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1. 发明公开

EP1176643A2 MOS power semiconductor device having a trench gate and method of making the same 审中-公开
标题翻译：具有它们的制备沟槽栅电极和过程MOS功率半导体器件
公开(公告)号：EP1176643A2
公开(公告)日：2002-01-30
申请号：EP01116709.5
申请日：2001-07-17
申请人： Fairchild Semiconductor Corporation
发明人： Zeng, Jun , Dolny, Gary M. , Kocon, Christopher B. , Brush, Linda S.
IPC分类号： H01L29/78 , H01L29/417 , H01L29/423 , H01L29/739 , H01L29/745 , H01L21/336 , H01L21/331 , H01L21/332
CPC分类号： H01L29/7802 , H01L29/41766 , H01L29/66348 , H01L29/66363 , H01L29/7397 , H01L29/7455 , H01L29/7813
摘要： An MOS power device a substrate comprises an upper layer having an upper surface and an underlying drain region, a well region of a first conductance type disposed in the upper layer over the drain region, and a plurality of spaced apart buried gates, each of which comprises a trench that extends from the upper surface of the upper layer through the well region into the drain region. Each trench comprises an insulating material lining its surface, a conductive material filling its lower portion to a selected level substantially below the upper surface of the upper layer, and an insulating material substantially filling the remainder of the trench. A plurality of highly doped source regions of a second conductance type are disposed in the upper layer adjacent the upper portion of each trench, each source region extending from the upper surface to a depth in the upper layer selected to provide overlap between the source regions and the conductive material in the trenches. A groove in each of the highly doped source regions extends through the source regions into the well region and terminates in a nadir. A highly doped body region of a first conductance type is disposed in the well region adjacent both to the nadir of one or more of the grooves and to adjacent source regions penetrated by the grooves. A conductive layer is disposed over the substrate and electrically contacts the body and source regions. A process for fabricating a device produces an MOS power device that avoids the loss of channel width and provides reduced channel resistance without sacrificing device ruggedness and dynamic characteristics.
摘要翻译：的MOS功率器件上的上表面和在底层的漏极区域具有上层的包括基材，在漏极区域中的上层设置的第一电导类型的阱区域中，和间隔开的埋入式栅极的复数，其中的每一个包括沟槽的确从通过所述阱区的上部层向漏区的上表面上延伸。绝缘材料衬里其表面的每个沟槽包括，导电材料填充其下部，以大大低于上层的上表面上选定的水平，和绝缘材料基本上填充所述沟槽的剩余部分。一个第二电导类型的高度掺杂的源极区的多个上层邻近每个沟槽的上部设置，在上层从上表面延伸至一深度各源极区选择为所述源极区域之间提供重叠导电材料在沟槽中。在每个重掺杂源极区的凹槽通过源极区域到阱区延伸，并且在最低点终止。第一电导类型的高度掺杂的体区在相邻的两个的一个或多个槽的最低点和由槽穿入的相邻源极区的阱区被设置。导电层设置在基片和电接触所述主体区和源区。 MOS功率器件的一种制造设备过程中产生确实避免了信道宽度的损失和信道提供降低的电阻而不牺牲设备的耐用性和动态特性。

2. 发明授权

EP1058317B8 Low voltage MOS device and corresponding manufacturing process 有权
标题翻译：低电压MOS器件和相应的制造方法
公开(公告)号：EP1058317B8
公开(公告)日：2009-11-04
申请号：EP00401471.8
申请日：2000-05-25
申请人： Fairchild Semiconductor Corporation
发明人： Zeng, Jun , Wheatley, Carl, Jr.
IPC分类号： H01L29/78 , H01L21/336 , H01L29/36 , H01L29/08
CPC分类号： H01L29/7802 , H01L29/0878 , H01L29/66712
摘要： An improved low-voltage MOS device having high ruggedness, low on-resistance, and improved body diode reverse recovery characteristics comprises a semiconductor substrate on which is disposed a doped upper layer of a first conduction type. The upper layer includes at its upper surface a blanket implant of the first conduction type, a heavily doped source region of the first conduction type, and a heavily doped body region of a second and opposite conduction type. The upper layer further includes a doped first well region of the first conduction type and a doped well region of the second conduction type underlying the source and body regions. The first well region underlies the second well region and merges with the blanket implant to form a heavily doped neck region that abuts the second well region at the upper surface of the upper layer. A gate comprising a conductive material separated from the upper layer by an insulating layer is disposed on the upper layer overlying the heavily doped neck region. A process for forming an improved low-voltage MOS device having high ruggedness, low on-resistance, and improved body diode reverse recovery characteristics comprises providing a semiconductor substrate that includes a doped upper layer of a first conduction type, and implanting a blanket dopant of the first conduction type in an upper surface of the upper layer. A gate comprising a conductive material and an insulating layer is formed on the upper layer of the substrate, and a doped first well region of the first conduction type and a doped second well region of a second and opposite conduction type are formed by implanting dopants of first and second conduction types through a common window into the upper surface of the upper layer. The first well region underlies the second well region and merges with the blanket implant, forming a heavily doped neck region underlying the gate and abutting the second well region at the upper surface of the upper layer. A heavily doped source region of the first conduction type and a heavily doped body region of the second conduction type are formed in the second well region at the upper surface of the upper layer.

3. 发明授权

EP1033759B1 MOS-gated device having a buried gate and process for forming same 有权
标题翻译：与掩埋栅极MOS器件和制备过程
公开(公告)号：EP1033759B1
公开(公告)日：2012-10-03
申请号：EP00102398.5
申请日：2000-02-03
申请人： Fairchild Semiconductor Corporation
发明人： Kocon, Christopher , Zeng, Jun
IPC分类号： H01L29/78 , H01L29/739 , H01L29/74 , H01L21/336 , H01L21/331 , H01L21/332
CPC分类号： H01L29/7813 , H01L29/0696 , H01L29/4236 , H01L29/66348 , H01L29/66734 , H01L29/7397
摘要： An improved trench MOS-gated device comprises a monocrystalline semiconductor substrate on which is disposed a doped upper layer. The upper layer includes at an upper surface a plurality of heavily doped body regions having a first polarity and overlying a drain region. The upper layer further includes at its upper surface a plurality of heavily doped source regions having a second polarity opposite that of the body regions A gate trench extends from the upper surface of the upper layer to the drain region and separates one source region from another. The trench has a floor and sidewalls comprising a layer of dielectric material and contains a conductive gate material filled to a selected level and an isolation layer of dielectric material that overlies the gate material and substantially fills the trench. The upper surface of the overlying layer of dielectric material in the trench is thus substantially coplanar with the upper surface of the upper layer. A process for forming an improved MOS-gate device provides a device whose gate trench is filled to a selected level with a conductive gate material, over which is formed an isolation dielectric layer whose upper surface is substantially coplanar with the upper surface of the upper layer of the device.

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