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    • 7. 发明公开
    • MEMORY DEVICE AND ZQ CALIBRATION METHOD
    • EP4328911A1
    • 2024-02-28
    • EP22924580.8
    • 2022-10-08
    • Changxin Memory Technologies, Inc.
    • TIAN, Kai
    • G11C7/10G11C11/4078H01L23/64
    • The present disclosure provides a memory device and a ZQ calibration method, wherein the memory device comprises: two calibration resistor interfaces connected to the same ZQ calibration resistor; and a first master chip, first slave chips, a second master chip, and second slave chips, which are commonly connected to the ZQ calibration resistor; in a command mode, a first signal receiver is used to receive a ZQ calibration command, a second signal receiver is used to receive and delay the ZQ calibration command, the first master chip and the second master chip start to calibrate based on the ZQ calibration command, and after the calibration is completed, the first master chip and the second master chip send the ZQ flag signal through second transmission terminals; and the third signal receiver is used to receive the ZQ flag signal through a first transmission terminal, the first slave chips and the second slave chips start to calibrate based on the ZQ flag signal, and after the calibration is completed, the first slave chips and the second slave chips send a ZQ flag signal through second transmission terminals.