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    • 3. 发明申请
    • Semiconductor device and system
    • 半导体器件和系统
    • US20060271799A1
    • 2006-11-30
    • US11216018
    • 2005-09-01
    • Shinichiro ShiratakeYukihito OowakiHiroyuki HaraTetsuya FujitaFumitoshi HatoriMasataka Matsui
    • Shinichiro ShiratakeYukihito OowakiHiroyuki HaraTetsuya FujitaFumitoshi HatoriMasataka Matsui
    • G06F1/26
    • G06F1/26G06F1/3203G06F1/3296Y02D10/172
    • According to the present invention, there is provided a semiconductor device comprising: a power supply circuit which receives an external power supply voltage supplied, and outputs an internal power supply voltage not higher than the external power supply voltage; a system module which receives the internal power supply voltage, and performs a predetermined operation; and a performance monitor circuit which measures a processing speed of said system module when the internal power supply voltage is applied, and, on the basis of the processing speed, outputs a first control signal which requests to set the external power supply voltage at a first level, and a second control signal which requests said power supply circuit to set the internal power supply voltage at a second level, wherein said power supply circuit outputs the internal power supply voltage having the second level on the basis of the second control signal applied thereto.
    • 根据本发明,提供了一种半导体器件,包括:电源电路,接收所提供的外部电源电压,并输出不高于外部电源电压的内部电源电压; 接收内部电源电压并执行预定操作的系统模块; 以及性能监视电路,其在施加所述内部电源电压时测量所述系统模块的处理速度,并且基于所述处理速度,输出请求将所述外部电源电压设置为第一的第一控制信号 电平和第二控制信号,其请求所述电源电路将内部电源电压设定在第二电平,其中所述电源电路基于施加到其的第二控制信号输出具有第二电平的内部电源电压 。
    • 4. 发明授权
    • Ferroelectric memory with an intrinsic access transistor coupled to a capacitor
    • 具有耦合到电容器的本征存取晶体管的铁电存储器
    • US07057917B2
    • 2006-06-06
    • US10743906
    • 2003-12-24
    • Ryu OgiwaraDaisaburo TakashimaSumio TanakaYukihito OowakiYoshiaki Takeuchi
    • Ryu OgiwaraDaisaburo TakashimaSumio TanakaYukihito OowakiYoshiaki Takeuchi
    • G11C11/22
    • G11C11/22
    • A chain type ferroelectric random access memory has a memory cell unit including ferroelectric memory cells electrically connected in series to each other, a plate line connected to an electrode of the memory cell unit, a bit line connected to the other electrode of the memory cell unit via a switching transistor, a sense amplifier which amplifies the voltages of this bit line and its complementary bit line, and a transistor inserted between the switching transistor and the sense amplifier. A value, being the minimum value of the gate voltage in the transistor obtained during elevation of the plate line voltage and comparative amplification, is smaller than a value, being the maximum value of the gate voltage in the transistor obtained during fall of the plate line voltage and comparative amplification. With these features, decrease in the accumulated charge of polarization in the memory cell is reduced and occurrence of disturb is prevented during read/write operations.
    • 链式铁电随机存取存储器具有包括彼此串联电连接的铁电存储单元的存储单元单元,连接到存储单元单元的电极的板线,连接到存储单元单元的另一个电极的位线 通过开关晶体管,放大该位线及其互补位线的电压的读出放大器,以及插在开关晶体管和读出放大器之间的晶体管。 作为板线电压和比较放大的升压期间获得的晶体管中的栅极电压的最小值的值小于在板线掉电期间获得的晶体管中的栅极电压的最大值 电压和比较放大。 利用这些特征,存储单元中的累积电荷的减小减少,并且在读/写操作期间阻止了干扰的发生。
    • 5. 发明授权
    • Ferroelectric memory having a device responsive to current lowering
    • 铁电存储器具有响应于电流降低的装置
    • US06643162B2
    • 2003-11-04
    • US09799694
    • 2001-03-07
    • Yoshiaki TakeuchiYukihito Oowaki
    • Yoshiaki TakeuchiYukihito Oowaki
    • G11C1122
    • G11C11/22
    • A ferroelectric memory has a memory cell array of memory cells having ferroelectric capacitors, which is divided into a plurality of blocks, a boost power circuit provided in each block of the memory cell array to generate a boost voltage required for operation of the memory, a boost power switch provided between a power line connected to an external power terminal and a power supply terminal of each boost power circuit, and remaining ON during normal operation of the memory, a voltage detector circuit for detecting a drop of voltage level of the power line, and a switch control circuit for turning off the boost power switches in the blocks of the memory cell array excluding the boost power switch in a currently selected block in response to the voltage detector circuit.
    • 铁电存储器具有具有铁电电容器的存储单元阵列,其被分成多个块,设置在存储单元阵列的每个块中的升压功率电路,以产生存储器的操作所需的升压电压, 升压电源开关,其设置在连接到外部电源端子的电力线与每个升压电力电路的电源端子之间,并且在正常操作期间保持ON;电压检测器电路,用于检测电力线的电压水平的下降 以及开关控制电路,用于响应于电压检测器电路,关闭当前选择的块中除了升压功率开关之外的存储单元阵列的块中的升压功率开关。
    • 7. 发明授权
    • Evaluation apparatus and fabrication system for semiconductor
    • 半导体评估装置及制造系统
    • US06211686B1
    • 2001-04-03
    • US09126133
    • 1998-07-30
    • Kazuya MatsuzawaYukihito Oowaki
    • Kazuya MatsuzawaYukihito Oowaki
    • G01R3126
    • G01Q40/00H01L22/14H01L22/20Y10S977/854
    • The present invention comprises a SCM measuring apparatus and a control section. A control section adjusts shape data of a probe tip initially inputted based on SCM measurement for a standard specimen and a simulated result by the measuring apparatus, and then performs the SCM measurement by a standard specimen, and then on the basis of the measuring result, a impurity distribution is assumed. Next, the impurity distribution is adjusted so that the CV property calculated by the SCM simulation coincides with the CV property measured by the SCM measuring apparatus, and then the CV property is calculated again. The impurity distribution in case both of the CV properties coincide with each other is determined as a definitive impurity distribution. The definitive impurity distribution is outputted to a display apparatus, a printer, and so on. Therefore, it is possible to analyze the impurity distribution with accuracy smaller than a width of the probe tip.
    • 本发明包括一个SCM测量装置和一个控制部分。 控制部根据标准样本的基于SCM测量的最初输入的探针尖端的形状数据和由测量装置的模拟结果进行调整,然后通过标准样本进行SCM测量,然后基于测量结果, 假定杂质分布。 接下来,调整杂质分布,使得通过SCM模拟计算的CV性质与由SCM测量装置测量的CV性质一致,然后再次计算CV性质。 在两种CV性质彼此一致的情况下的杂质分布被确定为确定的杂质分布。 确定的杂质分布被输出到显示装置,打印机等。 因此,可以精度小于探针尖端的宽度来分析杂质分布。
    • 9. 发明授权
    • Dynamic random access memory device with the combined open/folded
bit-line pair arrangement
    • 具有组合打开/折叠位线对布置的动态随机存取存储器件
    • US5838038A
    • 1998-11-17
    • US478620
    • 1995-06-07
    • Daisaburo TakashimaShigeyoshi WatanabeTohru OzakiTakeshi HamamotoYukihito Oowaki
    • Daisaburo TakashimaShigeyoshi WatanabeTohru OzakiTakeshi HamamotoYukihito Oowaki
    • G11C7/18H01L27/108
    • G11C7/18G11C2211/4013
    • A semiconductor memory device includes active regions arranged on a semiconductor substrate such that those of the active regions which are adjacent in the word line direction deviate in the bit line direction, MOS transistors respectively formed in the active regions and each having a source and a drain one of which is connected to the bit line, a plurality of trenches each arranged to another set of source an drain regions and arranged to deviate in the word line direction in the respective active regions, those of the trenches which are adjacent with a through word line disposed therebetween being arranged to deviate in the bit line direction so as to be set closer to each other, a plurality of storage electrodes respectively formed in the trenches with capacitor insulative films disposed therebetween, and connection electrodes arranged between the word lines and each connecting the other of the source and drain to the storage electrode.
    • 半导体存储器件包括布置在半导体衬底上的有源区域,使得在字线方向上相邻的有源区域在位线方向偏离的有源区域分别形成在有源区域中并且各自具有源极和漏极 其中一个连接到位线,多个沟槽,每个沟槽被布置成另一组源极漏极区域,并且被布置成在相应的有源区域中的字线方向偏离,与通过字相邻的沟槽的那些沟槽 配置在它们之间的线被布置为在位线方向上偏离以使得彼此更靠近,分别形成在沟槽中的多个存储电极,其中设置有电容器绝缘膜,以及布置在字线和每个连接之间的连接电极 另一个源极和漏极到存储电极。