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    • 1. 发明申请
    • PROBE APPARATUS AND SUBSTRATE TRANSFER METHOD
    • 探针装置和底板传送方法
    • US20110107858A1
    • 2011-05-12
    • US12939323
    • 2010-11-04
    • Tadashi ObikaneKazuya YanoHiroshi YamadaMasaru SuzukiYasuhito Yamamoto
    • Tadashi ObikaneKazuya YanoHiroshi YamadaMasaru SuzukiYasuhito Yamamoto
    • G01D21/00
    • G01R31/2893
    • A probe apparatus includes a plurality of prober chamber arranged in a straight line; and a loader chamber having a substrate transfer mechanism that takes out a test target substrate from a container provided in an upper area of the prober chamber, lowers the test target substrate to a height corresponding to a loading/unloading port of the prober chamber, moves in front of a row of the prober chambers in parallel to the row of the prober chambers and transfers the test target substrate into the prober chamber. A reading mechanism for reading information recorded on the test target substrate held on the substrate transfer mechanism is installed at a horizontal moving mechanism that moves the substrate transfer mechanism in front of the row of the prober chambers in parallel to the row of the prober chambers.
    • 探针装置包括以直线布置的多个探针室; 以及具有从设置在探测室的上部区域的容器取出测试对象基板的基板传送机构的装载器室,将检测对象基板降低到与探测室的装载/卸载端口对应的高度,移动 在一排平行于探测室的探测室前面,将测试目标衬底传送到探测室。 用于读取记录在保持在基板转印机构上的测试目标基板上的信息的读取机构安装在水平移动机构上,该水平移动机构使得在一系列探测室中行进的探针室的前方的基板传送机构移动。
    • 2. 发明授权
    • Probe apparatus and substrate transfer method
    • 探针装置和底物转移方法
    • US08726748B2
    • 2014-05-20
    • US12939323
    • 2010-11-04
    • Tadashi ObikaneKazuya YanoHiroshi YamadaMasaru SuzukiYasuhito Yamamoto
    • Tadashi ObikaneKazuya YanoHiroshi YamadaMasaru SuzukiYasuhito Yamamoto
    • G01D21/00
    • G01R31/2893
    • A probe apparatus includes a plurality of prober chamber arranged in a straight line; and a loader chamber having a substrate transfer mechanism that takes out a test target substrate from a container provided in an upper area of the prober chamber, lowers the test target substrate to a height corresponding to a loading/unloading port of the prober chamber, moves in front of a row of the prober chambers in parallel to the row of the prober chambers and transfers the test target substrate into the prober chamber. A reading mechanism for reading information recorded on the test target substrate held on the substrate transfer mechanism is installed at a horizontal moving mechanism that moves the substrate transfer mechanism in front of the row of the prober chambers in parallel to the row of the prober chambers.
    • 探针装置包括以直线布置的多个探针室; 以及具有从设置在探测室的上部区域的容器取出测试对象基板的基板传送机构的装载器室,将检测对象基板降低到与探测室的装载/卸载端口对应的高度,移动 在一排平行于探测室的探测室前面,将测试目标衬底传送到探测室。 用于读取记录在保持在基板转印机构上的测试目标基板上的信息的读取机构安装在水平移动机构上,该水平移动机构使得在一系列探测室中行进的探针室的前面的基板传送机构移动。
    • 5. 发明授权
    • Probe apparatus, probing method, and storage medium
    • 探头装置,探测方法和存储介质
    • US07859283B2
    • 2010-12-28
    • US12389913
    • 2009-02-20
    • Yasuhito YamamotoMasaru SuzukiJunichi Hagihara
    • Yasuhito YamamotoMasaru SuzukiJunichi Hagihara
    • G01R31/02
    • G01R31/2893
    • A probe apparatus is capable of being scaled-down and reducing a manufacturing cost thereof in a probe apparatus having a plurality of probe apparatus main bodies. A loader unit for transferring a wafer between carriers accommodating therein wafers and the probe apparatus main bodies includes: an upper camera for imaging the arrangement of chips to be inspected of the wafer; a lower camera for imaging probe needles; an X-Y-Θ stage for moving the position of the wafer W in a horizontal direction and a second loader mechanism for moving the wafer in a vertical direction. Accordingly, a fine alignment of the wafer is performed by the loader unit to adjust the position of the wafer.
    • 探针装置能够在具有多个探针装置主体的探针装置中进行比例缩小并降低其制造成本。 用于在容纳晶片的载体和所述探针装置主体之间传送晶片的装载单元包括:用于对要被检查的晶片的芯片的布置进行成像的上摄像机; 用于成像探针的下部相机; 用于沿水平方向移动晶片W的位置的X-Y-θ级和用于沿垂直方向移动晶片的第二加载机构。 因此,通过装载单元执行晶片的精细对准以调整晶片的位置。
    • 8. 发明申请
    • PROBE APPARATUS, PROBING METHOD, AND STORAGE MEDIUM
    • 探测设备,探测方法和存储介质
    • US20090212803A1
    • 2009-08-27
    • US12389913
    • 2009-02-20
    • Yasuhito YamamotoMasaru SuzukiJunichi Hagihara
    • Yasuhito YamamotoMasaru SuzukiJunichi Hagihara
    • G01R31/02
    • G01R31/2893
    • A probe apparatus is capable of being scaled-down and reducing a manufacturing cost thereof in a probe apparatus having a plurality of probe apparatus main bodies. A loader unit for transferring a wafer between carriers accommodating therein wafers and the probe apparatus main bodies includes: an upper camera for imaging the arrangement of chips to be inspected of the wafer; a lower camera for imaging probe needles; an X-Y-Θ stage for moving the position of the wafer W in a horizontal direction and a second loader mechanism for moving the wafer in a vertical direction. Accordingly, a fine alignment of the wafer is performed by the loader unit to adjust the position of the wafer.
    • 探针装置能够在具有多个探针装置主体的探针装置中进行比例缩小并降低其制造成本。 用于在容纳晶片的载体和所述探针装置主体之间传送晶片的装载单元包括:用于对要被检查的晶片的芯片的布置进行成像的上摄像机; 用于成像探针的下部相机; 用于在水平方向上移动晶片W的位置的X-Y-θ级和用于沿垂直方向移动晶片的第二加载机构。 因此,通过装载单元执行晶片的精细对准以调整晶片的位置。