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    • 1. 发明授权
    • Concurrent logical and physical construction of voltage islands for mixed supply voltage designs
    • 用于混合电源电压设计的并联电压岛的逻辑和物理构造
    • US06792582B1
    • 2004-09-14
    • US09713829
    • 2000-11-15
    • John M CohnAlvar A. DeanDavid J. HathawayDavid E. LackeyThomas M. LepsicSusan K. LichtensteigerScott A. TetreaultSebastian T. Ventrone
    • John M CohnAlvar A. DeanDavid J. HathawayDavid E. LackeyThomas M. LepsicSusan K. LichtensteigerScott A. TetreaultSebastian T. Ventrone
    • G06F1750
    • G06F17/5045G06F17/5068
    • Both logical and physical construction of voltage islands is disclosed. A semiconductor chip design is partitioned into “bins”, which are areas of the design. In this way, a semiconductor chip design may be “sliced” into various areas and the areas may then be assigned to various voltage levels. Each bin may be thought of as a voltage island. Circuits in the design can be added to or removed from the various bins, thereby increasing or decreasing the speed and power of the circuits: the speed and power increase if a circuit is placed into a bin assigned a higher voltage, and the speed and power decrease if a circuit is placed into a bin having a lower voltage. The size and location of the bins may also be changed. By iterating these steps, the optimum power consumption may be met while still meeting speed constraints and other criteria. The present invention is applicable to any placement environment, such as an annealing placement tool, that proceeds through successive refinement of the locations of the circuits on the design and in which the placement process may be interrupted to make changes in placement of the logic.
    • 公开了电压岛的逻辑和物理结构。 半导体芯片设计被划分为“箱”,这是设计的区域。 以这种方式,可以将半导体芯片设计“切片”成各种区域,然后将这些区域分配给各种电压电平。 每个仓可以被认为是电压岛。 设计中的电路可以添加到各个机箱中或从各个机箱中移除,从而增加或减少电路的速度和功率:如果将电路放入分配较高电压的箱体中,速度和功率会增加,速度和功率 如果将电路放置在具有较低电压的箱中,则减小。 还可以改变箱子的大小和位置。 通过迭代这些步骤,可以在满足速度限制和其他标准的同时满足最佳功耗。 本发明可应用于诸如退火放置工具的任何放置环境,其通过连续细化设计上的电路的位置并且其中可以中断放置过程以使逻辑的放置变化。
    • 10. 发明授权
    • Method of integrated circuit design checking using progressive individual network analysis
    • 集成电路设计检查方法采用渐进式单独网络分析
    • US06751744B1
    • 2004-06-15
    • US09475799
    • 1999-12-30
    • Robert J. AllenJohn M. CohnDavid J. Hathaway
    • Robert J. AllenJohn M. CohnDavid J. Hathaway
    • G06F112
    • G06F17/504G06F2217/78
    • A method for checking integrated circuit designs comprising the steps of calculating a first performance parameter by analyzing the network's sensitivity to a signal applied to the network; comparing the first performance parameter to one or more rules to determine a first pass condition and writing the value of first performance parameter to a netlist file in response to a pass to the first pass condition; followed by calculating a second performance parameter based on a first network model to determine a second pass condition in response to a fail to said first pass condition and writing the second performance parameter to the netlist file in response to a pass to said second pass condition or writing an error flag to the netlist file in response to a fail to said second pass condition is disclosed. The method, at each step, decides if a quick to calculate parameter provides sufficient design margin or if a more accurate but longer to calculate parameter is required.
    • 一种用于检查集成电路设计的方法,包括以下步骤:通过分析网络对施加到网络的信号的灵敏度来计算第一性能参数; 将所述第一性能参数与一个或多个规则进行比较以确定第一通过条件,并响应于所述第一通过条件的传递将所述第一性能参数的值写入网表文件; 随后基于第一网络模型计算第二性能参数,以响应于所述第一通过条件的失败来确定第二通过条件,并响应于所述第二通过条件的通过将所述第二性能参数写入所述网表文件,或 公开了响应于所述第二通过条件的失败向网表文件写入错误标志。 该方法在每个步骤中决定快速计算参数是否提供足够的设计余量,或者是否需要更准确但更长的计算参数。