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    • 2. 发明授权
    • Scanning exposure apparatus and method
    • 扫描曝光装置和方法
    • US5777722A
    • 1998-07-07
    • US654382
    • 1996-05-28
    • Seiji MiyazakiTsuyoshi NarabeKei NaraTomohide HamadaKazuaki SaikiHideji GotoMuneyasu Yokota
    • Seiji MiyazakiTsuyoshi NarabeKei NaraTomohide HamadaKazuaki SaikiHideji GotoMuneyasu Yokota
    • G03F7/20G03F9/00G03B27/42G03B27/32G01B11/00
    • G03F7/70275G03F7/70358G03F9/70
    • A scanning exposure apparatus is arranged to illuminate a mask, to project an image of the mask through a projection optical system onto a photosensitive substrate, and to move the mask and the photosensitive substrate relative to the projection optical system, thereby effecting exposure of an entire surface of the mask on the photosensitive substrate, and the exposure apparatus comprises a position detector which detects a relative positional relation between the mask and the photosensitive substrate; a memory which stores positional information obtained by the position detector; a position correcting device which corrects the relative positional relation between the mask and the photosensitive substrate, based on the positional information read out from the memory device; and a controller which makes the position detector detect the relative positional relation between the mask and the photosensitive substrate while the mask and the photosensitive substrate are carried past a projection region of the projection optical system to an exposure start position, and makes the position correcting device correct the relative positional relation between the mask and the photosensitive substrate, based on the positional information read out from the memory, while the mask and the photosensitive substrate are stopped at the exposure start position and/or during the exposure.
    • 扫描曝光装置被布置为照亮掩模,通过投影光学系统将光掩模的图像投射到感光基板上,并且使掩模和感光基板相对于投影光学系统移动,从而实现整个曝光 感光基板上的掩模表面,曝光装置包括检测掩模和感光基板之间的相对位置关系的位置检测器; 存储器,其存储由所述位置检测器获取的位置信息; 基于从存储装置读出的位置信息来校正掩模和感光基板之间的相对位置关系的位置校正装置; 以及控制器,其使得位置检测器在将掩模和感光基板通过投影光学系统的投影区域到曝光开始位置时检测掩模和感光基板之间的相对位置关系,并使位置校正装置 基于从存储器读出的位置信息,掩模和感光基板在曝光开始位置和/或曝光期间停止时,校正掩模和感光基板之间的相对位置关系。
    • 7. 再颁专利
    • Scanning exposure apparatus and exposure method
    • 扫描曝光装置和曝光方法
    • USRE37762E1
    • 2002-06-25
    • US09247857
    • 1999-02-11
    • Seiji MiyazakiKei NaraMasami SekiMasamitsu YanagiharaTomohide Hamada
    • Seiji MiyazakiKei NaraMasami SekiMasamitsu YanagiharaTomohide Hamada
    • G03B2742
    • G03F9/7003G03F7/70275G03F7/70358G03F7/70475G03F7/70791
    • The present invention is directed to scanning exposure apparatus and exposure method to achieve simultaneous projection of images of plural regions on a mask onto a photosensitive substrate with correcting an orthogonality error of a pattern on the mask or photosensitive substrate. If the pattern on the mask or photosensitive substrate has an orthogonality error causing a deviation of a certain angle in a first direction perpendicular to a scanning direction as it goes in the scanning direction, the mask and the photosensitive substrate are rotated relative to each other in the plane thereof to align one coordinate axis in a coordinate system of each pattern with the first direction. Then a relative displacement is given by an amount of the orthogonality error between positions of images projected through a first optical system and positions of images projected through a second optical system, and relative positions of the mask and the photosensitive substrate are continuously changed by the amount of the orthogonality error in the first direction in accordance with the position of the mask or photosensitive substrate in the scanning direction.
    • 本发明涉及扫描曝光装置和曝光方法,以通过校正掩模或感光基底上的图案的正交性误差来将掩模上的多个区域的图像同时投影到感光基板上。 如果掩模或感光基板上的图案具有在沿着扫描方向进入垂直于扫描方向的第一方向上产生一定角度的偏差的正交性误差,则掩模和感光基板相对于彼此旋转 其平面将每个图案的坐标系中的一个坐标轴与第一方向对齐。 然后通过第一光学系统投影的图像的位置和通过第二光学系统投影的图像的位置之间的正交性误差的量给出相对位移,并且掩模和感光基板的相对位置连续地改变量 根据掩模或感光基板在扫描方向上的位置,在第一方向上的正交性误差。
    • 8. 发明授权
    • Method and apparatus for manufacturing display devices
    • 用于制造显示装置的方法和装置
    • US09172063B2
    • 2015-10-27
    • US12102509
    • 2008-04-14
    • Tomohide HamadaKei Nara
    • Tomohide HamadaKei Nara
    • B05D5/12H01L51/56G02F1/13H01J9/24G02F1/1333H01L27/32H01L51/00
    • H01L51/56G02F1/1303G02F2001/133302G02F2001/133325H01J9/241H01J9/242H01L27/3246H01L51/0005H01L51/0022
    • A method for fabricating a display device including forming a standard mark in a flexible substrate fed in a first direction, forming a partition wall in the flexible substrate, and forming an electrode by applying a conductive member at a predetermined position between the partition walls by an applicator based on the standard mark. An apparatus is provided that includes a transportation unit to transport a flexible substrate in a first direction, a mark formation unit to form a standard mark in the flexible substrate, a partition wall formation unit to form a partition wall in the flexible substrate, and an application unit to apply a conductive member to a predetermined position between the partition walls based on the standard mark. A display device is provided that includes a flexible substrate, a partition wall formed by pressing the flexible substrate, and an electrode formed by application between the partition walls.
    • 一种制造显示装置的方法,包括在沿第一方向馈送的柔性基板中形成标准标记,在柔性基板中形成分隔壁,并通过在隔壁之间的预定位置处施加导电构件,形成电极, 涂抹器基于标准标记。 提供了一种装置,其包括:沿第一方向输送柔性基板的输送单元,在柔性基板中形成标准标记的标记形成单元,在柔性基板中形成分隔壁的分隔壁形成单元, 应用单元基于标准标记将导电构件施加到分隔壁之间的预定位置。 提供一种显示装置,其包括柔性基板,通过按压柔性基板形成的分隔壁以及通过在分隔壁之间施加形成的电极。
    • 9. 发明授权
    • Defect detection method of display device and defect detection apparatus of display device
    • 显示装置的缺陷检测方法和显示装置的缺陷检测装置
    • US08301289B2
    • 2012-10-30
    • US12753517
    • 2010-04-02
    • Kei NaraTomohide Hamada
    • Kei NaraTomohide Hamada
    • G06F19/00
    • G01N21/95607G01N2021/9513G01N2021/95615G02F1/136259
    • A defect detecting method of a display device includes a defect counting process that measuring a feature amount for each partial region of a display device (P32), and counting regions which is determined as a defective portion based on the measured feature amount of the region (P36), a process that stopping a manufacturing line of the display device when a number of defects counted at the defect counting process is greater than a first threshold value (P38, P42), a defect density calculating process that calculating a defect density in a predetermined area when the number of defects counted at the defect counting process is smaller than the first threshold value (P38), and a process that stopping the manufacturing line of the display device when the defect density calculated at the defect density calculating process is higher than a second threshold value (P40, P42).
    • 显示装置的缺陷检测方法包括测量显示装置的每个部分区域的特征量的缺陷计数处理(P32),并且基于测量的区域的特征量对被确定为缺陷部分的区域进行计数( P36),当在缺陷计数处理中计数的缺陷数量大于第一阈值(P38,P42)时停止显示装置的生产线的处理,计算缺陷密度的缺陷密度计算处理 当在缺陷计数处理中计数的缺陷数量小于第一阈值(P38)时的预定区域,以及当在缺陷密度计算处理中计算的缺陷密度高于显示装置的制造线时,停止显示装置的制造线的处理 第二阈值(P40,P42)。