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    • 3. 发明授权
    • Laser position array optical measuring system and method
    • 激光位置阵列光学测量系统及方法
    • US06346988B1
    • 2002-02-12
    • US08904950
    • 1997-08-01
    • Hans BartunekMark Cerny
    • Hans BartunekMark Cerny
    • G01B1104
    • G01B11/2433
    • An optical measuring system capable of high resolution measurement of objects, and a method of measuring the same, are provided. The optical measuring system is formed in one integral, portable unit, and includes a laser source having associated optics for emitting a wide collimated light beam. A CCD receiver and a processor housed together and spaced apart from the laser source receive the wide collimated light beam. The CCD receiver has a plurality of diode cells, or “pixels,” formed in a linear array, and the diode cells exhibit output signals corresponding to the received light beam. The processor processes the output signals and determines a measurement associated with the output signals.
    • 提供能够对物体进行高分辨率测量的光学测量系统及其测量方法。 光学测量系统形成在一个整体的便携式单元中,并且包括具有用于发射宽准直光束的相关光学器件的激光源。 收纳在一起并与激光源隔开的CCD接收器和处理器接收宽准直光束。 CCD接收器具有以线性阵列形成的多个二极管单元或“像素”,二极管单元呈现对应于所接收的光束的输出信号。 处理器处理输出信号并确定与输出信号相关联的测量。
    • 4. 发明申请
    • CELL PROCESSOR METHODS AND APPARATUS
    • 细胞处理器方法和装置
    • US20070198628A1
    • 2007-08-23
    • US11461390
    • 2006-07-31
    • John BatesKeisuke InoueMark Cerny
    • John BatesKeisuke InoueMark Cerny
    • G06F15/16
    • G06F9/5027G06F9/4881G06F9/5033G06F9/5038G06F9/505G06F9/5066
    • Methods and apparatus for cell processors are disclosed. A policy module is loaded from a main memory of a cell processor into the local memory of a selected synergistic processing unit (SPU) under control of an SPU policy module manager (SPMM) running on the SPU. A selected one or more work queues are assigned from a main memory to a selected one or more of the SPUs according to a hierarchy of precedence. A policy module for the selected one or more work queues is loaded to the selected one or more SPUs. The policy module interprets the selected one or more of the selected one or more work queues. Under control of the policy module, work from one or more of the selected one or more work queues is loaded into the local memory of the selected SPU. The work is performed with the selected SPU. After completing the work or upon a pre-emption, control of the selected SPU is returned to the SPMM.
    • 公开了用于单元处理器的方法和装置。 在SPU上运行的SPU策略模块管理器(SPMM)的控制下,将策略模块从小区处理器的主存储器加载到所选择的协同处理单元(SPU)的本地存储器中。 所选择的一个或多个工作队列根据优先级别从主存储器分配给选定的一个或多个SPU。 所选择的一个或多个工作队列的策略模块被加载到所选择的一个或多个SPU。 策略模块解释所选择的一个或多个所选择的一个或多个工作队列中的一个或多个。 在策略模块的控制下,来自所选择的一个或多个工作队列中的一个或多个的工作被加载到所选择的SPU的本地存储器中。 该工作由选定的SPU执行。 完成工作或优先处理后,将所选SPU的控制权返回给SPMM。
    • 6. 发明申请
    • Environment mapping
    • 环境映射
    • US20060001674A1
    • 2006-01-05
    • US11222207
    • 2005-09-07
    • Mark CernyPal-Kristian Engstad
    • Mark CernyPal-Kristian Engstad
    • G09G5/00
    • G06T15/506G06T15/04G06T2215/12
    • A system and method for environment mapping determines a computer-generated object'reflective appearance, based upon position and orientation of a camera with respect to the object's location. An embodiment of the present invention is implemented as a real-time environment mapping for polygon rendering, however, the scope of the invention covers other rendering schemes. According to one embodiment of the present invention, a vector processing unit (VPU) uses a modified reflection formula—r=e−(e·(n+eo))(n+eo)/(1−nz)=e−(e·[nx, ny, nz−1])[nx, ny, nz−1]/(1−nz), wherein eo=[0,0,−1], and nx, ny, and nz are the components of the surface normal vector n—to compute reflective properties of an object.
    • 用于环境映射的系统和方法基于相机相对于对象位置的位置和取向来确定计算机生成的对象的反射外观。 本发明的实施例被实现为用于多边形呈现​​的实时环境映射,然而,本发明的范围涵盖其他呈现方案。 根据本发明的一个实施例,矢量处理单元(VPU)使用修正的反射公式-r = e-(e。(n + e o o o))(n + e < (1-nz)= e-(e。[nx,ny,nz-1])[nx,ny,nz-1] /(1-nz)其中e = [0,0,-1],nx,ny和nz是表面法线向量n的分量,用于计算物体的反射特性。
    • 7. 发明授权
    • Dual beam sensor and edge detection system and method
    • 双光束传感器和边缘检测系统及方法
    • US5504345A
    • 1996-04-02
    • US227736
    • 1994-04-14
    • Hans BartunekMark Cerny
    • Hans BartunekMark Cerny
    • H01L21/00H01L21/677H01L21/687H01J40/14
    • H01L21/67259H01L21/67778H01L21/68707Y10S414/136
    • A semiconductor wafer and magnetic disk edge detection system having a sensor unit comprising a dual beam light source spatially oriented so that the beams focus and converge at a single point external to the sensor unit, and dual light detectors spatially oriented to allow detection of light reflected from the edges of the wafers and disks even where the angle of incidence of the light onto the edge deviates significantly from the perpendicular. The sensor unit works in operative combination with a scanning motion means to move the sensor across the edges of the wafers or disks to be detected, typically by attachment of the sensor unit to a linear motor or a robotic arm, or alternately, by manually detecting the edges of the wafers and disks.
    • 一种半导体晶片和磁盘边缘检测系统,其具有传感器单元,该传感器单元包括空间定向的双光束光源,使得光束聚焦并会聚在传感器单元外部的单个点处,并且双光检测器被空间定向以允许检测反射的光 即使在光线到边缘上的入射角显着偏离垂直线的情况下,晶片和圆盘的边缘也是如此。 传感器单元与扫描运动装置组合工作,通常通过将传感器单元附接到线性马达或机器手臂,或者通过手动检测来移动传感器跨越待检测的晶片或盘的边缘 晶片和磁盘的边缘。
    • 8. 发明授权
    • Sensor and detection system having wide diverging beam optics
    • 传感器和检测系统具有宽的发散光束
    • US06392247B1
    • 2002-05-21
    • US09631091
    • 2000-08-02
    • Mark CernyHans Bartunek
    • Mark CernyHans Bartunek
    • G01N2186
    • G01B11/25Y10S414/136
    • A sensor and detection system is included. The sensor includes at least one transmitter which has associated optical elements for emitting at least one light beam toward the object to be detected. At least one receiver is positioned adjacent the transmitter for receiving light reflected from an edge of the object. The receiver generates a signal responsive to the reflected light. The associated optical elements of the transmitter include a converging lens for emitting a focused light beam in one plane, and a cylindrical lens for emitting a diverging light beam in another plane, such that a portion of the reflected light is diverging and is received by the receiver over a wide angle of coverage.
    • 包括传感器和检测系统。 传感器包括至少一个发射器,其具有用于向被检测物体发射至少一个光束的相关联的光学元件。 至少一个接收器位于发射器附近以接收从物体的边缘反射的光。 接收器产生响应于反射光的信号。 发射机的相关光学元件包括用于在一个平面中发射聚焦光束的会聚透镜,以及用于在另一平面中发射发散光束的柱面透镜,使得反射光的一部分发散并被 接收机在广泛的覆盖范围内。