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    • 1. 发明授权
    • Wordline-to-wordline stress configuration
    • 字线到字线应力配置
    • US08693259B2
    • 2014-04-08
    • US13340437
    • 2011-12-29
    • Mrinal KocharJianmin HuangJun WanJian Chen
    • Mrinal KocharJianmin HuangJun WanJian Chen
    • G11C16/06
    • G11C29/06G11C16/00G11C2029/1202
    • A method and system for performing wordline-to-wordline stress routines on a storage device is disclosed. Stress routines may be performed to reduce state widening in multi-level memory cells in the storage device. However, data retention problems may result if the stress routines are performed too often. In order to perform the stress routines at the proper times, a stress control variable is used. The stress control variable may be indicative of age of the storage device (such as the number of erase cycles performed on a memory block in the storage device). The stress control variable is input to a look-up table (or other logical construct), with the output of the look-up table indicating whether to perform the wordline-to-wordline stress routine. In this way, the stress routines may be performed to reduce state widening while reducing the ill effects of data retention.
    • 公开了一种用于在存储设备上执行字线到字线应力程序的方法和系统。 可以执行应力程序以减少存储设备中的多级存储器单元中的状态变宽。 但是,如果压力程序太频繁地执行,则可能会导致数据保留问题。 为了在适当的时候执行压力程序,使用应力控制变量。 应力控制变量可以指示存储设备的年龄(例如在存储设备中的存储器块上执行的擦除周期的数量)。 压力控制变量被输入到查找表(或其他逻辑结构),查找表的输出指示是否执行字线到字线应力程序。 以这种方式,可以执行应力程序以减少状态扩大,同时减少数据保留的不良影响。
    • 2. 发明申请
    • Wordline-to-Wordline Stress Configuration
    • Wordline到Wordline应力配置
    • US20130170301A1
    • 2013-07-04
    • US13340437
    • 2011-12-29
    • Mrinal KocharJianmin HuangJun WanJian Chen
    • Mrinal KocharJianmin HuangJun WanJian Chen
    • G11C29/00
    • G11C29/06G11C16/00G11C2029/1202
    • A method and system for performing wordline-to-wordline stress routines on a storage device is disclosed. Stress routines may be performed to reduce state widening in multi-level memory cells in the storage device. However, data retention problems may result if the stress routines are performed too often. In order to perform the stress routines at the proper times, a stress control variable is used. The stress control variable may be indicative of age of the storage device (such as the number of erase cycles performed on a memory block in the storage device). The stress control variable is input to a look-up table (or other logical construct), with the output of the look-up table indicating whether to perform the wordline-to-wordline stress routine. In this way, the stress routines may be performed to reduce state widening while reducing the ill effects of data retention.
    • 公开了一种用于在存储设备上执行字线到字线应力程序的方法和系统。 可以执行应力程序以减少存储设备中的多级存储器单元中的状态变宽。 但是,如果压力程序太频繁地执行,则可能会导致数据保留问题。 为了在适当的时候执行压力程序,使用应力控制变量。 应力控制变量可以指示存储设备的年龄(例如在存储设备中的存储器块上执行的擦除周期的数量)。 压力控制变量被输入到查找表(或其他逻辑结构),查找表的输出指示是否执行字线到字线应力程序。 以这种方式,可以执行应力程序以减少状态扩大,同时减少数据保留的不良影响。
    • 4. 发明授权
    • Non-volatile memory and method with post-write read and adaptive re-write to manage errors
    • 非易失性存储器和具有后写入读取和自适应重写的方法来管理错误
    • US08423866B2
    • 2013-04-16
    • US12642728
    • 2009-12-18
    • Gautam Ashok DusijaJian ChenChris AvilaJianmin HuangLee M. Gavens
    • Gautam Ashok DusijaJian ChenChris AvilaJianmin HuangLee M. Gavens
    • G06F11/00
    • G11C11/5621G11C16/10G11C16/349G11C16/3495G11C29/00G11C2211/5641
    • Data errors in non-volatile memory inevitably increase with usage and with higher density of bits stored per cell. The memory is configured to have a first portion operating with less error but of lower density storage, and a second portion operating with a higher density but less robust storage. Input data is written and staged in the first portion before being copied to the second portion. An error management provides checking the quality of the copied data for excessive error bits. The copying and checking are repeated on a different location in the second portion until either a predetermined quality is satisfied or the number or repeats exceeds a predetermined limit. The error management is not started when a memory is new with little or no errors, but started after the memory has aged to a predetermined amount as determined by the number of erase/program cycling its has experienced.
    • 非易失性存储器中的数据错误不可避免地随着使用而增加,并且每个单元存储更高密度的位。 存储器被配置为具有以较小误差但是较低密度存储器操作的第一部分,以及以较高密度但较不牢固的存储器操作的第二部分。 在将第一部分复制到第二部分之前,输入数据被写入并分级。 错误管理提供检查复制数据的质量是否存在过多的错误位。 在第二部分中的不同位置重复复印和检查,直到满足预定质量或者数量或重复超过预定限度。 当存储器是新的,几乎没有或没有错误时,错误管理不开始,但是在内存已经老化到由其经历的擦除/程序循环的数量确定的预定量之后开始。
    • 7. 发明授权
    • Data coding for improved ECC efficiency
    • 数据编码,提高ECC效率
    • US08473809B2
    • 2013-06-25
    • US12839237
    • 2010-07-19
    • Jun WanAlex MakTien-Chien KuoYan LiJian Chen
    • Jun WanAlex MakTien-Chien KuoYan LiJian Chen
    • G06F11/00G11C29/00G11C7/00
    • G11C11/5642G11C11/5628G11C29/00
    • Non-volatile storage devices and techniques for operating non-volatile storage are described herein. One embodiment includes accessing “n” pages of data to be programmed into a group of non-volatile storage elements. The “n” pages are mapped to a data state for each of the non-volatile storage elements based on a coding scheme that evenly distributes read errors across the “n” pages of data. Each of the non-volatile storage elements in the group are programmed to a threshold voltage range based on the data states to which the plurality of pages have been mapped. The programming may include programming the “n” pages simultaneously. In one embodiment, mapping the plurality of pages is based on a coding scheme that distributes a significant failure mode (for example, program disturb errors) to a first of the pages and a significant failure mode (for example, data retention errors) to a second of the pages.
    • 本文描述了用于操作非易失性存储器的非易失性存储设备和技术。 一个实施例包括访问要编程到一组非易失性存储元件中的“n”页数据。 基于在“n”页数据上均匀分布读取错误的编码方案,将“n”个页映射到每个非易失性存储元件的数据状态。 基于已经映射了多个页面的数据状态,组中的每个非易失性存储元件被编程到阈值电压范围。 编程可以包括同时对“n”页进行编程。 在一个实施例中,映射多个页面是基于将显着的故障模式(例如,程序干扰错误)分配给第一页面的编码方案和将重大故障模式(例如,数据保留错误)分配给 第二页。
    • 9. 发明申请
    • DATA CODING FOR IMPROVED ECC EFFICIENCY
    • 数据编码提高ECC效率
    • US20110126080A1
    • 2011-05-26
    • US12839237
    • 2010-07-19
    • Jun WanAlex MakTien-Chien KuoYan LiJian Chen
    • Jun WanAlex MakTien-Chien KuoYan LiJian Chen
    • G06F12/02H03M13/05G06F11/10
    • G11C11/5642G11C11/5628G11C29/00
    • Non-volatile storage devices and techniques for operating non-volatile storage are described herein. One embodiment includes accessing “n” pages of data to be programmed into a group of non-volatile storage elements. The “n” pages are mapped to a data state for each of the non-volatile storage elements based on a coding scheme that evenly distributes read errors across the “n” pages of data. Each of the non-volatile storage elements in the group are programmed to a threshold voltage range based on the data states to which the plurality of pages have been mapped. The programming may include programming the “n” pages simultaneously. In one embodiment, mapping the plurality of pages is based on a coding scheme that distributes a significant failure mode (for example, program disturb errors) to a first of the pages and a significant failure mode (for example, data retention errors) to a second of the pages.
    • 本文描述了用于操作非易失性存储器的非易失性存储设备和技术。 一个实施例包括访问要编程到一组非易失性存储元件中的“n”页数据。 基于在“n”页数据上均匀分布读取错误的编码方案,将“n”个页映射到每个非易失性存储元件的数据状态。 基于已经映射了多个页面的数据状态,组中的每个非易失性存储元件被编程到阈值电压范围。 编程可以包括同时对“n”页进行编程。 在一个实施例中,映射多个页面是基于将显着的故障模式(例如,程序干扰错误)分配给第一页面的编码方案和将重大故障模式(例如,数据保留错误)分配给 第二页。