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    • 1. 发明授权
    • Temperature pattern measuring method and a device therefor
    • 温度模式测量方法及其装置
    • US4413324A
    • 1983-11-01
    • US238360
    • 1981-02-25
    • Masao TatsuwakiShin NemotoSeiichi Okuhara
    • Masao TatsuwakiShin NemotoSeiichi Okuhara
    • G01J5/60H04N5/33G01J5/18
    • H04N5/332G01J5/60H04N5/33
    • A temperature pattern distribution measuring method and apparatus by which portions of light from parts of an area of an object whose temperature distribution pattern is to be measured, and whose parts are in a predetermined pattern, are passed through first and second optical filters which respectively pass different wavelengths of light. The level of engery passed by the respective filters for the respective portions of light are determined by scanning the light from the filters with a pickup device or devices and, by using the determined energy levels, an arithmetic unit carries out a two-color temperature determining operation for the respective parts of the area for determining the temperature on each part of the area of the object. The temperature pattern of the area of the object can thereby be determined from the temperatures of the parts of the area.
    • 一种温度图案分布测量方法和装置,通过该温度图案分布测量方法和装置,其通过第一和第二滤光器通过其中要测量其温度分布图案并且其部分处于预定图案的物体的区域的一部分的光, 不同波长的光。 通过用于各个部分的光的各个滤光器通过的凸起的水平通过用拾取装置或装置扫描来自滤光器的光来确定,并且通过使用确定的能级,运算单元执行双色温度确定 操作该区域的各个部分,以确定物体的每个部分上的温度。 因此,可以根据该区域的部分的温度来确定物体的区域的温度图案。