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    • 5. 发明授权
    • Semiconductor switch
    • 半导体开关
    • US4063115A
    • 1977-12-13
    • US720492
    • 1976-09-03
    • Shinzi OkuharaYoshikazu HosokawaTatsuya KameiMasayoshi Suzuki
    • Shinzi OkuharaYoshikazu HosokawaTatsuya KameiMasayoshi Suzuki
    • H02M1/08H03K17/082H03K17/73H03K17/72
    • H03K17/73H03K17/0824
    • A semiconductor switch assuring the easy formation of a semiconductor integrated circuit and having high control sensitivity while maintaining high dv/dt - immunity, which comprises a PNPN switch of an equivalently four-layered structure including at least three PN-junctions, an anode and a cathode, switching means including a control terminal and connected with the PNPN switch to shunt one of the three PN-junctions at either one end of the PNPN switch, amplifying means, and a capacitive element for differentiating a voltage applied between the anode and the cathode of the PNPN switch to allow a current to flow into the control terminal of the switching means through the amplifying means, so that the switching means is driven by the current thereby to short-circuit the one of three PN-junctions.
    • 半导体开关确保容易地形成半导体集成电路并且具有高的控制灵敏度,同时保持高的dv / dt-抗扰度,其包括具有至少三个PN结的等效四层结构的PNPN开关,阳极和 阴极,包括控制端并与PNPN开关连接的开关装置,以分流PNPN开关的任一端的三个PN结中的一个,放大装置和用于区分施加在阳极和阴极之间的电压的电容元件 的PNPN开关以允许电流通过放大装置流入开关装置的控制端,使得开关装置由电流驱动,从而使三个PN结中的一个短路。
    • 6. 发明授权
    • Thyristor highly proof against time rate of change of voltage
    • 电压检测器对电压变化的时间速率进行高度检测
    • US3958268A
    • 1976-05-18
    • US466850
    • 1974-05-03
    • Tatsuya KameiYoshikazu Hosokawa
    • Tatsuya KameiYoshikazu Hosokawa
    • H01L29/74H01L29/749
    • H01L29/749H01L29/7436
    • A thyristor highly proof against dv/dt in which to prevent malignition due to the displacement current produced by the application of an abruptly rising forward voltage or the internal leakage current increasing with the temperature rise of the semiconductor substrate, an auxiliary electrode is provided to the intermediate region adjacent to one of the outermost regions of the semiconductor substrate to which two main electrodes, anode and cathode, are provided, the auxiliary electrode and the main electrode on the one outermost region being connected electrically, and a control region having the opposite conductivity type to that of the intermediate region is formed in the intermediate region between the auxiliary electrode and the main electrode on the one outermost region, the control region being provided with a gate electrode. By supplying a control signal to the gate electrode a depletion layer is produced in the intermediate region such that the path of the control signal from the gate electrode to the auxiliary electrode is completely blocked and the control signal is all utilized for the ignition. The displacement current and the leakage current are bypassed from the auxiliary electrode to the main electrode on the one outermost region.