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    • 1. 发明授权
    • Method of automatic latch insertion for testing application specific integrated circuits
    • 用于测试专用集成电路的自动锁存插入方法
    • US06636995B1
    • 2003-10-21
    • US09615146
    • 2000-07-13
    • Alvar A. DeanJoseph A. IadanzaDavid E. LackeySebastian T. Ventrone
    • Alvar A. DeanJoseph A. IadanzaDavid E. LackeySebastian T. Ventrone
    • G01R3128
    • G01R31/318357G06F17/5022
    • A method of testing a digital logic circuit comprises first providing a logic circuit having a plurality of interconnected circuits each having an input and an output; determining a gate level representation of the logic circuit including test nets for determining faults in the circuit; and identifying a portion of the nets which are most difficult to test, including nets which are most difficult to control and nets which are most difficult to observe. The method then includes inserting into the logic circuit control latches for nets which are determined to be most difficult to control and inserting into the logic circuit observation latches for nets which are determined to be most difficult to observe. Using the inserted control latches and observation latches, the method further includes testing the nets which are determined to be most difficult to control and nets which are hardest to observe and determining faults in the circuit. As a result of the method of the present invention, testing is completed in a time faster than if the nets were tested without the control latches and the observation latches. The portion of the nets which are most difficult to test are preferably identified by overall test time impact, and the nets having longest test times are determined to be most difficult to control and most difficult to observe.
    • 一种测试数字逻辑电路的方法包括:首先提供具有多个互连电路的逻辑电路,每个互连电路具有输入和输出; 确定逻辑电路的门级表示,包括用于确定电路中的故障的测试网; 并且识别最难测试的网的一部分,包括最难控制的网和最难观察的网。 该方法然后包括将被确定为最难控制并插入用于被确定为最难观察的网络的逻辑电路观察锁存器的网络的逻辑电路控制锁存器插入。 使用插入的控制锁存器和观察锁存器,该方法还包括测试被确定为最难控制的网络,并且网络中难以观察和确定电路中的故障。 作为本发明的方法的结果,比没有控制锁存器和观察锁存器测试网络的时间更快地完成测试。 最难测试的网的部分优选通过整体测试时间的影响来确定,并且确定具有最长测试时间的网最难以控制并且最难观察。
    • 2. 发明授权
    • System and method for AC performance tuning by thereshold voltage shifting in tubbed semiconductor technology
    • 通过液晶半导体技术中的阈值电压偏移进行交流性能调谐的系统和方法
    • US06487701B1
    • 2002-11-26
    • US09711744
    • 2000-11-13
    • Alvar A. DeanJerry D. HayesJoseph A. IadanzaEmory D. KellerSebastian T. Ventrone
    • Alvar A. DeanJerry D. HayesJoseph A. IadanzaEmory D. KellerSebastian T. Ventrone
    • G06F1750
    • G01R31/3163G01R31/2891
    • A system and method are described for separating the bulk connections for FETs on a semiconductor wafer from the supply rails, testing the wafer to determine if a shift in the threshold voltage, VT, of certain devices within the wafer, as defined by the bulk-wells, can remove an AC defect in the IC circuit, and tailoring the voltage or voltages applied to the bulk nodes, post-manufacture, such that the integrated circuit meets its performance targets or is sorted to a more valuable performance level. The method requires generating a gate level netlist of the IC's circuitry and performing timing calculations on these circuit netlists using static timing analyses, functional delay simulations, circuit activity analyses, and functional performance testing. The failures are then correlated to respective IC circuits, worst case slack circuits are investigated, and proposed changes to the threshold voltages are employed in the hardware.
    • 描述了一种系统和方法,用于将半导体晶片上的FET的体连接与电源轨分开,测试晶片以确定晶片内的某些器件的阈值电压VT是否偏移, 孔可以去除IC电路中的AC缺陷,并且定制施加到散装节点的电压或电压,后制造,使得集成电路满足其性能目标或被分类到更有价值的性能水平。 该方法需要生成IC电路的门级网表,并使用静态时序分析,功能延迟模拟,电路活动分析和功能性能测试来对这些电路网表执行定时计算。 然后将故障与相应的IC电路相关联,最坏情况下调查松弛电路,并且在硬件中采用提出的阈值电压的改变。
    • 10. 发明授权
    • System and method for balancing delay of signal communication paths through well voltage adjustment
    • 通过井电压调整来平衡信号通信路径的延迟的系统和方法
    • US07404114B2
    • 2008-07-22
    • US10906343
    • 2005-02-15
    • Hayden C. Cranford, Jr.Joseph A. IadanzaSebastian T. Ventrone
    • Hayden C. Cranford, Jr.Joseph A. IadanzaSebastian T. Ventrone
    • G01R31/28
    • H03K5/133H03K2005/00032
    • A method of balancing signal interconnect path delays between an analog domain and a digital domain of an integrated circuit includes applying a test signal to a selected one of a plurality of communication paths between the analog domain and the digital domain. A rising edge delay and a falling edge delay of the test signal is equalized by adjusting a body bias voltage of a delay element configured within the selected communication path. A rising edge delay and a falling edge delay for each of the remaining communication paths is compared with the equalized rising edge delay and falling edge delay of the selected communication path, and a body bias voltage for one or more of a plurality of delay elements configured within each of the remaining communication paths is adjusted until corresponding rising and falling edge delays thereof match the equalized rising edge delay and falling edge delay of the selected communication path.
    • 在集成电路的模拟域和数字域之间平衡信号互连路径延迟的方法包括将测试信号应用于模拟域和数字域之间的多个通信路径中的所选择的一个。 通过调整配置在所选择的通信路径内的延迟元件的体偏置电压来平衡测试信号的上升沿延迟和下降沿延迟。 将每个剩余通信路径的上升沿延迟和下降沿延迟与所选择的通信路径的均衡的上升沿延迟和下降沿延迟进行比较,并且配置多个延迟元件中的一个或多个的体偏置电压 在每个剩余的通信路径内进行调整,直到相应的上升沿和下降沿延迟与所选通信路径的均衡上升沿延迟和下降沿延迟相匹配。