
公开(公告)日：2012-09-05
申请号：EP10782027.6
申请日：2010-10-21
申请人： Koninklijke Philips Electronics N.V. , Philips Intellectual Property & Standards GmbH
发明人： BEHLING, Rolf, K., O.
IPC分类号： H01J35/24 , H05G1/32 , H05G1/52 , H05G1/58 , H05G1/70
CPC分类号： H01J35/24 , H01J2235/02 , H01J2235/086
摘要： The present invention relates to X-ray generating technology in general. Providing X-radiation having multiple photon energies may help differentiating tissue structures when generating X-ray images. Consequently, an X-ray generating device that allows the switching of a potential of an electron collecting element versus an electron emitting element for providing different energy modes is presented. According to the present invention, an X-ray generating device is provided, comprising an electron emitting element (16) and electron collecting element (20). The electron emitting element (16) and the electron collecting element (20) are operatively coupled for the generation of X-radiation (14). A potential is arranged between the electron emitting element (16) and the electron collecting element (20) for acceleration of electrons from the electron emitting element 16 to the electron collecting element (20), the electrons constituting an electron beam (7). The electron beam (17) is adapted to influence the potential.

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