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    • 1. 发明公开
    • Reader stop layers
    • Leserstoppschichten
    • EP2581906A3
    • 2015-04-22
    • EP12188430.8
    • 2012-10-12
    • Seagate Technology LLC
    • Van Dorn, Carolyn PitcherBoonstra, Thomas Roy
    • G11B5/31G11B5/11G11B5/39G11B5/40
    • G11B5/39G11B5/11G11B5/112G11B5/3169G11B5/3912G11B5/40Y10T428/1121Y10T428/1164
    • Tolerances for manufacturing reader structures for transducer heads continue to grow smaller and storage density in corresponding storage media increases. Reader stop layers may be utilized during manufacturing of reader structures to protect various layers of the reader structure from recession and/or scratches while processing other non-protected layers of the reader structure. For example, the stop layer may have a very low polish rate during mechanical or chemical-mechanical polishing. Surrounding areas may be significantly polished while a structure protected by a stop layer with a very low polish rate is substantially unaffected. The stop layer may then be removed via etching, for example, after the mechanical or chemical-mechanical polishing is completed.
    • 用于传感器头的制造读取器结构的公差继续增长,并且相应存储介质中的存储密度增加。 在读取器结构的制造期间可以利用读取器停止层来保护读取器结构的各个层免于衰退和/或划痕,同时处理读取器结构的其它未受保护的层。 例如,停止层在机械或化学机械抛光期间可能具有非常低的抛光速率。 可以显着地抛光周围区域,而由具有非常低的抛光速率的停止层保护的结构基本上不受影响。 然后可以通过蚀刻,例如在机械或化学机械抛光完成之后去除停止层。
    • 4. 发明公开
    • Magnetic sensor with limited element width
    • Magnetischer Sensor mitbeschränkterElementbreite
    • EP1857829A2
    • 2007-11-21
    • EP07006261.7
    • 2007-03-27
    • ALPS ELECTRIC CO., LTD.
    • Sasaki, Yoshito
    • G01R33/00
    • G01R33/07B82Y25/00G01R33/093Y10T428/1121Y10T428/1143
    • Particularly, there is provided a magnetic sensor capable of preventing an occurrence of a chattering or the like to provide a stable operation and easily controlling a magnetic sensitivity depending on applications. The magneto-resistance element 8 is formed in a slender and longitudinal shape in which an element length L is greater than an element width W and the element width W is in the range of 1 µm to 5 µm. The element length L is in the range of 50 µm to 250 µm. Owing to the result, it is possible to easily control a coercive force Hc of the free layer with required magnitude. In addition, the coercive force Hc may be in the range of 5 Oe to 10 Oe (about 395 A/m to 790 A/m) by setting the element width W in the range of 1 µm to 5 µm.
    • 特别地,提供了一种磁传感器,其能够防止发生抖动等以提供稳定的操作并且根据应用容易地控制磁敏感度。 磁阻元件8以元件长度L大于元件宽度W并且元件宽度W在1μm至5μm的范围内形成为细长且纵向的形状。 元件长度L在50μm至250μm的范围内。 因此,可以容易地以所需的大小控制自由层的矫顽力Hc。 此外,通过将元件宽度W设定在1μm至5μm的范围内,矫顽力Hc可以在5Oe至10Oe(约395A / m至790A / m)的范围内。