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1. 发明授权

US06459259B1 Tester for semiconductor devices and test tray used for the same 失效
标题翻译：用于半导体器件和测试托盘的测试仪用于相同
公开(公告)号：US06459259B1
公开(公告)日：2002-10-01
申请号：US09254084
申请日：1999-02-26
申请人： Akihiko Ito , Yoshihito Kobayashi , Yoshiyuki Masuo , Tsuyoshi Yamashita
发明人： Akihiko Ito , Yoshihito Kobayashi , Yoshiyuki Masuo , Tsuyoshi Yamashita
IPC分类号： B65G4300
CPC分类号： G01R31/2893 , G01R31/01 , G01R31/2851 , G01R31/2867
摘要： An IC tester which is capable of reducing the time required before completion of testing on all of ICs to be tested is provided. The depth (length in the Y-axis direction) of the constant temperature chamber 4 and the exit chamber 5 is expanded by a dimension corresponding approximately to one transverse width (length of the minor edge) of the rectangular test tray 3, and two generally parallel test tray transport paths or alternatively a widened test tray transport path broad enough to transport two test trays simultaneously with the two test trays juxtaposed in a direction transverse to the widened test tray transport path are provided in the section of test tray transport path extending from the soak chamber 41 in the constant temperature chamber 4 through the testing section 42 in the constant temperature chamber 4 to the exit chamber 5 so that two test trays may be simultaneously transported along the two test tray transport paths or the widened test tray transport path.
摘要翻译：提供了一种能够在所有要测试的IC上测试完成之前减少所需时间的IC测试器。恒温室4和出口室5的深度（Y轴方向的长度）以相当于矩形试验盘3的一个横向宽度（小边的长度）的尺寸扩大，平行的测试托盘传送路径或者可选地，加宽的测试托盘传送路径足够宽以与横向于加宽的测试托盘传送路径的方向并置的两个测试托盘同时传送两个测试托盘设置在从托盘传送路径延伸的部分恒温室4中的浸泡室41通过恒温室4中的检测部分42到出口室5，从而沿着两个试纸盘传送路径或加宽的试纸盘传送路径同时传送两个试纸盘。

2. 发明授权

US06384360B1 IC pickup, IC carrier and IC testing apparatus using the same 有权
标题翻译： IC卡，IC载体和IC测试装置
公开(公告)号：US06384360B1
公开(公告)日：2002-05-07
申请号：US09330151
申请日：1999-06-11
申请人： Yoshiyuki Masuo , Yoshihito Kobayashi
发明人： Yoshiyuki Masuo , Yoshihito Kobayashi
IPC分类号： B25J1506
CPC分类号： H05K13/0452 , H05K13/0409
摘要： A pad 1051, air cylinder 1052, cylinder control valve 1053, vacuum generator 1054, feed valve 1055, break valve 1056, and pressure sensor 1057 are assembled together to form an IC pickup 105d.
摘要翻译：垫1051，气缸1052，气缸控制阀1053，真空发生器1054，进给阀1055，断开阀1056和压力传感器1057组装在一起以形成IC拾取器105d。

3. 发明授权

US06856128B2 Semiconductor device testing apparatus and a test tray for use in the testing apparatus 有权
标题翻译：半导体器件测试装置和用于测试装置的测试托盘
公开(公告)号：US06856128B2
公开(公告)日：2005-02-15
申请号：US09964211
申请日：2001-09-25
申请人： Akihiko Ito , Yoshihito Kobayashi , Yoshiyuki Masuo , Tsuyoshi Yamashita
发明人： Akihiko Ito , Yoshihito Kobayashi , Yoshiyuki Masuo , Tsuyoshi Yamashita
IPC分类号： G01R31/01 , G01R31/28 , B65G43/00
CPC分类号： G01R31/2893 , G01R31/01 , G01R31/2851 , G01R31/2867
摘要： An IC tester which is capable of reducing the time required before completion of testing on all of ICs to be tested is provided. The depth (length in the Y-axis direction) of the constant temperature chamber 4 and the exit chamber 5 is expanded by a dimension corresponding approximately to one transverse width (length of the minor edge) of the rectangular test tray 3, and two generally parallel test tray transport paths or alternatively a widened test tray transport path broad enough to transport two test trays simultaneously with the two test trays juxtaposed in a direction transverse to the widened test tray transport path are provided in the section of test tray transport path extending from the soak chamber 41 in the constant temperature chamber 4 through the testing section 42 in the constant temperature chamber 4 to the exit chamber 5 so that two test trays may be simultaneously transported along the two test tray transport paths or the widened test tray transport path.
摘要翻译：提供了一种能够在所有要测试的IC上测试完成之前减少所需时间的IC测试器。恒温室4和出口室5的深度（Y轴方向的长度）以相当于矩形试验盘3的一个横向宽度（小边的长度）的尺寸扩大，平行的测试托盘传送路径或者可选地，加宽的测试托盘传送路径足够宽以与横向于加宽的测试托盘传送路径的方向并置的两个测试托盘同时传送两个测试托盘设置在从托盘传送路径延伸的部分恒温室4中的浸泡室41通过恒温室4中的检测部分42到出口室5，从而沿着两个试纸盘传送路径或加宽的试纸盘传送路径同时传送两个试纸盘。

4. 发明授权

US06384593B1 Semiconductor device testing apparatus 失效
标题翻译：半导体器件测试仪器
公开(公告)号：US06384593B1
公开(公告)日：2002-05-07
申请号：US09596062
申请日：2000-06-16
申请人： Yoshihito Kobayashi , Tsuyoshi Yamashita , Hiroto Nakamura , Shin Nemoto , Yoshiyuki Masuo , Akihiko Ito
发明人： Yoshihito Kobayashi , Tsuyoshi Yamashita , Hiroto Nakamura , Shin Nemoto , Yoshiyuki Masuo , Akihiko Ito
IPC分类号： G01R3128
CPC分类号： G01R31/2868
摘要： A semiconductor device testing apparatus having a reduced transverse width and compact in size is provided. Adjacent to a constant temperature chamber containing therein a vertical transport means is located a test chamber which is in turn adjoined by a temperature-stress removing chamber likewise containing therein a vertical transport means, so that the constant temperature chamber and the test chamber are arranged transversely in a line, while the temperature-stress removing chamber is located in front of the test chamber when viewed in front view of the apparatus. Further, a loader section is located in front of the constant temperature chamber, and an unloader section is located above the temperature-stress removing chamber. With this arrangement, the transverse width of the testing apparatus may be reduced to about two test tray lengths.
摘要翻译：提供了具有减小的横向宽度并且尺寸紧凑的半导体器件测试装置。在其中容纳有垂直输送装置的恒温室附近设有试验室，该试验室又由同样含有垂直输送装置的温度应力消除室邻接，使得恒温室和试验室横向布置在该装置的正视图中观察时，温度应力消除室位于测试室的前方。此外，装载部位于恒温室前方，卸载部位于温度应力消除室的上方。通过这种布置，测试装置的横向宽度可以减小到大约两个测试托盘长度。

5. 发明授权

US6104183A Semiconductor device testing apparatus 失效
标题翻译：半导体器件测试仪器
公开(公告)号：US6104183A
公开(公告)日：2000-08-15
申请号：US809243
申请日：1997-05-28
申请人： Yoshihito Kobayashi , Tsuyoshi Yamashita , Hiroto Nakamura , Shin Nemoto , Yoshiyuki Masuo , Akihiko Ito
发明人： Yoshihito Kobayashi , Tsuyoshi Yamashita , Hiroto Nakamura , Shin Nemoto , Yoshiyuki Masuo , Akihiko Ito
IPC分类号： G01R31/26 , G01R31/28 , H01L21/677
CPC分类号： G01R31/2868
摘要： A semiconductor device testing apparatus having a reduced transverse width and compact in size is provided. Adjacent to a constant temperature chamber 101 containing therein a vertical transport means is located a test chamber 102 which is in turn adjoined by a temperature-stress removing chamber 103 likewise containing therein a vertical transport means, so that the constant temperature chamber 101, the test chamber 102 and the temperature-stress removing chamber 103 are arranged transversely in a line. Further, a loader section 300 is located in front of the constant temperature chamber, and an unloader section 400 is located in front of the test chamber and the temperature-stress removing chamber. With this arrangement, the transverse width of the testing apparatus may be reduced to about three test tray lengths.
摘要翻译： PCT No.PCT / JP96 / 02067 Sec。 371日期1997年5月28日 102（e）日期1997年5月28日PCT提交1996年7月24日PCT公布。出版物WO97 / 05495 日期：1997年2月13日提供了具有减小的横向宽度和尺寸紧凑的半导体器件测试装置。在其中容纳有垂直传送装置的恒温室101附近设置有测试室102，测试室102又由同样包含垂直传送装置的温度应力消除室103邻接，使得恒温室101，测试室102和温度应力消除室103横向排列成一行。此外，装载部300位于恒温室前方，卸载部400位于试验室前方和温度应力消除室。通过这种布置，测试装置的横向宽度可以减小到约三个测试托盘长度。

6. 外观设计

USD442568S1 IC module insert 失效
标题翻译： IC模块插入
公开(公告)号：USD442568S1
公开(公告)日：2001-05-22
申请号：US29120362
申请日：2000-03-20
申请人： Yoshiyuki Masuo , Toshiyuki Kiyokawa , Hiroyuki Takahashi
设计人： Yoshiyuki Masuo , Toshiyuki Kiyokawa , Hiroyuki Takahashi

7. 发明申请

US20090189631A1 MOVEMENT APPARATUS AND ELECTRONIC DEVICE TEST APPARATUS 审中-公开
标题翻译：运动装置和电子装置测试装置
公开(公告)号：US20090189631A1
公开(公告)日：2009-07-30
申请号：US12280757
申请日：2007-02-21
申请人： Kenichi Shimada , Yoshiyuki Masuo
发明人： Kenichi Shimada , Yoshiyuki Masuo
IPC分类号： G01R31/26
CPC分类号： G01R31/2893
摘要： An air cylinder raising and lowering a pickup head for holding an IC device in an electronic device test apparatus, the air cylinder includes a cylinder tube; a piston; a first hollow chamber formed below the piston; a second hollow chamber formed above the piston and being larger than the first hollow chamber in terms of a pressure receiving area of the piston; and a rod with one end coupled with the piston and the other end coupled with the pickup head. The first hollow chamber is connected to the air feed device via a first feed system in which the air feed is secured even if the electric power supply of the electronic device test apparatus is cut off, and the second hollow chamber is connected to the air feed device via a second feed system having a shutoff valve.
摘要翻译：一种用于将IC器件保持在电子设备测试装置中的用于升高和降低拾取头的气缸，气缸包括气缸筒; 活塞形成在活塞下方的第一中空室; 形成在活塞上方的第二中空室，并且在活塞的受压面积方面大于第一中空室; 以及杆，其一端与活塞联接，另一端与拾取头相连。第一中空室经由第一进料系统连接到空气供给装置，即使电子装置测试装置的电力供应被切断，空气进料被固定，第二中空室连接到空气进料装置通过具有截止阀的第二进料系统。

8. 发明申请

US20090027060A1 ADAPTER AND INTERFACE AND ELECTRONIC DEVICE TEST APPARATUS PROVIDED WITH ADAPTER 审中-公开
标题翻译：适配器和接口和电子设备测试装置提供适配器
公开(公告)号：US20090027060A1
公开(公告)日：2009-01-29
申请号：US11912709
申请日：2006-05-18
申请人： Daisuke Takano , Yoshiyuki Masuo
发明人： Daisuke Takano , Yoshiyuki Masuo
IPC分类号： G01R1/02
CPC分类号： G01R1/07378
摘要： An adapter able to reduce the costs of an electronic device test apparatus, the adapter having a frame member interposed, between an opening formed at a handler and a HIFIX attached to a test head and inserted in the opening for adapting the shape of the HIFIX to the shape of the opening.
摘要翻译：一种适配器，其能够降低电子设备测试装置的成本，所述适配器具有框架构件，插入在处理器形成的开口和附接到测试头的HIFIX之间，并插入到开口中以使HIFIX的形状适应于开口的形状。

9. 发明授权

US07919974B2 Electronic device test apparatus and method of configuring electronic device test apparatus 失效
标题翻译：电子设备测试仪器及配置电子设备测试仪器的方法
公开(公告)号：US07919974B2
公开(公告)日：2011-04-05
申请号：US11570682
申请日：2005-07-22
申请人： Kazuyuki Yamashita , Yoshiyuki Masuo
发明人： Kazuyuki Yamashita , Yoshiyuki Masuo
IPC分类号： G01R31/28 , G01R31/26
CPC分类号： G01R31/31718 , G01R31/2865 , G01R31/2868 , G01R31/2893 , G01R31/31905
摘要： A handler is configured by, separably and connectably, a plurality of types of handling modules of different throughputs and a plurality of types of test modules of different numbers of simultaneous measurements and/or test temperatures. Based on the maximum number of measurable pins of the tester outputting a test pattern and examining a response pattern, the number of terminals of the DUTs, and the test time, the throughput of the handling module and the number of simultaneous measurements and/or test temperature of the test module are selected and combined.
摘要翻译：处理机通过可分离和可连接地配置具有不同数量的同时测量和/或测试温度的不同吞吐量和多种类型的测试模块的多种类型的处理模块。基于输出测试模式的测试仪的可测量引脚的数量和检查响应模式，DUT的终端数量和测试时间，处理模块的吞吐量以及同时测量和/或测试的数量选择并组合测试模块的温度。

10. 发明申请

US20080074118A1 Pick-And-Place Mechanism Of Electronic Device, Electronic Device Handling Apparatus And Suction Method Of Electronic Device 审中-公开
标题翻译：电子装置的拾取和放置机构，电子装置处理装置和电子装置的抽吸方法
公开(公告)号：US20080074118A1
公开(公告)日：2008-03-27
申请号：US11887619
申请日：2005-04-07
申请人： Yoshiyuki Masuo
发明人： Yoshiyuki Masuo
IPC分类号： G01R31/02 , B23P19/00
CPC分类号： G01R31/2891 , G01R31/2893 , Y10T29/53187 , Y10T29/53191
摘要： A translatory type actuator 503 for moving a support member 502 supporting the suction head 501 up and down between an upper stroke end and a lower stroke end; and a servo actuator 504 for lowering the support member 502 and the suction head 501 together with the translatory type actuator 503 while controlling a speed thereof in a state that the support member 502 is at the lower stroke end so as to bring the suction head 501 contact with an electronic device 2; are included. According to this pick-and-place mechanism 500, an impact load acting on an electronic device 2 at the time of picking up the electronic device 2 by the suction head 501 can be reduced as much as possible.
摘要翻译：平移式致动器503，用于在上行程端和下行程端之间上下移动支撑着吸头501的支撑构件502; 以及伺服致动器504，用于在支撑构件502处于下行程端的状态下同时降低支撑构件502和抽吸头501，同时控制其速度，从而使抽吸头501 与电子设备2接触; 包括在内。根据该取放机构500，能够尽可能地减少在通过吸头501拾取电子设备2时作用在电子设备2上的冲击载荷。

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