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    • 6. 发明公开
    • Particle measuring apparatus
    • Teilchenmessvorrichtung
    • EP2784481A2
    • 2014-10-01
    • EP14161528.6
    • 2014-03-25
    • SYSMEX CORPORATION
    • Yamada, KazuhiroYamamoto, Takeshi
    • G01N15/14
    • G01N15/1434G01N15/1459G01N2015/1438G01N2015/1452
    • A particle measuring apparatus comprising a flow cell configured to flow a specimen, a first light source configured to emit light having a first wavelength, a second light source configured to emit light having a second wavelength different from the first wavelength, an irradiation optical system configured to irradiate the flow cell with light emitted from the first light source and the second light source, a first light receiving portion configured to receive scattered light obtained by irradiating a measurement particle passing through the flow cell with light from the first light source, and a second light receiving portion configured to receive scattered light obtained by irradiating a measurement particle passing through the flow cell with light from the second light source.
    • 一种粒子测量装置,包括被配置为流动样本的流动池,被配置为发射具有第一波长的光的第一光源,被配置为发射具有不同于第一波长的第二波长的光的第二光源,被配置为 利用从第一光源和第二光源发射的光照射流动池,第一光接收部分,被配置为接收通过用来自第一光源的光照射通过流动池的测量颗粒而获得的散射光,以及 第二光接收部分,被配置为接收通过用来自第二光源的光照射通过流动池的测量颗粒获得的散射光。