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    • 3. 发明授权
    • Exposure method and apparatus
    • 曝光方法和装置
    • US5623343A
    • 1997-04-22
    • US548402
    • 1995-10-26
    • Kei NaraMasamitsu YanagiharaSeiji Miyazaki
    • Kei NaraMasamitsu YanagiharaSeiji Miyazaki
    • G03F7/20G03F9/00H01L21/027G01B11/00
    • G03F7/70225G03F7/70275G03F7/70358G03F9/70
    • In the first step of an exposure method of the present invention, an alignment optical system is arranged to oppose one of a first mask mark on a photomask and a first substrate mark on a photosensitive substrate, thereby detecting a first deviation amount between the position of the first mask mark and that of the first substrate mark. In the second step, the alignment optical system is arranged to oppose one of a second mask mark on the photomask and a second substrate mark on the photosensitive substrate, thereby detecting a second deviation mark between the position of the second mask mark and that of the second substrate mark. In the third step, correction values for minimizing the first and second deviation amounts are calculated. In the fourth step, the relative positional relationship between the image of an original pattern on the photomask and a shot area on the photosensitive substrate is adjusted on the basis of a correction value. In the fifth step, at least one of the first and second steps is executed subsequent to the fourth step to newly detect the first or second deviation amount. In the sixth step, the first to fifth steps are repeatedly executed until one of the first and second deviation amounts detected in the fifth step falls within a predetermined allowance.
    • 在本发明的曝光方法的第一步骤中,对准光学系统被布置为与光掩模上的第一掩模标记和感光基板上的第一基板标记中的一个相对,从而检测在光敏基板的位置之间的第一偏移量 第一个掩码标记和第一个掩码标记。 在第二步骤中,对准光学系统布置成与光掩模上的第二掩码标记和感光基板上的第二基板标记之一相对,从而检测第二掩模标记的位置与第二掩模标记的位置之间的第二偏移标记 第二基板标记。 在第三步骤中,计算用于使第一和第二偏移量最小化的校正值。 在第四步骤中,基于校正值来调整光掩模上的原始图案的图像与感光基板上的照射区域之间的相对位置关系。 在第五步骤中,在第四步骤之后执行第一和第二步骤中的至少一个,以重新检测第一或第二偏差量。 在第六步骤中,重复执行第一至第五步骤,直到在第五步骤中检测到的第一和第二偏移量之一落入预定余量之内。
    • 6. 发明授权
    • Scanning type exposure apparatus and exposure method
    • 扫描式曝光装置和曝光方法
    • US5625436A
    • 1997-04-29
    • US689691
    • 1996-08-13
    • Masamitsu YanagiharaSusumu MoriTsuyoshi NarakiMasami SekiSeiji MiyazakiTsuyoshi NarabeHiroshi Chiba
    • Masamitsu YanagiharaSusumu MoriTsuyoshi NarakiMasami SekiSeiji MiyazakiTsuyoshi NarabeHiroshi Chiba
    • G03F7/20G03F9/00H01L21/027
    • G03F7/70275G03F7/70241G03F7/70258G03F7/70358G03F7/70858G03F7/70883G03F9/70
    • In a scanning type exposure apparatus for exposing an entire surface of a pattern region on a mask to a substrate by scanning the mask and the substrate with respect to a projection optical system in a predetermined direction with a speed ratio in accordance with a magnification of the projection optical system, there are provided a plurality of illumination optical systems for illuminating respective areas of the pattern region on the mask with respective light fluxes from respective light source; a plurality of projection optical systems arranged so as to correspond to the respective illumination optical systems, the projection optical systems projecting respective images of the areas illuminated by the respective illumination optical systems onto respective projection areas on the substrate; a memory device for obtaining and storing a change of shape of the substrate; a magnification changing device for changing a magnification of at least one of the projection optical systems in accordance with the change of shape of the substrate; and an imaging position changing device for changing the position of said image projected via the at least one projection optical systems in accordance with the change in magnification.
    • 在扫描型曝光装置中,通过以与所述掩模和所述基板相对于所述投影光学系统的倍率相对于投影光学系统沿预定方向扫描所述掩模上的图案区域的整个表面, 提供了多个照明光学系统,用于利用来自各个光源的各个光束照射掩模上的图案区域的各个区域; 多个投影光学系统被布置为对应于各个照明光学系统,所述投影光学系统将由各个照明光学系统照射的区域的各个图像投射到所述基板上的相应的投影区域上; 用于获取和存储基板的形状变化的存储装置; 放大率改变装置,用于根据基板的形状变化来改变至少一个投影光学系统的放大率; 以及成像位置改变装置,用于根据放大率的变化改变经由至少一个投影光学系统投影的所述图像的位置。
    • 7. 发明授权
    • Scanning exposure apparatus and exposure method
    • 扫描曝光装置和曝光方法
    • US5602620A
    • 1997-02-11
    • US490212
    • 1995-06-14
    • Seiji MiyazakiKei NaraMasami SekiMasamitsu Yanagihara
    • Seiji MiyazakiKei NaraMasami SekiMasamitsu Yanagihara
    • G03F7/20G03F9/00H01L21/027G03B27/42G01B11/00
    • G03F9/7003G03F7/70275G03F7/70358G03F7/70475G03F7/70791G03F9/70
    • The present invention is directed to scanning exposure apparatus and exposure method to achieve simultaneous projection of images of plural regions on a mask onto a photosensitive substrate with correcting an orthogonality error of a pattern on the mask or photosensitive substrate. If the pattern on the mask or photosensitive substrate has an orthogonality error causing a deviation of a certain angle in a first direction perpendicular to a scanning direction as it goes in the scanning direction, the mask and the photosensitive substrate are rotated relative to each other in the plane thereof to align one coordinate axis in a coordinate system of each pattern with the first direction. Then a relative displacement is given by an amount of the orthogonality error between positions of images projected through a first optical system and positions of images projected through a second optical system, and relative positions of the mask and the photosensitive substrate are continuously changed by the amount of the orthogonality error in the first direction in accordance with the position of the mask or photosensitive substrate in the scanning direction.
    • 本发明涉及扫描曝光装置和曝光方法,以通过校正掩模或感光基底上的图案的正交性误差来将掩模上的多个区域的图像同时投影到感光基板上。 如果掩模或感光基板上的图案具有在沿着扫描方向进入垂直于扫描方向的第一方向上产生一定角度的偏差的正交性误差,则掩模和感光基板相对于彼此旋转 其平面将每个图案的坐标系中的一个坐标轴与第一方向对齐。 然后通过第一光学系统投影的图像的位置和通过第二光学系统投影的图像的位置之间的正交性误差的量给出相对位移,并且掩模和感光基板的相对位置连续地改变量 根据掩模或感光基板在扫描方向上的位置,在第一方向上的正交性误差。