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1. 发明授权

US4365307A Temperature pattern measuring device 失效
标题翻译：温度模式测量装置
公开(公告)号：US4365307A
公开(公告)日：1982-12-21
申请号：US238357
申请日：1981-02-25
申请人： Masao Tatsuwaki , Shin Nemoto , Yutaka Katayama , Michio Okada , Kazuyuki Hotta
发明人： Masao Tatsuwaki , Shin Nemoto , Yutaka Katayama , Michio Okada , Kazuyuki Hotta
IPC分类号： G01J5/60 , G01J5/18
CPC分类号： G01J5/60
摘要： A temperature pattern measuring device for obtaining the surface temperature distribution of an object. The device receives an image of the measured object and two different wavelength components of light emitted from the object. The device performs a two color temperature process for each minute area within a visual field of the image pickup, detecting the temperature at a portion on the surface of the corresponding measured object, thereby obtaining the temperature pattern thereof. The above minute areas can be set by an electrical method using photoelectric conversion means. Also, a supervision unit for the weld zone at an electrically seamed pipe, may employ the temperature pattern measuring unit of the present invention, the supervision unit producing a composite display of the form of the weld zone and the temperature pattern thereof.
摘要翻译：一种用于获得物体的表面温度分布的温度图案测量装置。该装置接收被测物体的图像和从对象发射的光的两个不同波长分量。该装置对图像拾取的视野内的每个微小区域进行双色温度处理，检测相应测量对象的表面上的一部分的温度，从而获得其温度图案。可以通过使用光电转换装置的电气方法来设定上述微小区域。此外，在电接缝管上的焊接区域的监督单元可以采用本发明的温度模式测量单元，监督单元产生焊接区形式的复合显示器及其温度图案。

2. 发明授权

US4413324A Temperature pattern measuring method and a device therefor 失效
标题翻译：温度模式测量方法及其装置
公开(公告)号：US4413324A
公开(公告)日：1983-11-01
申请号：US238360
申请日：1981-02-25
申请人： Masao Tatsuwaki , Shin Nemoto , Seiichi Okuhara
发明人： Masao Tatsuwaki , Shin Nemoto , Seiichi Okuhara
IPC分类号： G01J5/60 , H04N5/33 , G01J5/18
CPC分类号： H04N5/332 , G01J5/60 , H04N5/33
摘要： A temperature pattern distribution measuring method and apparatus by which portions of light from parts of an area of an object whose temperature distribution pattern is to be measured, and whose parts are in a predetermined pattern, are passed through first and second optical filters which respectively pass different wavelengths of light. The level of engery passed by the respective filters for the respective portions of light are determined by scanning the light from the filters with a pickup device or devices and, by using the determined energy levels, an arithmetic unit carries out a two-color temperature determining operation for the respective parts of the area for determining the temperature on each part of the area of the object. The temperature pattern of the area of the object can thereby be determined from the temperatures of the parts of the area.
摘要翻译：一种温度图案分布测量方法和装置，通过该温度图案分布测量方法和装置，其通过第一和第二滤光器通过其中要测量其温度分布图案并且其部分处于预定图案的物体的区域的一部分的光，不同波长的光。通过用于各个部分的光的各个滤光器通过的凸起的水平通过用拾取装置或装置扫描来自滤光器的光来确定，并且通过使用确定的能级，运算单元执行双色温度确定操作该区域的各个部分，以确定物体的每个部分上的温度。因此，可以根据该区域的部分的温度来确定物体的区域的温度图案。

3. 发明授权

US4598998A Screw surface flaw inspection method and an apparatus therefor 失效
标题翻译：螺丝表面缺陷检查方法及其设备
公开(公告)号：US4598998A
公开(公告)日：1986-07-08
申请号：US469234
申请日：1983-02-24
申请人： Mitsuhito Kamei , Shin Nemoto , Souji Ishimoto
发明人： Mitsuhito Kamei , Shin Nemoto , Souji Ishimoto
IPC分类号： G01B11/24 , G01N21/956 , G01M11/08
CPC分类号： G01N21/952 , G01B11/2425 , G01N21/9515 , G01N21/956
摘要： A screw surface flaw inspection method and an apparatus therefor, which projects light onto the surface of a screw, the light being scanned axially of the screw, and a detector which picks up the reflected light from the projected surface and sends an output signal to a signal processing circuit to thereby detect the flaw on a basis of time base variation of the intensity of reflected light. The method and apparatus enables the inspection of minute flaws rapidly and exactly.
摘要翻译：一种螺钉表面缺陷检查方法及其装置，其将光投射到螺钉的表面上，所述光沿螺钉轴向扫描;以及检测器，其从投影表面拾取反射光，并将输出信号发送到信号处理电路，从而基于反射光的强度的时基变化来检测缺陷。该方法和装置能够快速准确地检查微小缺陷。

4. 发明申请

US20140017958A1 CONNECTOR HOUSING WITH FIXED ENDED LANCE AND REMOVAL JIG FOR THE SAME 有权
标题翻译：连接器外壳带有固定的端部，并移除
公开(公告)号：US20140017958A1
公开(公告)日：2014-01-16
申请号：US14007761
申请日：2012-03-30
申请人： Shin Nemoto
发明人： Shin Nemoto
IPC分类号： H01R13/424
CPC分类号： H01R13/424 , H01R13/4223 , H01R43/22
摘要： A connector housing includes a terminal accommodating chamber, a lance and a pair of arms. The terminal accommodating chamber is formed with an opening configured such that a terminal is inserted therethrough. The lance extends from a top wall of the terminal accommodating chamber toward the opening in an extending direction. The pair of arms are respectively formed integrally to both lateral side surfaces of the lance, extend from both the lateral side surfaces to front and back sides of the lance in the extending direction, and are connected to a bottom wall of the terminal accommodating chamber. An unlocking protrusion is formed in one of the arms.
摘要翻译：连接器壳体包括端子容纳室，喷枪和一对臂。端子容纳室形成有使端子插入其中的开口。喷枪从终端容纳室的顶壁沿着延伸方向朝开口延伸。所述一对臂分别与所述矛杆的两个侧面一体地形成，从所述横向侧面的两侧面延伸到所述喷枪的前后方向，并且与所述端子收容室的底壁连接。在一个臂中形成解锁突起。

5. 发明授权

US06271657B1 Test head positioner for semiconductor device testing apparatus 失效
标题翻译：半导体器件测试仪的测试头定位器
公开(公告)号：US06271657B1
公开(公告)日：2001-08-07
申请号：US09119817
申请日：1998-07-23
申请人： Shin Nemoto
发明人： Shin Nemoto
IPC分类号： B25J100
CPC分类号： G01R1/06705
摘要： A hand-operated test head positioner for positioning the test head of a semiconductor device testing apparatus is provided which is easy to operate, highly safe in operation, and yet inexpensive. Two air cylinders are installed one at each of two opposed positions of the test head. The sum of driving forces of these air cylinders is set at a level approximately equivalent to the weight of the test head to act as a counterbalancer. Hand-operated jack mechanisms are disposed on the opposite side walls of the test head, respectively. The jack mechanisms comprise long lead screws rotatably supported, two movable screw members in threaded engagement with the respective lead screws, drive arms pivotally connected at one ends to the respective movable screw members, and driven arms having approximately the same shape and size as the drive arms and being pivotally connected to the respective drive arms, respectively. By manually rotating one of the lead screws, the movable screw members are simultaneously moved thereby moving the test head vertically upwardly and downwardly.
摘要翻译：提供了一种用于定位半导体器件测试装置的测试头的手动测试头定位器，其易于操作，操作高度安全，并且便宜。在测试头的两个相对位置的每一个处安装两个气缸。这些气缸的驱动力的总和被设定为大致相当于作为平衡器的测试头的重量的水平。手动插座机构分别设置在测试头的相对侧壁上。千斤顶机构包括可旋转地支撑的长导螺杆，与相应的导螺杆螺纹接合的两个可动螺钉构件，一端可枢转地连接到相应的可动螺钉构件的驱动臂以及具有与驱动器大致相同形状和尺寸的从动臂并且分别枢转地连接到相应的驱动臂。通过手动旋转一个引导螺钉，可动螺纹构件同时移动，从而使测试头垂直向上和向下移动。

6. 发明授权

US07699785B2 Method for determining sleep stages 有权
标题翻译：确定睡眠阶段的方法
公开(公告)号：US07699785B2
公开(公告)日：2010-04-20
申请号：US10590058
申请日：2005-02-23
申请人： Shin Nemoto
发明人： Shin Nemoto
IPC分类号： A61B5/02 , A61B5/00 , A61B5/04
CPC分类号： A61B5/11 , A61B5/4812 , A61B5/6892 , A61B7/02 , A61B2562/0247 , G08B21/0461
摘要： The present invention provides a method for determining sleep stages of an examinee, including detecting signals of the examinee with a biosignal detector, calculating a signal strength deviation value that indicates deviation of a signal strength of the detected signals, and determining a sleep stage by using the signal strength deviation value or a value of a plurality of values based on the signal strength deviation value as an indicator value.
摘要翻译：本发明提供了一种用于确定受检者的睡眠阶段的方法，包括用生物信号检测器检测受检者的信号，计算指示检测到的信号的信号强度的偏差的信号强度偏差值，以及通过使用信号强度偏差值或基于信号强度偏差值的多个值的值作为指标值。

7. 发明授权

US06433294B1 Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatus 失效
标题翻译：具有多个半导体器件测试装置的半导体器件测试装置和半导体器件测试系统
公开(公告)号：US06433294B1
公开(公告)日：2002-08-13
申请号：US09505634
申请日：2000-02-16
申请人： Shin Nemoto , Yoshihito Kobayashi , Hiroo Nakamura , Takeshi Onishi , Hiroki Ikeda
发明人： Shin Nemoto , Yoshihito Kobayashi , Hiroo Nakamura , Takeshi Onishi , Hiroki Ikeda
IPC分类号： B07C5344
CPC分类号： G01R31/31907 , G01R31/2834 , G01R31/2887 , G01R31/31912
摘要： A semiconductor device testing system is provided which can efficiently utilize a plurality of semiconductor device testing apparatus. There are provided a host computer 2 for controlling a plurality of semiconductor device testing apparatus 1A, 1B, and 1C, and a dedicated classifying machine 3. Storage information memory means 4 for storing storage information of each semiconductor device such as a number assigned to each tested semiconductor device, the test results of each semiconductor device, and the like is provided in the host computer 2. Without sorting the tested devices or with the sorting operation of the tested devices into only two categories in the handler part 11 of each testing apparatus, the tested devices are transferred from the test tray to a general-purpose tray, and during this transfer operation, the storage information of each device is stored in the storage information memory means. When all the tests are completed, the storage information of each device stored in the storage information memory means is transmitted to the dedicated classifying machine by which the tested devices are sorted out.
摘要翻译：提供一种可有效利用多个半导体器件测试装置的半导体器件测试系统。设置有用于控制多个半导体器件测试装置1A，1B和1C的主计算机2和专用分类机3.存储信息存储装置4，用于存储每个半导体装置的存储信息，例如分配给每个半导体装置的号码测试半导体器件，每个半导体器件的测试结果等被提供在主计算机2中。在每个测试装置的处理器部分11中，不对所测试的器件进行分类或将被测试器件的分类操作分为仅两个类别被测试的设备从测试托盘传送到通用托盘，并且在该传送操作期间，每个设备的存储信息被存储在存储信息存储器装置中。当所有测试完成时，存储在存储信息存储器装置中的每个设备的存储信息被发送到专门的分类机，通过该分类机对被测试的设备进行整理。

8. 发明授权

US6104183A Semiconductor device testing apparatus 失效
标题翻译：半导体器件测试仪器
公开(公告)号：US6104183A
公开(公告)日：2000-08-15
申请号：US809243
申请日：1997-05-28
申请人： Yoshihito Kobayashi , Tsuyoshi Yamashita , Hiroto Nakamura , Shin Nemoto , Yoshiyuki Masuo , Akihiko Ito
发明人： Yoshihito Kobayashi , Tsuyoshi Yamashita , Hiroto Nakamura , Shin Nemoto , Yoshiyuki Masuo , Akihiko Ito
IPC分类号： G01R31/26 , G01R31/28 , H01L21/677
CPC分类号： G01R31/2868
摘要： A semiconductor device testing apparatus having a reduced transverse width and compact in size is provided. Adjacent to a constant temperature chamber 101 containing therein a vertical transport means is located a test chamber 102 which is in turn adjoined by a temperature-stress removing chamber 103 likewise containing therein a vertical transport means, so that the constant temperature chamber 101, the test chamber 102 and the temperature-stress removing chamber 103 are arranged transversely in a line. Further, a loader section 300 is located in front of the constant temperature chamber, and an unloader section 400 is located in front of the test chamber and the temperature-stress removing chamber. With this arrangement, the transverse width of the testing apparatus may be reduced to about three test tray lengths.
摘要翻译： PCT No.PCT / JP96 / 02067 Sec。 371日期1997年5月28日 102（e）日期1997年5月28日PCT提交1996年7月24日PCT公布。出版物WO97 / 05495 日期：1997年2月13日提供了具有减小的横向宽度和尺寸紧凑的半导体器件测试装置。在其中容纳有垂直传送装置的恒温室101附近设置有测试室102，测试室102又由同样包含垂直传送装置的温度应力消除室103邻接，使得恒温室101，测试室102和温度应力消除室103横向排列成一行。此外，装载部300位于恒温室前方，卸载部400位于试验室前方和温度应力消除室。通过这种布置，测试装置的横向宽度可以减小到约三个测试托盘长度。

9. 发明授权

US6066822A Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatus 失效
标题翻译：具有多个半导体器件测试装置的半导体器件测试装置和半导体器件测试系统
公开(公告)号：US6066822A
公开(公告)日：2000-05-23
申请号：US809702
申请日：1997-03-27
申请人： Shin Nemoto , Yoshihito Kobayashi , Hiroo Nakamura , Takeshi Onishi , Hiroki Ikeda
发明人： Shin Nemoto , Yoshihito Kobayashi , Hiroo Nakamura , Takeshi Onishi , Hiroki Ikeda
IPC分类号： G01R31/26 , G01R31/28 , G01R31/319 , B07C5/344
CPC分类号： G01R31/31907 , G01R31/2834 , G01R31/2887 , G01R31/31912
摘要： A semiconductor device testing system is provided efficiently utilizes a plurality of semiconductor device testing apparatus. More particularly, a host computer controls a plurality of semiconductor device testing apparatuses and a dedicated classifying machine. A storage information memory stores storage information of each semiconductor device such as a number assigned to each tested semiconductor device such as a number assigned to each tested semiconductor device, the test results of each semiconductor device, and is provided in the host computer. Without sorting the tested devices or with the sorting operation of the tested devices into only two categories in a handler part of each testing apparatus, the tested devices are transferred from the test tray to a general-purpose tray, and during this transfer operation, the storage information of each device is stored in the storage information memory. When all of the tests are completed, the storage information of each device stored in the storage information memory is transmitted to the dedicated classifying machine by which the tested devices are sorted out.
摘要翻译： PCT No.PCT / JP96 / 02130 Sec。 371日期：1997年5月27日 102（e）日期1997年5月27日PCT提交1996年7月29日PCT公布。出版物WO97 / 05496 日期1997年2月13日提供半导体器件测试系统有效地利用多个半导体器件测试装置。更具体地，主计算机控制多个半导体器件测试装置和专用分选机。存储信息存储器存储每个半导体器件的存储信息，例如分配给每个测试的半导体器件的数量，例如分配给每个测试的半导体器件的数量，每个半导体器件的测试结果，并且设置在主计算机中。在每个测试设备的处理器部分中，如果不对被测试的设备进行分类或将被测试设备的分类操作分成两类，则测试设备从测试托盘传送到通用托盘，并且在该传送操作期间，每个设备的存储信息被存储在存储信息存储器中。当所有测试完成时，存储在存储信息存储器中的每个设备的存储信息被发送到专用分类机，通过该专用分类机对被测试的设备进行整理。

10. 发明授权

US09172171B2 Connector housing with fixed ended lance and removal jig for the same 有权
标题翻译：连接器外壳带有固定端子喷枪和拆卸夹具
公开(公告)号：US09172171B2
公开(公告)日：2015-10-27
申请号：US14007761
申请日：2012-03-30
申请人： Shin Nemoto
发明人： Shin Nemoto
IPC分类号： H01R13/40 , H01R13/424 , H01R13/422 , H01R43/22
CPC分类号： H01R13/424 , H01R13/4223 , H01R43/22
摘要： A connector housing includes a terminal accommodating chamber, a lance and a pair of arms. The terminal accommodating chamber is formed with an opening configured such that a terminal is inserted therethrough. The lance extends from a top wall of the terminal accommodating chamber toward the opening in an extending direction. The pair of arms are respectively formed integrally to both lateral side surfaces of the lance, extend from both the lateral side surfaces to front and back sides of the lance in the extending direction, and are connected to a bottom wall of the terminal accommodating chamber. An unlocking protrusion is formed in one of the arms.
摘要翻译：连接器壳体包括端子容纳室，喷枪和一对臂。端子容纳室形成有使端子插入其中的开口。喷枪从终端容纳室的顶壁沿着延伸方向朝开口延伸。所述一对臂分别与所述矛杆的两个侧面一体地形成，从所述横向侧面的两侧面延伸到所述喷枪的前后方向，并且与所述端子收容室的底壁连接。在一个臂中形成解锁突起。

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