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    • 4. 发明授权
    • Extreme ultraviolet light generation apparatus
    • 极紫外光发生装置
    • US08242474B2
    • 2012-08-14
    • US13032172
    • 2011-02-22
    • Shinji NagaiTamotsu AbeTakanobu IshiharaOsamu Wakabayashi
    • Shinji NagaiTamotsu AbeTakanobu IshiharaOsamu Wakabayashi
    • G01N21/33H01J1/50G21K5/08
    • H05G2/003G01J3/10G03F7/70033H05G2/005H05G2/008
    • An extreme ultraviolet light generation apparatus used in combination with a laser system, the apparatus may include: a chamber provided with at least one inlet port for introducing a laser beam outputted from the laser system into the chamber; a target supply unit provided to the chamber for supplying a target material to a predetermined region inside the chamber, where the target material is irradiated with the laser beam; at least one optical element disposed inside the chamber; a magnetic field generation unit for generating a magnetic field around the predetermined region; an ion collection unit disposed in a direction of a line of magnetic force of the magnetic field for collection an ion which is generated when the target material is irradiated with the laser beam and is flowing along the line of magnetic force; and a gas introduction unit for introducing an etching gas into the chamber.
    • 一种与激光系统组合使用的极紫外光发生装置,该装置可以包括:设置有至少一个入口的腔室,用于将从激光系统输出的激光束引入腔室; 目标供给单元,其设置在所述室中,用于将所述目标材料供给到所述室内的预定区域,所述目标材料用所述激光束照射; 设置在所述室内的至少一个光学元件; 用于产生围绕预定区域的磁场的磁场产生单元; 离子收集单元,设置在所述磁场的磁力线的方向上,用于收集当所述靶材料被所述激光束照射并沿着所述磁力线流动时产生的离子; 以及用于将蚀刻气体引入到室中的气体引入单元。
    • 9. 发明授权
    • Vacuum ultraviolet laser wavelength measuring apparatus
    • 真空紫外线激光波长测量仪
    • US06636297B2
    • 2003-10-21
    • US09842230
    • 2001-04-26
    • Osamu WakabayashiTatsuo EnamiShinji Nagai
    • Osamu WakabayashiTatsuo EnamiShinji Nagai
    • G01J300
    • G01J9/00G01J1/4257
    • A vacuum ultraviolet laser wavelength measuring apparatus capable of accurately measuring wavelength characteristics of a laser beam. The wavelength measuring apparatus has spectral devices for generating an optical pattern corresponding to wavelength characteristics of an incident laser beam and measuring wavelength characteristics of a laser beam in a vacuum ultraviolet region oscillating from a vacuum ultraviolet laser on the basis of the optical pattern. The apparatus has a fluorescent screen for generating a fluorescent pattern having an intensity distribution corresponding to an intensity distribution of the incident optical pattern, a pattern detector for measuring the intensity distribution of the fluorescent pattern, and arithmetic unit for calculating the wavelength characteristics of the laser beam on the basis of the measured intensity distribution.
    • 一种能够精确地测量激光束的波长特性的真空紫外激光波长测量装置。 波长测量装置具有用于产生与入射激光束的波长特性相对应的光学图案的光谱装置,并且基于光学图案测量从真空紫外激光器振荡的真空紫外区域中的激光束的波长特性。 该装置具有用于产生具有对应于入射光学图案的强度分布的强度分布的荧光图案的荧光屏,用于测量荧光图案的强度分布的图案检测器和用于计算激光器的波长特性的算术单元 基于测量的强度分布。
    • 10. 发明授权
    • Wavelength detector
    • 波长检测器
    • US06243163B1
    • 2001-06-05
    • US09398191
    • 1999-09-17
    • Osamu WakabayashiTatsuo EnamiShinji NagaiToru SuzukiTakeshi OhtaHirokazu Kubo
    • Osamu WakabayashiTatsuo EnamiShinji NagaiToru SuzukiTakeshi OhtaHirokazu Kubo
    • G01J328
    • G01J9/00G01J3/28
    • The present invention can accurately detect a wavelength of a light to be detected, which is output from a source of light to be detected, without an error even if there is a change in the characteristic of a spectroscope due to an individual difference among the spectroscopes or a change in the measuring environment. The device according to the invention emits at least two reference lights (Ln, La) having different wavelengths (&lgr;n, &lgr;a) as the reference lights by reference light source. And, actual characteristic value (D) of spectroscope is calculated on the basis of detection positions (Sn, Sa) of the at least two reference lights (Ln, La) on a sensor and the known wavelengths (&lgr;n, &lgr;a) of the at least two reference lights (Ln, La) (D=(&lgr;a−&lgr;n)/(Sa−Sn)). And, on the basis of the detection positions (Sn, SO) of the reference light (Ln) and the light to be detected (LO) on the sensor (10), the calculated actual characteristic value (D) of the spectroscope and the known wavelength (&lgr;n) of the reference light (Ln), wavelength (&lgr;O) of the light to be detected (LO) is calculated (&lgr;O=&lgr;n+(SO−Sn)·D).
    • 即使由于各分光器之间的个体差异而导致的分光器的特性发生变化,本发明也能够准确地检测从被检测光源输出的被检测光的波长 或测量环境的变化。 根据本发明的装置通过参考光源发射具有不同波长(lambdn,λ))的至少两个参考光(Ln,La)作为参考光。 并且,基于传感器上的至少两个参考光(Ln,La)的检测位置(Sn,Sa)以及在传感器上的已知波长(lambdn,λ)来计算分光计的实际特征值(D) 至少两个参考光(Ln,La)(D =(λ-lambdn)/(Sa-Sn)))。 并且,基于传感器(10)上的基准光(Ln)和被检测光(LO)的检测位置(Sn,SO),计算出的分光器的实际特性值(D)和 计算参考光(Ln)的已知波长(lambdn),待检测光(LO)的波长(lambd0)(lambdO = lambdn +(SO-Sn).D)。