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    • 2. 发明授权
    • Memory devices, systems and methods using selective on-die termination
    • 存储器件,系统和使用选择性片上端接的方法
    • US07092299B2
    • 2006-08-15
    • US10792623
    • 2004-03-03
    • Jin-Seok KwakSeong-Jin JangYoung-Hyun Jun
    • Jin-Seok KwakSeong-Jin JangYoung-Hyun Jun
    • G11C7/00
    • G11C5/063G11C7/10G11C7/1048
    • A memory system includes first and second memory devices having commonly connected data terminals and commonly connected memory control signal terminals, e.g., devices in respective first and second independently selectable memory banks that share common data lines and common memory control signal lines, such as column address strobe, row address strobe, write enable, and address signal lines. The first and second memory devices includes respective selective on-die termination (ODT) circuits configured to selectively provide first and second termination impedances at their respective data terminals responsive to a memory control signal at the commonly connected memory control signal terminals. The selective ODT circuits may produce the first termination impedance responsive to a memory write operation, and may produce the second termination impedance responsive to a memory read operation and/or expiration of a predetermined time interval following termination of the memory write operation. Preferably, the first termination impedance is less than the second termination impedance, and the selective ODT circuits provide the first termination impedance responsive to the memory write operation irrespective of which of the first and second memory devices is being written to.
    • 存储器系统包括具有共同连接的数据端子和共同连接的存储器控​​制信号端子的第一和第二存储器件,例如共享公共数据线和公共存储器控制信号线的各自的第一和第二可独立选择的存储体中的器件,诸如列地址 选通,行地址选通,写使能和地址信号线。 第一和第二存储器件包括相应的选择性管芯端接(ODT)电路,其被配置为响应于在共同连接的存储器控​​制信号端子处的存储器控​​制信号在它们各自的数据端口选择性地提供第一和第二终端阻抗。 响应于存储器写入操作,选择性ODT电路可以产生第一终止阻抗,并且可以在存储器写入操作终止之后响应于存储器读取操作和/或预定时间间隔的期满而产生第二终止阻抗。 优选地,第一终端阻抗小于第二终端阻抗,并且选择性ODT电路响应于存储器写入操作提供第一终止阻抗,而与正在写入的第一和第二存储器件中的哪一个无关。