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    • 2. 发明授权
    • Path gate driver circuit
    • 路径驱动电路
    • US06728160B1
    • 2004-04-27
    • US10243433
    • 2002-09-12
    • Tien-Chun YangKurihara KazuhiroPau-Ling Chen
    • Tien-Chun YangKurihara KazuhiroPau-Ling Chen
    • G11C800
    • G11C16/24G11C7/1051G11C7/12
    • A path gate driver circuit of the present invention includes a shunt stage, a level shifter stage, a pull-up stage, and an output stage. The shunt stage has a control terminal coupled to a supply, and an input terminal coupled to a control signal path. The level shifter stage has a first control terminal coupled to the control signal path, a second control terminal coupled to an output terminal of the shunt stage, a first input terminal coupled to a boost-low supply, and a second input terminal coupled to a boost-high supply. The pull-up stage has a control terminal coupled to an output terminal of the level shifter stage, and an input terminal coupled to the boost-high supply. The output stage has a first control terminal coupled to the output terminal of the shunt stage and an output terminal of the pull-up stage, a second control terminal coupled to the control signal path a first input terminal coupled to the boost-low supply, and a second input terminal coupled to the boost-high supply. A boosted control signal is provided at the output terminal of the output stage in response to the control.
    • 本发明的路径栅极驱动电路包括分路级,电平转换级,上拉级和输出级。 分流级具有耦合到电源的控制端子和耦合到控制信号路径的输入端子。 电平移位器级具有耦合到控制信号路径的第一控制端,耦合到并联级的输出端的第二控制端,耦合到升压低电源的第一输入端和耦合到 增加高的供应。 上拉级具有耦合到电平移位器级的输出端子的控制端子和耦合到升压高电源的输入端子。 输出级具有耦合到并联级的输出端和上拉级的输出端的第一控制端,耦合到控制信号路径的第二控制端,耦合到升压低电源的第一输入端, 以及耦合到所述升压高电源的第二输入端子。 响应于该控制,在输出级的输出端提供升压控制信号。
    • 3. 发明授权
    • Flexible cascode amplifier circuit with high gain for flash memory cells
    • 闪存单元具有高增益的灵活的共源共栅放大器电路
    • US07026843B1
    • 2006-04-11
    • US10759855
    • 2004-01-16
    • Tien-Chun YangPau-Ling Chen
    • Tien-Chun YangPau-Ling Chen
    • G01R19/00
    • G11C16/26G11C7/062
    • An exemplary cascode amplifier circuit comprises a first intrinsic FET, a second intrinsic FET, a third intrinsic FET, and a fourth FET. The first intrinsic FET has a source connected to a target memory cell via a bit line and a drain connected to a first node. The second intrinsic FET has a gate connected to the source of the first intrinsic FET and a source connected to a reference voltage. The second intrinsic FET also has a drain connected at a second node to a gate of the first intrinsic FET. The third intrinsic FET has a source connected to the first node and a gate connected to a supply voltage, and further provides a load across the supply voltage and the first node. The fourth FET has a source connected to the second node and a drain connected to the supply voltage, the fourth FET having a gate connected to an input control voltage.
    • 示例性共源共栅放大器电路包括第一本征FET,第二本征FET,第三本征FET和第四FET。 第一本征FET具有经由位线连接到目标存储器单元的源极和连接到第一节点的漏极。 第二本征FET具有连接到第一本征FET的源极的栅极和连接到参考电压的源极。 第二本征FET还具有在第二节点处连接到第一本征FET的栅极的漏极。 第三本征FET具有连接到第一节点的源极和连接到电源电压的栅极,并且进一步在电源电压和第一节点之间提供负载。 第四FET具有连接到第二节点的源极和连接到电源电压的漏极,第四FET具有连接到输入控制电压的栅极。
    • 5. 发明授权
    • Ground structure for page read and page write for flash memory
    • Flash存储器的页面读取和页面写入的接地结构
    • US06859393B1
    • 2005-02-22
    • US10264387
    • 2002-10-04
    • Tien-Chun YangShigekazu YamadaMing-Huei ShiehPau-Ling Chen
    • Tien-Chun YangShigekazu YamadaMing-Huei ShiehPau-Ling Chen
    • G11C16/04
    • G11C16/0466G11C16/0491G11C2216/14
    • A ground structure for page read and page write for flash memory. An array structure of flash memory cells comprises a plurality of sectors. Each sector comprises I/O blocks plus reference arrays and an array of redundant cells. Each I/O block comprises sub I/O blocks. Each sub I/O block within an I/O block, as well as other structures including reference cells, redundant cells and edge structures is coupled to a unique ground reference signal. These unique ground reference signals may be selectively coupled to a system ground or a biased ground reference. This novel ground arrangement enables a page read operation in which one bit from each sub I/O block can be read simultaneously. In addition, one bit from each I/O block may be programmed simultaneously. Further, the ground reference voltage for cells of the array may be selectively adjusted to optimize operation.
    • 用于闪存的页面读取和页面写入的接地结构。 闪存单元的阵列结构包括多个扇区。 每个扇区包括I / O块加参考阵列和冗余单元阵列。 每个I / O块包括子I / O块。 I / O块内的每个子I / O块以及包括参考单元,冗余单元和边缘结构的其他结构都耦合到独特的接地参考信号。 这些独特的接地参考信号可以选择性地耦合到系统接地或偏置的接地参考。 这种新颖的接地布置使得能够同时读取来自每个子I / O块的一个位的页面读取操作。 另外,每个I / O块的一位可以同时编程。 此外,可以选择性地调整阵列的单元的接地参考电压以优化操作。
    • 6. 发明授权
    • Method and system for defining a redundancy window around a particular column in a memory array
    • 用于在存储器阵列中的特定列周围定义冗余窗口的方法和系统
    • US07076703B1
    • 2006-07-11
    • US10305700
    • 2002-11-26
    • Binh Quang LePau-Ling Chen
    • Binh Quang LePau-Ling Chen
    • G11C29/00
    • G11C29/804
    • A method for a memory redundancy, including a memory array typically having a plurality of columns (e.g., bit lines) of memory cells, and identifying a particular (e.g., defective) column of the memory array and further defining a redundancy window by selecting a group of adjacent columns including the defective column. The number of columns in the group of selected columns may be equal to the number of columns in a redundancy array that is coupled to the memory array. The redundancy array is used for storing information that would have been otherwise stored in the memory cells in the redundancy window. The selected group includes at least one column on one side of the defective column and another column on the other side of the defective column. Typically, there will be multiple columns on each side of the defective column.
    • 一种用于存储器冗余的方法,包括通常具有存储器单元的多个列(例如,位线)的存储器阵列,以及识别存储器阵列的特定(例如,有缺陷的)列,并进一步通过选择一个 一组相邻列,包括有缺陷的列。 所选列组中的列数可以等于耦合到存储器阵列的冗余阵列中的列数。 冗余阵列用于存储否则将存储在冗余窗口中的存储器单元中的信息。 所选择的组包括在缺陷列的一侧上的至少一个列和在缺陷列的另一侧上的另一个列。 通常,有缺陷的列的每一侧将有多个列。
    • 8. 发明授权
    • Chained array of sequential access memories enabling continuous read
    • 连续读取串行存取存储器阵列
    • US06622201B1
    • 2003-09-16
    • US09525078
    • 2000-03-14
    • Michael VanBuskirkPau-Ling Chen
    • Michael VanBuskirkPau-Ling Chen
    • G06F1200
    • G11C7/22
    • A sequential access memory structure includes an output bus and a plurality of sequential access memories, each of which is connected to the output bus. Each memory includes a memory array having a plurality of sequentially readable memory elements, a carry output for producing a carry signal when reading of the array has been substantially completed, and a carry input for causing reading of the array in response to a carry signal. The carry output of each memory is connected to a carry input of one other downstream memory respectively in a chain arrangement, and the carry signals cause the arrays to be read sequentially onto the output bus. Each memory further comprises a read-write storage connected between the array and the output bus, the storage including a plurality of sections. Data from the array is loaded into one section of the storage while data is being read from another section of the storage onto the output bus. The sections of memory elements in the array comprise half-pages. The storage comprises two sections, each of which has a half-page of memory elements, and the carry output produces the carry signal prior to reading data from a last half-page of the array out of the storage onto the output bus. Data from the last half-page is read onto the output bus while data from a first half-page of an array of a next downstream memory is being loaded into its storage.
    • 顺序访问存储器结构包括输出总线和多个顺序存取存储器,每个存取存储器连接到输出总线。 每个存储器包括具有多个可顺序读取的存储器元件的存储器阵列,当阵列的读取已基本完成时用于产生进位信号的进位输出,以及用于响应于进位信号而引起阵列读取的进位输入。 每个存储器的进位输出分别以链排列连接到另一个下游存储器的进位输入,并且进位信号使得阵列被顺序读取到输出总线上。 每个存储器还包括连接在阵列和输出总线之间的读写存储器,存储器包括多个部分。 来自阵列的数据被加载到存储的一部分中,同时从存储器的另一部分读取数据到输出总线上。 阵列中的内存元素部分包括半页。 存储器包括两个部分,每个部分具有半页存储器元件,并且进位输出在从阵列的最后半页从存储器中读取数据到输出总线之前产生进位信号。 来自上一个半页的数据被读取到输出总线上,而来自下一个下游存储器阵列的前半页的数据被加载到其存储器中。
    • 9. 发明授权
    • Drain side sensing scheme for virtual ground flash EPROM array with adjacent bit charge and hold
    • 具有相邻位充电和保持的虚拟接地闪速EPROM阵列的漏极检测方案
    • US06510082B1
    • 2003-01-21
    • US09999869
    • 2001-10-23
    • Binh Q. LePau-Ling ChenMichael A. Van BuskirkSantosh K. YachareniMichael S. C. ChungKazuhiro KuriharaShane Hollmer
    • Binh Q. LePau-Ling ChenMichael A. Van BuskirkSantosh K. YachareniMichael S. C. ChungKazuhiro KuriharaShane Hollmer
    • G11C1604
    • G11C16/0491G11C16/28
    • A system is disclosed for producing an indication of the logical state of a flash memory cell for virtual ground flash memory operations. The system comprises a bit line charge and hold circuit which is operable to apply a read sense voltage (e.g., about 1.2 volts) to a bit line associated with the drain terminal of a cell of the flash array adjacent to the cell which is sensed, wherein the applied drain terminal voltage is substantially the same as the cell sense voltage (e.g., about 1.2 volts) applied to the drain terminal bit line of the selected memory cell to be sensed. The system further includes a selective bit line decode circuit which is operable to select the bit lines of a memory cell to be sensed and the bit line of an adjacent cell, and a core cell sensing circuit which is operable to sense a core cell sense current at a bit line associated with a drain terminal of the selected memory cell to be sensed during memory read operations, and produce an indication of the flash memory cell logical state, which is substantially independent of charge sharing leakage current to an adjacent cell.
    • 公开了一种用于产生用于虚拟接地闪速存储器操作的闪存单元的逻辑状态的指示的系统。 该系统包括位线充电和保持电路,其可操作以将读取感测电压(例如,约1.2伏特)施加到与所感测的电池相邻的闪光阵列的单元的漏极端子相关联的位线, 其中所施加的漏极端子电压基本上与施加到要被感测的所选择的存储器单元的漏极端子位线的单元检测电压(例如,约1.2伏特)相同。 该系统还包括选择性位线解码电路,其可操作以选择要感测的存储器单元的位线和相邻单元的位线;以及核心单元感测电路,其可操作以感测核心单元感测电流 在与存储器读取操作期间被感测的所选择的存储器单元的漏极端子相关联的位线处,并产生闪存单元逻辑状态的指示,其基本上与相邻单元的电荷共享泄漏电流无关。