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    • 5. 发明授权
    • Automatic pipetting and analyzing device
    • 自动移液分析装置
    • US07541001B2
    • 2009-06-02
    • US11285965
    • 2005-11-23
    • Wolfgang KraemerFrank TempelThomas Moore
    • Wolfgang KraemerFrank TempelThomas Moore
    • B01L3/02
    • G01N35/109G01N2035/1051
    • An automatic pipetting and analyzing device for the preparation and analysis of samples in the wells of a microtitration plate has a work platform on which positioning areas for auxiliary devices and a movement area for the sample plate are provided, a passive mechanical table without its own drive unit, the sample plate lying within the inner passive slide of the passive mechanical table, and an active mechanical table which is arranged above the passive mechanical table and by which a pipetting head can be moved in X-Y direction over the work platform in order to extract, transport and dispense liquids by at least one pipetting channel and in order to displace the sample plate by a coupling connection with the inner passive slide, for example, to place the sample plate in an incubator or to position it with the individual wells in an analysis device.
    • 用于制备和分析微量滴定板孔中的样品的自动移液和分析装置具有工作平台,其上设有用于辅助装置的定位区域和样品板的移动区域,无自动驱动的被动机械台 单元,位于被动机械台的内部无源滑动件内的样品板和布置在被动机械台上方的活动机械台,并且移动头可以在XY方向上移动到工作平台上以便提取 ,通过至少一个移液通道运输和分配液体,并且为了通过与内部被动载玻片的联接连接来移动样品板,例如将样品板放置在培养箱中或将其与各个孔定位在一个 分析装置
    • 6. 发明申请
    • Performance analysis support system
    • 绩效分析支持系统
    • US20070250377A1
    • 2007-10-25
    • US11398846
    • 2006-04-05
    • James HillJames FullerThomas Moore
    • James HillJames FullerThomas Moore
    • G06F11/34
    • G06Q10/00G06Q10/06311G06Q10/0635G06Q10/0637G06Q10/06375G06Q10/0639
    • A performance analysis support system is disclosed that provides one or more recommended solutions of a performance improvement project to management and the expected improvement benefit of each solution. The performance analysis support system guides a user through a detailed, consistent analysis process, helping organizational leaders accurately diagnose critical performance or productivity issues. Then, the performance analysis support system estimates the personnel and equipment requirements, time, costs, and return on investment associated with each solution generated based on the analysis results. In addition, the performance analysis support system provides management immediate access to ongoing and past analyses.
    • 公开了一种性能分析支持系统,该系统为管理提供了一个或多个推荐的性能改进项目解决方案,以及每个解决方案的预期改进优势。 绩效分析支持系统通过详细,一致的分析过程来指导用户,帮助组织领导者准确地诊断关键绩效或生产力问题。 然后,绩效分析支持系统根据分析结果估算与每个生成的解决方案相关的人员和设备要求,时间,成本和投资回报。 此外,绩效分析支持系统使管理人员能够立即访问正在进行的和过去的分析。
    • 7. 发明授权
    • Apparatus and method of detecting probe tip contact with a surface
    • 检测探针尖端与表面接触的装置和方法
    • US07208724B2
    • 2007-04-24
    • US11266678
    • 2005-11-03
    • Thomas MooreLyudmila Zaykova-Feldman
    • Thomas MooreLyudmila Zaykova-Feldman
    • H01J3/14G01J5/08G01B5/28G01R31/02
    • H01J37/22B82Y35/00H01J37/20H01J37/3056H01J2237/20H01J2237/202H01J2237/204H01J2237/206H01J2237/208H01J2237/2482H01J2237/28H01J2237/31745
    • We disclose an apparatus and method for detecting probe-tip contact with a surface, generally inside a focused ion-beam instrument, where the probe tip is attached to a capsule, and the capsule is movably secured in a probe shaft. There is a fiber-optic cable having a first end and a second end; a beam splitter having first and second output ports; and a light source connected to the beam splitter. The first output port of the beam splitter is connected to the first end of the fiber-optic cable, and the second output port of the beam splitter is connected to a photodiode. The second end of the fiber-optic cable has a mirror for reflecting incident light at approximately a ninety-degree angle to the axis of the optical path in the fiber-optic cable and onto the capsule, so that the intensity of the light reflected back from the capsule through the fiber-optic cable is proportional to the deflection of the capsule as the probe tip makes contact with the surface.
    • 我们公开了一种用于检测与通常在聚焦离子束仪器内的表面的探针 - 尖端接触的装置和方法,其中探针尖端附接到胶囊,并且胶囊可移动地固定在探针轴中。 存在具有第一端和第二端的光纤电缆; 具有第一和第二输出端口的分束器; 以及连接到分束器的光源。 分束器的第一输出端口连接到光纤电缆的第一端,并且分束器的第二输出端口连接到光电二极管。 光纤电缆的第二端具有反射镜,用于将入射光与光纤电缆中的光路的轴线大约九十度角反射到胶囊上,使得光的强度反射回 当胶囊通过光纤电缆与探针尖端与表面接触时胶囊的偏转成正比。
    • 8. 发明申请
    • Apparatus and method of detecting probe tip contact with a surface
    • 检测探针尖端与表面接触的装置和方法
    • US20060091302A1
    • 2006-05-04
    • US11266678
    • 2005-11-03
    • Thomas MooreLyudmila Zaykova-Feldman
    • Thomas MooreLyudmila Zaykova-Feldman
    • G01J1/04H01J3/14G01J5/08
    • H01J37/22B82Y35/00H01J37/20H01J37/3056H01J2237/20H01J2237/202H01J2237/204H01J2237/206H01J2237/208H01J2237/2482H01J2237/28H01J2237/31745
    • We disclose an apparatus and method for detecting probe-tip contact with a surface, generally inside a focused ion-beam instrument, where the probe tip is attached to a capsule, and the capsule is movably secured in a probe shaft. There is a fiber-optic cable having a first end and a second end; a beam splitter having first and second output ports; and a light source connected to the beam splitter. The first output port of the beam splitter is connected to the first end of the fiber-optic cable, and the second output port of the beam splitter is connected to a photodiode. The second end of the fiber-optic cable has a mirror for reflecting incident light at approximately a ninety-degree angle to the axis of the optical path in the fiber-optic cable and onto the capsule, so that the intensity of the light reflected back from the capsule through the fiber-optic cable is proportional to the deflection of the capsule as the probe tip makes contact with the surface.
    • 我们公开了一种用于检测与通常在聚焦离子束仪器内的表面的探针 - 尖端接触的装置和方法,其中探针尖端附接到胶囊,并且胶囊可移动地固定在探针轴中。 存在具有第一端和第二端的光纤电缆; 具有第一和第二输出端口的分束器; 以及连接到分束器的光源。 分束器的第一输出端口连接到光纤电缆的第一端,并且分束器的第二输出端口连接到光电二极管。 光纤电缆的第二端具有反射镜,用于将入射光与光纤电缆中的光路的轴线大约九十度角反射到胶囊上,使得光的强度反射回 当胶囊通过光纤电缆与探针尖端与表面接触时胶囊的偏转成正比。
    • 10. 发明申请
    • Method and apparatus for in-situ probe tip replacement inside a charged particle beam microscope
    • 用于在带电粒子束显微镜内进行原位探针尖端置换的方法和装置
    • US20060022135A1
    • 2006-02-02
    • US11186073
    • 2005-07-21
    • Thomas MooreLyudmilla Zaykova-Feldman
    • Thomas MooreLyudmilla Zaykova-Feldman
    • G21K7/00
    • H01J37/20H01J37/26H01J2237/2005H01J2237/2006H01J2237/2007H01J2237/201H01J2237/204H01J2237/208H01J2237/26H01J2237/262H01J2237/31745H01J2237/31749
    • We disclose a gripper and associated apparatus and methods for delivering nano-manipulator probe tips inside a vacuum chamber. The gripper includes a tube; a compression cylinder inside of and coaxial with the tube; and at least one elastic ring adjacent to the compression cylinder. There is a vacuum seal coaxial with the compression cylinder for receiving and sealing against a probe tip. An actuator is connected to the compression cylinder for compressing the elastic ring and causing it to grip the probe tip. Thus the probe tip can be gripped, transferred to a different location in the vacuum chamber, and released there. Samples attached to the probe tips will be transferred to a TEM sample holder, shown in several embodiments, that includes a bar having opposed ends; an arm attached to each opposed end of the bar; one or more slots for receiving a probe tip; and, each slot having an inner part and an outer part, where the inner part is smaller than the outer part. The TEM sample holders just described are inserted into a carrier cassette. A cassette for transferring one or more TEM sample holders comprises a platform; at least one bar extending upwardly from the platform; the bar having a groove for receiving and holding a TEM sample holder. A rotatable magazine holds one or more probe tips and selectively releases the tips. The magazine includes a cartridge having a plurality of longitudinal openings for receiving probe tips and dispensing probe tips.
    • 我们公开了一种夹具和相关的装置和方法,用于在真空室内输送纳米机械手探针尖端。 夹具包括管; 压缩缸内部并与管同轴; 以及与压缩圆筒相邻的至少一个弹性环。 存在与压缩筒同轴的真空密封件,用于接收和密封探针尖端。 致动器连接到压缩气缸,用于压缩弹性环并使其夹持探针尖端。 因此,探针尖端可以被夹持,转移到真空室中的不同位置,并在那里释放。 附接到探针尖端的样品将转移到TEM样品保持器,如几个实施方案中所示,其包括具有相对端的棒; 连接到杆的每个相对端的臂; 用于接收探针尖端的一个或多个狭槽; 并且每个狭槽具有内部部分和外部部分,其中内部部分小于外部部分。 刚刚描述的TEM样品架被插入到载体盒中。 用于转移一个或多个TEM样品保持器的盒子包括平台; 从平台向上延伸的至少一个杆; 该棒具有用于容纳和保持TEM样品保持器的凹槽。 一个可旋转刀库可容纳一个或多个探针尖端并选择性地释放尖端。 该盒包括具有多个用于接收探针尖端并分配探针尖端的多个纵向开口的盒。