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    • 4. 发明公开
    • Scanning near field optical microscope
    • Nahfeldrastermikroskop
    • EP0880043A3
    • 1999-02-10
    • EP98304109.6
    • 1998-05-22
    • SEIKO INSTRUMENTS INC.
    • Sato, KatsuakiMitsuoka, YasuyukiNakajima, Kunio
    • G02B21/00G01B7/34G01N21/21G02B6/10
    • G01N21/21G01Q20/02G01Q60/06G01Q60/22Y10S977/862
    • In a combined scanning near field optical microscope (Nsom) and atomic force microscope (AFM), an optical fibre probe (1) which has a minute opening on the top of a sharpened tip is brought close to a sample (2), and the probe is moved by a piezo actuator (15) along x- and y-axis directions so that a minute spot beam emanating from the minute opening can scan over the sample. For circular polarisation modulation to be incorporated in the process, a beam is given an optical delay, before it is incident on the optical fibre probe (1), changing at a frequency of p (Hz) by means of a piezo-optical modulator (10). A minute spot beam emanating from the minute opening passes through the sample (2) to be received after passage through the sample (2) to be received after passage through an analyser (5) by a light receiving element (7). The output from the light receiving element (7) is fed to a lock-in amplifier, p- and 2p-components are separated through lock-in rectification, and they are rendered into images by a controller (16). It is used for measuring the distribution of magneto-optical effects.
    • 在组合扫描近场光学显微镜(Nsom)和原子力显微镜(AFM)中,在尖锐的顶部具有微小开口的光纤探针(1)靠近样品(2),并且 探头通过压电致动器(15)沿x轴和y轴方向移动,使得从分钟开始发出的微小点光束可以扫描样品。 对于要在该过程中并入的圆偏振调制,在光束入射到光纤探针(1)之前,光束被给予光学延迟,通过压电光调制器以p(Hz)的频率改变 10)。 从微小开口发出的微小光束通过样品(2),在通过样品(2)之后被接收,以便在通过光谱接收元件(7)通过分析器(5)之后被接收。 来自光接收元件(7)的输出被馈送到锁定放大器,p和2p分量通过锁定整流分离,并且它们被控制器(16)渲染成图像。 它用于测量磁光效应的分布。