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    • 2. 发明申请
    • Process for purifying interferon beta
    • 干扰素β的纯化方法
    • US20070093649A1
    • 2007-04-26
    • US10581602
    • 2004-12-04
    • Ji Sook ParkMin BaekJee AhnKi KimHyung ParkDong LeeMyung Oh
    • Ji Sook ParkMin BaekJee AhnKi KimHyung ParkDong LeeMyung Oh
    • C07K14/56
    • C07K14/565C07K5/06139
    • Provided is a process for purifying human interferon beta from a recombinant human interferon beta-containing culture comprising performing affinity chromatography and reversed-phase high-performance liquid chromatography (RP-HPLC), wherein the affinity chromatography includes: adsorbing the interferon beta-containing culture to an equilibrated affinity chromatography column, followed by washing with an equilibration buffer solution; washing the column with a washing buffer solution A of pH 6.5-7.5 containing 30-60 wt % of propylene glycol and a washing buffer solution B of pH 6.5-7.5 containing 10-30 wt % of propylene glycol and 1-2M NaCl; and eluting a human interferon beta-containing fraction with a buffer solution of pH 6.5-7.5 containing 40-60 wt % of propylene glycol and 1-2M NaCl.
    • 提供了一种从重组人类干扰素β培养物中纯化人类干扰素β的方法,包括进行亲和层析和反相高效液相色谱(RP-HPLC),其中亲和层析包括:吸附含有干扰素β的培养物 平衡的亲和层析柱,然后用平衡缓冲液洗涤; 用含有30-60重量%丙二醇的pH 6.5-7.5的洗涤缓冲溶液A和pH6.5-7.5的洗涤缓冲液B洗涤柱子,其中含有10-30重量%的丙二醇和1-2M的NaCl; 并用含有40-60重量%丙二醇和1-2M NaCl的pH 6.5-7.5的缓冲溶液洗脱人类含有干扰素β的级分。
    • 6. 发明申请
    • Method for forming polysilicon plug of semiconductor device
    • 用于形成半导体器件的多晶硅插塞的方法
    • US20050142867A1
    • 2005-06-30
    • US10879220
    • 2004-06-30
    • Hyung ParkMin LeeSang LeeHyun Sohn
    • Hyung ParkMin LeeSang LeeHyun Sohn
    • H01L21/28H01L21/3205H01L21/336H01L21/44H01L21/4763H01L21/60H01L21/768
    • H01L21/76897H01L21/7684
    • Disclosed is a method for forming a polysilicon plug of a semiconductor device. The method comprises the steps of: forming a stacked pattern of a wordline and a hard mask film on a semiconductor substrate comprising a cell region and a peripheral circuit region; forming a spacer on a sidewall of the stacked pattern; forming an interlayer insulating film on the semiconductor substrate; polishing the interlayer insulating film via a CMP process using the hard mask film as a polishing barrier film; forming a barrier film on the semiconductor substrate including the interlayer insulating film; selectively etching the barrier film and the interlayer insulating film to form a landing plug contact hole; depositing a polysilicon film filling the landing plug contact hole on the semiconductor substrate; blanket-etching the polysilicon film using the barrier film as an etching barrier film; and polishing the polysilicon film and the barrier film using the hard mask film as a polishing barrier film to form a polysilicon plug.
    • 公开了一种用于形成半导体器件的多晶硅插塞的方法。 该方法包括以下步骤:在包括单元区域和外围电路区域的半导体衬底上形成字线和硬掩模膜的堆叠图案; 在所述堆叠图案的侧壁上形成间隔物; 在半导体衬底上形成层间绝缘膜; 通过使用硬掩模膜作为抛光阻挡膜的CMP工艺来研磨层间绝缘膜; 在包括层间绝缘膜的半导体衬底上形成阻挡膜; 选择性地蚀刻阻挡膜和层间绝缘膜以形成着陆塞接触孔; 在所述半导体衬底上沉积填充所述着地插头接触孔的多晶硅膜; 使用阻挡膜作为蚀刻阻挡膜对多晶硅膜进行绝缘蚀刻; 并使用硬掩模膜作为抛光阻挡膜研磨多晶硅膜和阻挡膜以形成多晶硅插塞。
    • 7. 发明申请
    • Method of manufacturing semiconductor device
    • 制造半导体器件的方法
    • US20050095834A1
    • 2005-05-05
    • US10875052
    • 2004-06-22
    • Sang LeeJong ShinHyung Park
    • Sang LeeJong ShinHyung Park
    • H01L21/283H01L21/304H01L21/44H01L21/4763H01L21/60H01L21/768H01L21/822H01L21/8242
    • H01L21/76897H01L21/7684H01L27/10855H01L27/10873H01L27/10888
    • Disclosed is a method of manufacturing a semiconductor device. The method includes the steps of forming gates on a substrate, forming junction areas on a surface of the substrate, forming a first BPSG layer on a resultant structure of the substrate, performing a first CVD process for the first BPSG layer, forming a second BPSG layer on the first BPSG layer, forming a landing plug contact, depositing a polysilicon layer on a resultant structure of the substrate, and performing a second CMP process for the polysilicon layer, the second BPSG layer and the nitride hard mask. The CMP processes are carried by using acid slurry having a high polishing selectivity with respect to the nitride layer, so a step difference between the cell region and the peripheral region is removed, thereby simplifying the semiconductor manufacturing process and removing a dishing phenomenon.
    • 公开了半导体器件的制造方法。 该方法包括以下步骤:在衬底上形成栅极,在衬底的表面上形成接合区域,在衬底的所得结构上形成第一BPSG层,对第一BPSG层执行第一CVD工艺,形成第二BPSG 在第一BPSG层上形成着色插头接触,在所得衬底的所得结构上沉积多晶硅层,以及对多晶硅层,第二BPSG层和氮化物硬掩模执行第二CMP工艺。 通过使用相对于氮化物层具有高抛光选择性的酸性浆料来进行CMP处理,从而消除了单元区域和外围区域之间的阶跃差异,从而简化了半导体制造工艺并消除了凹陷现象。
    • 8. 发明申请
    • Locking tailpiece
    • 锁定尾巴
    • US20070157790A1
    • 2007-07-12
    • US11330712
    • 2006-01-12
    • Dong KimHyung ParkJames RosenbergRichard Akers
    • Dong KimHyung ParkJames RosenbergRichard Akers
    • G10D3/04
    • G10D3/04
    • Included herein is an instrument component for mounting to the body of an instrument having strings, for example a guitar. The instrument component comprises a plurality of attachment devices, an elongated bracket, and a biasing element. The elongated bracket includes a plurality of attachment apertures where each aperture includes a center and is shaped to accept one of the attachment devices. A biasing element is positioned in each attachment aperture wherein each biasing element engages one of the attachment devices. Each biasing element includes a plurality of protrusions wherein each protrusion biases the attachment device toward the center of the attachment aperture.
    • 这里包括用于安装到具有弦的乐器的身体的乐器部件,例如吉他。 仪器部件包括多个附接装置,细长支架和偏置元件。 细长支架包括多个附接孔,其中每个孔包括一个中心并成形为接受一个连接装置。 偏置元件定位在每个附接孔中,其中每个偏置元件接合附接装置中的一个。 每个偏置元件包括多个突起,其中每个突出部朝着连接孔的中心偏压附接装置。
    • 10. 发明申请
    • Semiconductor light emitting device
    • 半导体发光器件
    • US20070102715A1
    • 2007-05-10
    • US11588330
    • 2006-10-27
    • Kun KoYoung ParkBok MinHyung ParkSeok Hwang
    • Kun KoYoung ParkBok MinHyung ParkSeok Hwang
    • H01L33/00
    • H01L33/20H01L33/14H01L33/32
    • The invention relates to a high-quality semiconductor light emitting device which suppresses current concentration. The semiconductor light emitting device includes an n-type semiconductor layer, an active layer and a p-type semiconductor layer sequentially formed on a substrate. The semiconductor light emitting device further includes a p-electrode formed on the p-type semiconductor layer and an n-electrode formed on a surface of a mesa-etched portion of the n-type semiconductor layer. A trench is formed in the n-type semiconductor layer to prevent current concentration. The trench is extended from an upper surface of the mesa-etched portion of the n-type semiconductor layer or from a bottom surface of the substrate into the n-type semiconductor layer at a predetermined depth.
    • 本发明涉及抑制电流浓度的高质量半导体发光器件。 半导体发光器件包括依次形成在衬底上的n型半导体层,有源层和p型半导体层。 半导体发光器件还包括形成在p型半导体层上的p电极和形成在n型半导体层的台面蚀刻部分的表面上的n电极。 在n型半导体层中形成沟槽以防止电流集中。 沟槽从n型半导体层的台面蚀刻部分的上表面或从基板的底表面延伸到预定深度的n型半导体层。