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    • 4. 发明申请
    • Process for producing an image using a first minimum bottom antireflective coating composition
    • 使用第一最小底部抗反射涂料组合物制造图像的方法
    • US20060199103A1
    • 2006-09-07
    • US11416240
    • 2006-05-02
    • Mark NeisserJoseph OberlanderMedhat ToukhyRaj SakamuriShuji Ding-Lee
    • Mark NeisserJoseph OberlanderMedhat ToukhyRaj SakamuriShuji Ding-Lee
    • G03F7/004
    • G03F7/091G03F7/095Y10S430/151
    • Disclosed is a process for forming an image on a substrate, comprising the steps of: (a) coating on the substrate a first layer of a radiation sensitive, antireflective composition; (b) coating a second layer of a photoresist composition onto the first layer of the antireflective composition; (c) selectively exposing the coated substrate from step (b) to actinic radiation; and (d) developing the exposed coated substrate from step (c) to form an image; wherein both the photoresist composition and the antireflective composition are exposed in step (c); both are developed in step (d) using a single developer; wherein the antireflective composition of step (a) is a first minimum bottom antireflective coating (B.A.R.C.) composition, having a solids content of up to about 8% solids, and a maximum coating thickness of the coated substrate of λ/2n wherein λ is the wavelength of the actinic radiation of step (c) and n is the refractive index of the B.A.R.C. composition.
    • 公开了一种在衬底上形成图像的方法,包括以下步骤:(a)在衬底上涂覆第一层辐射敏感的抗反射组合物; (b)将第二层光致抗蚀剂组合物涂覆到抗反射组合物的第一层上; (c)将涂覆的基材从步骤(b)选择性暴露于光化辐射; 和(d)将来自步骤(c)的曝光的涂覆的基底显影以形成图像; 其中在步骤(c)中曝光光致抗蚀剂组合物和抗反射组合物; 在步骤(d)中使用单个显影剂开发两者; 其中步骤(a)的抗反射组合物是第一最小底部抗反射涂层(BARC)组合物,其固体含量高达约8%固体,并且涂覆的基底的最大涂层厚度为λ/ 2n,其中λ为 步骤(c)的光化辐射的波长,n是BARC的折射率 组成。