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    • 2. 发明授权
    • Concurrent logical and physical construction of voltage islands for mixed supply voltage designs
    • 用于混合电源电压设计的并联电压岛的逻辑和物理构造
    • US06792582B1
    • 2004-09-14
    • US09713829
    • 2000-11-15
    • John M CohnAlvar A. DeanDavid J. HathawayDavid E. LackeyThomas M. LepsicSusan K. LichtensteigerScott A. TetreaultSebastian T. Ventrone
    • John M CohnAlvar A. DeanDavid J. HathawayDavid E. LackeyThomas M. LepsicSusan K. LichtensteigerScott A. TetreaultSebastian T. Ventrone
    • G06F1750
    • G06F17/5045G06F17/5068
    • Both logical and physical construction of voltage islands is disclosed. A semiconductor chip design is partitioned into “bins”, which are areas of the design. In this way, a semiconductor chip design may be “sliced” into various areas and the areas may then be assigned to various voltage levels. Each bin may be thought of as a voltage island. Circuits in the design can be added to or removed from the various bins, thereby increasing or decreasing the speed and power of the circuits: the speed and power increase if a circuit is placed into a bin assigned a higher voltage, and the speed and power decrease if a circuit is placed into a bin having a lower voltage. The size and location of the bins may also be changed. By iterating these steps, the optimum power consumption may be met while still meeting speed constraints and other criteria. The present invention is applicable to any placement environment, such as an annealing placement tool, that proceeds through successive refinement of the locations of the circuits on the design and in which the placement process may be interrupted to make changes in placement of the logic.
    • 公开了电压岛的逻辑和物理结构。 半导体芯片设计被划分为“箱”,这是设计的区域。 以这种方式,可以将半导体芯片设计“切片”成各种区域,然后将这些区域分配给各种电压电平。 每个仓可以被认为是电压岛。 设计中的电路可以添加到各个机箱中或从各个机箱中移除,从而增加或减少电路的速度和功率:如果将电路放入分配较高电压的箱体中,速度和功率会增加,速度和功率 如果将电路放置在具有较低电压的箱中,则减小。 还可以改变箱子的大小和位置。 通过迭代这些步骤,可以在满足速度限制和其他标准的同时满足最佳功耗。 本发明可应用于诸如退火放置工具的任何放置环境,其通过连续细化设计上的电路的位置并且其中可以中断放置过程以使逻辑的放置变化。
    • 3. 发明授权
    • Method of automatic latch insertion for testing application specific integrated circuits
    • 用于测试专用集成电路的自动锁存插入方法
    • US06636995B1
    • 2003-10-21
    • US09615146
    • 2000-07-13
    • Alvar A. DeanJoseph A. IadanzaDavid E. LackeySebastian T. Ventrone
    • Alvar A. DeanJoseph A. IadanzaDavid E. LackeySebastian T. Ventrone
    • G01R3128
    • G01R31/318357G06F17/5022
    • A method of testing a digital logic circuit comprises first providing a logic circuit having a plurality of interconnected circuits each having an input and an output; determining a gate level representation of the logic circuit including test nets for determining faults in the circuit; and identifying a portion of the nets which are most difficult to test, including nets which are most difficult to control and nets which are most difficult to observe. The method then includes inserting into the logic circuit control latches for nets which are determined to be most difficult to control and inserting into the logic circuit observation latches for nets which are determined to be most difficult to observe. Using the inserted control latches and observation latches, the method further includes testing the nets which are determined to be most difficult to control and nets which are hardest to observe and determining faults in the circuit. As a result of the method of the present invention, testing is completed in a time faster than if the nets were tested without the control latches and the observation latches. The portion of the nets which are most difficult to test are preferably identified by overall test time impact, and the nets having longest test times are determined to be most difficult to control and most difficult to observe.
    • 一种测试数字逻辑电路的方法包括:首先提供具有多个互连电路的逻辑电路,每个互连电路具有输入和输出; 确定逻辑电路的门级表示,包括用于确定电路中的故障的测试网; 并且识别最难测试的网的一部分,包括最难控制的网和最难观察的网。 该方法然后包括将被确定为最难控制并插入用于被确定为最难观察的网络的逻辑电路观察锁存器的网络的逻辑电路控制锁存器插入。 使用插入的控制锁存器和观察锁存器,该方法还包括测试被确定为最难控制的网络,并且网络中难以观察和确定电路中的故障。 作为本发明的方法的结果,比没有控制锁存器和观察锁存器测试网络的时间更快地完成测试。 最难测试的网的部分优选通过整体测试时间的影响来确定,并且确定具有最长测试时间的网最难以控制并且最难观察。