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    • 7. 发明授权
    • Substrate device having a tuned work function and methods of forming thereof
    • 具有调谐功能的基板装置及其形成方法
    • US08129280B2
    • 2012-03-06
    • US12508820
    • 2009-07-24
    • Rongjun WangXianmin TangDengliang YangZhendong LiuSrinivas Gandikota
    • Rongjun WangXianmin TangDengliang YangZhendong LiuSrinivas Gandikota
    • H01L21/311
    • H01L29/4966H01L21/28088H01L21/823842H01L21/823857H01L29/517
    • Substrate devices having tuned work functions and methods of forming thereof are provided. In some embodiments, forming devices on substrates may include depositing a dielectric layer atop a substrate having a conductivity well; depositing a work function layer comprising titanium aluminum or titanium aluminum nitride having a first nitrogen composition atop the dielectric layer; etching the work function layer to selectively remove at least a portion of the work function layer from atop the dielectric layer; depositing a layer comprising titanium aluminum or titanium aluminum nitride having a second nitrogen composition atop the work function layer and the substrate, wherein at least one of the work function layer or the layer comprises nitrogen; etching the layer and the dielectric layer to selectively remove a portion of the layer and the dielectric layer from atop the substrate; and annealing the substrate at a temperature less than about 1500 degrees Celsius.
    • 提供具有调谐功能的衬底器件及其形成方法。 在一些实施例中,在衬底上形成器件可以包括在具有导电性的衬底顶上淀积介电层; 在所述电介质层的顶部沉积包含具有第一氮组成的钛铝或氮化铝钛的功函数层; 蚀刻功函数层以从电介质层顶部选择性地去除功函数层的至少一部分; 在所述功函数层和所述衬底的顶部上沉积包含具有第二氮组成的钛铝或氮化铝钛的层,其中所述功函数层或所述层中的至少一个包含氮; 蚀刻所述层和所述介电层以从所述衬底顶部选择性地去除所述层和所述电介质层的一部分; 并在低于约1500摄氏度的温度下退火衬底。
    • 10. 发明授权
    • Stabilized, concentratable chemical mechanical polishing composition and method of polishing a substrate
    • 稳定的,可浓缩的化学机械抛光组合物和抛光基材的方法
    • US08568610B2
    • 2013-10-29
    • US12885748
    • 2010-09-20
    • Zhendong LiuYi GuoKancharla-Arun Kumar ReddyGuangyun Zhang
    • Zhendong LiuYi GuoKancharla-Arun Kumar ReddyGuangyun Zhang
    • C09K13/00H01L21/302
    • H01L21/31053C09G1/02
    • A chemical mechanical polishing composition is provided, comprising, as initial components: water, an abrasive; a diquaternary substance according to formula (I); a derivative of guanidine according to formula (II); and, optionally, a quaternary ammonium salt. Also, provided is a method for chemical mechanical polishing of a substrate, comprising: providing a substrate, wherein the substrate comprises silicon dioxide; providing the chemical mechanical polishing composition of the present invention; providing a chemical mechanical polishing pad; creating dynamic contact at an interface between the chemical mechanical polishing pad and the substrate; and dispensing the chemical mechanical polishing composition onto the chemical mechanical polishing pad at or near the interface between the chemical mechanical polishing pad and the substrate; wherein the chemical mechanical polishing composition has a pH of 2 to 6.
    • 提供了一种化学机械抛光组合物,其包括作为初始组分:水,研磨剂; 根据式(I)的二季物质; 根据式(II)的胍衍生物; 和任选的季铵盐。 此外,提供了一种用于基板的化学机械抛光的方法,包括:提供基板,其中所述基板包括二氧化硅; 提供本发明的化学机械抛光组合物; 提供化学机械抛光垫; 在化学机械抛光垫和基底之间的界面处产生动态接触; 以及将化学机械抛光组合物分配到化学机械抛光垫或化学机械抛光垫与基底之间界面附近的化学机械抛光垫上; 其中所述化学机械抛光组合物的pH为2至6。