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    • 1. 发明授权
    • Positive photosensitive material
    • 正感光材料
    • US09012126B2
    • 2015-04-21
    • US13524790
    • 2012-06-15
    • Weihong LiuPingHung LuChunwei ChenStephen MeyerMedhat ToukhySookMee Lai
    • Weihong LiuPingHung LuChunwei ChenStephen MeyerMedhat ToukhySookMee Lai
    • G03F7/039G03F7/004
    • G03F7/004G03F7/0392G03F7/0397
    • The invention relates to a novel positive working photosensitive composition having: at least one photoacid generator; at least one novolak polymer; at least one polymer, having a polymer backbone, said polymer comprising a structure of the following formula: wherein R1-R5 are, independently, —H or —CH3, A is a linear or branched C1-C10 alkylene group, B is a C1-C12 alkyl or alicyclic group, D is a linking group that may be a chemical bond, a carboxylate group, wherein the carbonyl carbon is bonded to the polymer backbone, or a —COOCH2— group, wherein the carbonyl carbon is bonded to the polymer backbone, Ar is a substituted or unsubstituted aromatic group or heteroaromatic group, E is a linear or branched C2-C10 alkylene group, G is an acid cleavable group. The invention further relates to a process for using the novel composition for forming an image.
    • 本发明涉及一种新型的正性光敏组合物,其具有:至少一种光致酸发生剂; 至少一种酚醛清漆聚合物; 至少一种具有聚合物主链的聚合物,所述聚合物包含下式的结构:其中R 1 -R 5独立地是-H或-CH 3,A是直链或支链C 1 -C 10亚烷基,B是C1 -C 12烷基或脂环基,D是可以是化学键的连接基团,其中羰基碳键合到聚合物主链上的羧酸酯基团或-COOCH 2 - 基团,其中羰基碳键合到聚合物上 骨架,Ar是取代或未取代的芳基或杂芳基,E是直链或支链C 2 -C 10亚烷基,G是酸可裂解基团。 本发明还涉及使用该组合物形成图像的方法。
    • 4. 发明申请
    • Process for producing an image using a first minimum bottom antireflective coating composition
    • 使用第一最小底部抗反射涂料组合物制造图像的方法
    • US20060199103A1
    • 2006-09-07
    • US11416240
    • 2006-05-02
    • Mark NeisserJoseph OberlanderMedhat ToukhyRaj SakamuriShuji Ding-Lee
    • Mark NeisserJoseph OberlanderMedhat ToukhyRaj SakamuriShuji Ding-Lee
    • G03F7/004
    • G03F7/091G03F7/095Y10S430/151
    • Disclosed is a process for forming an image on a substrate, comprising the steps of: (a) coating on the substrate a first layer of a radiation sensitive, antireflective composition; (b) coating a second layer of a photoresist composition onto the first layer of the antireflective composition; (c) selectively exposing the coated substrate from step (b) to actinic radiation; and (d) developing the exposed coated substrate from step (c) to form an image; wherein both the photoresist composition and the antireflective composition are exposed in step (c); both are developed in step (d) using a single developer; wherein the antireflective composition of step (a) is a first minimum bottom antireflective coating (B.A.R.C.) composition, having a solids content of up to about 8% solids, and a maximum coating thickness of the coated substrate of λ/2n wherein λ is the wavelength of the actinic radiation of step (c) and n is the refractive index of the B.A.R.C. composition.
    • 公开了一种在衬底上形成图像的方法,包括以下步骤:(a)在衬底上涂覆第一层辐射敏感的抗反射组合物; (b)将第二层光致抗蚀剂组合物涂覆到抗反射组合物的第一层上; (c)将涂覆的基材从步骤(b)选择性暴露于光化辐射; 和(d)将来自步骤(c)的曝光的涂覆的基底显影以形成图像; 其中在步骤(c)中曝光光致抗蚀剂组合物和抗反射组合物; 在步骤(d)中使用单个显影剂开发两者; 其中步骤(a)的抗反射组合物是第一最小底部抗反射涂层(BARC)组合物,其固体含量高达约8%固体,并且涂覆的基底的最大涂层厚度为λ/ 2n,其中λ为 步骤(c)的光化辐射的波长,n是BARC的折射率 组成。