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    • 11. 发明公开
    • RELAY, CONTROL CIRCUIT, AND METHOD FOR CONTROLLING CONTROL CIRCUIT
    • RELAIS,STEUERSCHALTUNG UND VERFAHREN ZUR STEUERUNG DER STEUERSCHALTUNG
    • EP2560182A1
    • 2013-02-20
    • EP11768870.5
    • 2011-04-13
    • National University Corporation Nagaoka University of Technology
    • HIRAO, YujiFUTSUHARA, Koichi
    • H01H51/20H01H50/64
    • H01H50/642H01H3/001H01H51/20
    • The relay (KM) has at least first and second contact points(a1, a2), the states of which are switched from an open state to a close state by the drive of an electromagnet (32). The first and second contact points(a1, a2) switch the states between the open state and the close state by enabling movable contact pieces (31) to move with respect to respective fixed contact pieces (30) by using a power transmission mechanism (21) movable by the drive of the electromagnet (32). The first and second contact points(a1, a2) are set so that the second contact point(a2) is switched to the close state after the first contact point(a1) is switched to the close state and the first contact point(a1) is switched to the open state after the second contact point(a2) is switched to the open state.
    • 继电器(KM)具有至少第一和第二接触点(a1,a2),其状态通过电磁体(32)的驱动从打开状态切换到关闭状态。 第一和第二接触点(a1,a2)通过使用动力传递机构(21)使可动接触片(31)能够相对于各个固定接触片(30)移动来切换打开状态和关闭状态之间的状态 )可通过电磁体(32)的驱动而移动。 第一和第二接触点(a1,a2)被设定为使得第二接触点(a2)在第一接触点(a1)切换到闭合状态之后切换到闭合状态,并且第一接触点(a1) 在第二接触点(a2)切换到打开状态之后切换到打开状态。
    • 18. 发明公开
    • SHAPE MEASUREMENT DEVICE AND SHAPE MEASUREMENT METHOD
    • FORMMESSVORRICHTUNG UND FORMMESSVERFAHREN
    • EP2634558A2
    • 2013-09-04
    • EP11821824.7
    • 2011-08-30
    • National University Corporation Nagaoka University of Technology
    • SHIODA Tatsutoshi
    • G01N21/17G01B9/02G01B11/24
    • G01B11/2441G01B9/02008G01B9/02027G01B9/0209G01B2290/25G01N21/958
    • The shape measurement device 1 comprises a light source 11,a measuring beam illumination system 13, a reference comb light separator 14, an optical multiplexer 15 and photodetector 16. The reference comb light separator 14 enters with a broadband light, and it separates in a reference comb light with broadband light. The frequency interval of he reference comb light changes continually depending on a size of Y-coordinate level in the image formation point, when the emission direction is assumed Z-axis direction. X-axis means a virtual cutout line for the measuring object, and Y-coordinate means depth for measuring. The interference image emerging in the detective surface is a tomogram for the measurement substantially. Using the reference comb light, the two-dimensional dislocation of depth direction is measured, wherein the dynamic range is extremely wide. When an emission direction is assumed Z-axis direction, a frequency interval of a reference comb light changes depending on size of Y-coordinate level in image formation point continually.
    • 形状测量装置1包括光源11,测量光束照明系统13,参考梳光分离器14,光学多路复用器15和光电检测器16.参考梳光分离器14以宽带光进入,并且以 参考梳光带宽带灯。 当发射方向为Z轴方向时,参考梳光的频率间隔根据图像形成点中的Y坐标水平的大小而连续变化。 X轴表示测量对象的虚拟切口线,Y坐标表示测量深度。 检测表面中出现的干涉图像是用于测量的断层图像。 使用参考梳光,测量深度方向的二维位错,其中动态范围非常宽。 当发射方向被假设为Z轴方向时,参考梳光的频率间隔将连续地根据图像形成点中的Y坐标水平的大小而变化。