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    • 35. 发明公开
    • Controlling material sputtered from a target
    • Kontrolle eines材料,焊接von einem目标zerstäubtwird。
    • EP0682125A1
    • 1995-11-15
    • EP95303076.4
    • 1995-05-05
    • APPLIED MATERIALS, INC.
    • Parker, Norman William
    • C23C14/34C23C14/04H01J37/32
    • H01J37/3447C23C14/046C23C14/34H01J37/34
    • The disclosure relates to a sputtering apparatus including a target that is sputtered to deposit a material layer on a substrate. A filtering member (18) which may be in the form of a grid of upper and lower sets of bars staggered with respect to each other is disposed intermediate the substrate (14) and target (12) to prevent target material particles travelling perpendicular to the substrate from contacting the substrate. This filtering reduces the rate of deposition occurring on the surface of the substrate with respect to that occurring on the walls of any holes therein, and thereby increases the deposition layer forming on the wall of the hole with respect to that forming on the surface of the substrate and base of the hole. Other forms of filtering member are also disclosed including upper and lower perforated plates and upper and lower sets of concentric rings.
    • 本公开涉及一种溅射装置,其包括溅射以在基板上沉积材料层的靶。 布置在基板(14)和目标(12)之间的相对于彼此交错的上下组的网格形式的过滤构件(18),以防止目标材料颗粒垂直于 基底与基底接触。 这种过滤降低了衬底表面上相对于其中任何孔壁上发生的沉积速率,从而增加了在孔的壁上形成的沉积层相对于在表面上形成的沉积层 基底和孔底。 还公开了其他形式的过滤构件,其包括上和下多孔板以及上下组的同心环。
    • 36. 发明公开
    • Metallic material deposition method for integrated circuit manufacturing
    • 一种用于金属材料的沉积用于生产集成电路的工艺。
    • EP0529321A1
    • 1993-03-03
    • EP92112768.4
    • 1992-07-27
    • APPLIED MATERIALS INC.
    • Talieh, HomoyounTepman, AviKieu, Hoa ThiWang, Chien-Rhone (Jean Wang)
    • H01L21/90C23C14/34
    • C23C14/046C23C14/34H01L21/2855H01L21/321H01L21/76877
    • The improved material deposition process of the present invention utilizes a first, low temperature deposition step followed by a second, high temperature/high power deposition step. In the first deposition step a collimation plate (32) is placed between the sputtering target (18) and the substrate (12), such that a collimated stream of sputtered material is deposited upon the substrate (12). The collimated stream provides a seed layer (40) which aids in eliminating voids by partially filling the holes and grooves in the surface of the substrate (12). The second deposition step is conducted as a high temperature sputtering deposition. At the high temperature the sputtered material joins and flows with the seed layer (40), whereby the holes and grooves are more easily filled without voids and an improved planarized layer is achieved.
    • 本发明的改进的材料沉积工艺利用随之而来的是第二,高温/高功率沉积步骤的第一,低温沉积步骤。 在第一沉积步骤a准直板(32)的溅射靶(18)和基片(12)之间放置,谋求确实溅射材料的准直流在所述基板(12)被沉积。 准直流提供的籽晶层(40),在通过部分地填充所述孔和槽的基片(12)的表面消除空隙,这有助于。 第二沉积步骤中进行作为高温溅射沉积。 在高温下被溅射材料连接和与所述籽晶层(40),由此所述孔和槽更容易地填充无空隙和改善的平坦化层,实现流动。