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    • 82. 发明公开
    • Optical element and illumination optics for microlithography
    • Optisches Element und Beleuchtungsoptikfürdie Mikrolithografie
    • EP2407828A1
    • 2012-01-18
    • EP11184955.0
    • 2007-12-20
    • Carl Zeiss SMT GmbH
    • Gerhard, Dr. Michael
    • G03F7/20
    • G03F7/70191G03F7/70075G03F7/70083
    • An optical element serves to influence a nominal beam angle, preset over a beam cross-section, of a radiation beam (26) hitting the optical element. The optical element has a spatial optical structure (16) which generates a first part of the influence exerted on the nominal beam angle when exposed to the radiation beam (26). An optical coating (24) applied on the spatial optical structure or on a carrier layer carrying the spatial optical structure (16) causes a defined attenuation of parts of the radiation beam (26) when exposed to the latter, thus resulting in a second part of the influence exerted on the nominal beam angle. The optical effects of the structure (16) and the coating (24) are such that they complement each other in influencing the nominal beam angle. The manufacturing effort required to obtain this effect is quite low. Moreover, this leads to new possibilities in terms of influencing the nominal beam angle.
    • 光学元件用于影响击中光学元件的辐射束(26)的在横截面上预设的标称光束角。 光学元件具有空间光学结构(16),其在暴露于辐射束(26)时产生施加在标称光束角上的影响的第一部分。 施加在空间光学结构上或承载空间光学结构(16)的载体层上的光学涂层(24)当暴露于辐射束(26)的部分被暴露时,导致限定的衰减,从而导致第二部分 对标称光束角的影响。 结构(16)和涂层(24)的光学效应使得它们在影响标称光束角度时相互补充。 获得此效果所需的制造工作相当低。 此外,这导致了影响标称光束角度的新的可能性。
    • 84. 发明公开
    • ILLUMINATING OPTICAL APPARATUS, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD
    • 光学照明设备,曝光设备和仪器RATHER定位过程,
    • EP2020679A4
    • 2011-04-13
    • EP07742128
    • 2007-04-23
    • NIPPON KOGAKU KK
    • KOMATSUDA HIDEKI
    • H01L21/027
    • G03F7/702G03F7/70075
    • There is an illumination optical apparatus capable of forming an intensity distribution profile of light in an exit pupil that is substantially symmetrical with respect to an axis or substantially symmetrical and substantially identical in shape in two perpendicular directions with respect to an axis to illuminate an illumination surface under desired illumination conditions. The illumination optical apparatus includes a first fly's-eye optical system (18a) having first optical components and a second fly's-eye optical system (18b) having second optical components arranged in parallel in one-to-one correspondence to the first optical components. An illumination surface (M) is illuminated with light from each of the second optical components in an overlapping manner. The correspondence relationship between the first optical components and the second optical components is established so that an intensity distribution profile of light in an exit pupil of the illumination optical apparatus is substantially symmetrical with respect to an axis or substantially symmetrical and substantially identical in shape in two perpendicular directions with respect to an axis.
    • 87. 发明公开
    • Illumination system for a microlithographic contact and proximity exposure apparatus
    • 用于微光刻接触和接近曝光设备的照明系统
    • EP2253997A2
    • 2010-11-24
    • EP09169158.4
    • 2009-09-01
    • Süss MicroTec Lithography GmbH
    • Völkel, ReinhardVogler, UweBich, AndreasWeible, Kenneth J.Eisner, MartinHornung, MichaelKaiser, PaulZoberbier, RalphCullmann, Elmar
    • G03F7/20
    • G03F7/7035G03F7/7005G03F7/70075G03F7/70566
    • An illumination system for a micro-lithographic contact and proximity exposure apparatus comprising a light source (1), a collector (2), two optical integrators (3,6), two Fourier lenses (4,7), at least one angle defining element (5); and at least one field lens (8). The first optical integrator (3) comprises optical sub-elements and produces a plurality of secondary light sources (6a) each emitting a light bundle. A first Fourier lens (7) effects a superposition of the light bundles and uniform irradiance in its Fourier plane (4a). The second optical integrator (6) is located at the Fourier plane (7a) of the first Fourier lnes (7), comprises optical sub-elements and produces a plurality of tertiary light sources (6a) each emitting a light bundle. A second Fourier lens (7) effects a superposition of the light bundles, uniform irradiance and a desired and uniform angular distribution of light illuminating a mask (9) for contact or proximity lithographic printing. The field lens (8) in the Fourier plane (7a) ensures telecentric illumination the mask (9). The optional field lens (12) in the Fourier plane (4a) of the first optical integrator (3) ensures telecentric illumination of the second optical integrator (6). The angle defining element (5) comprises optical sub-elements and defines the angular distribution of the light illuminating the mask (9). A change of the position of the second Fourier lens (7) or the use of a Fourier zoom lens (62) or hybrid Fourier lens (63) allows run-out control (registration error correction) of the lateral dimensions of the printed miniature pattern in the resist layer on the surface of the wafer (10).
    • 一种用于微光刻接触和接近曝光装置的照明系统,包括光源(1),集光器(2),两个光学积分器(3,6),两个傅立叶透镜(4,7),至少一个角度限定 元素(5); 和至少一个场镜(8)。 第一光学积分器(3)包括光学子元件并且产生多个发射光束的二级光源(6a)。 第一傅立叶透镜(7)在其傅立叶平面(4a)中实现光束的叠加和均匀的辐照度。 第二光学积分器(6)位于第一傅立叶单元(7)的傅立叶平面(7a)处,包括光学子元件并且产生多个发射光束的多个第三光源(6a)。 第二傅立叶透镜(7)实现光束的叠加,均匀的辐照度以及照射用于接触或邻近平版印刷的掩模(9)的期望且均匀的角度分布。 傅立叶平面(7a)中的场透镜(8)确保掩模(9)的远心照明。 第一光学积分器(3)的傅立叶平面(4a)中的可选的场透镜(12)确保第二光学积分器(6)的远心照明。 角度限定元件(5)包括光学子元件并且限定照射面罩(9)的光的角度分布。 第二傅立叶透镜(7)的位置或使用傅里叶变焦透镜(62)或混合傅立叶透镜(63)的改变允许印刷的微型图案的横向尺寸的偏斜控制(配准误差校正) 在晶片(10)表面上的抗蚀剂层中。