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热词
    • 2. 发明公开
    • Test probe and manufacturing method for test probe
    • Testsonde和Herstellungsverfahrenfüreine Testsonde
    • EP1724744A1
    • 2006-11-22
    • EP06010112.8
    • 2006-05-16
    • SEIKO EPSON CORPORATION
    • Ito, Haruki
    • G09G3/00
    • G01R1/0735
    • A test probe for testing a semiconductor device (100), includes: a substrate (2) having a first surface (2a) and a second surface (2b); an input projection portion (11) formed on the first surface (2a); an output projection portion (21) formed on the first surface (2a); input contacting portions (13), each of which is in contact with each of the input terminals (101) and is formed on the input projection portion (11); output contacting portions (23), each of which is in contact with each of the output terminals (102) and is formed on the output projection portion (21); input conductive portions (14) formed on the first surface (2a), each of which is electrically connected to each of the input contacting portions (13); and output conductive portions (24) formed on the first surface (2a), each of which is electrically connected to each of the output contacting portions (23).
    • 一种用于测试半导体器件(100)的测试探针,包括:具有第一表面(2a)和第二表面(2b)的衬底(2); 形成在所述第一表面(2a)上的输入突出部分(11); 形成在所述第一表面(2a)上的输出突起部分(21) 输入接触部分(13),每个输入接触部分(13)与每个输入端子(101)接触并形成在输入突出部分(11)上; 输出接触部分(23),每个输出接触部分(23)与每个输出端子(102)接触并形成在输出突出部分(21)上; 形成在第一表面(2a)上的输入导电部分(14),每个输入导电部分电连接到每个输入接触部分(13); 以及输出形成在所述第一表面(2a)上的导电部分(24),每个所述导电部分电连接到每个所述输出接触部分(23)。